アイテス List of Products and Services

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

• Measurement and Analysis Equipment
• Solar power generation
• Measurement and Inspection

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the location of defects. By applying reverse bias to the module and observing the LEAK points, defects causing PID can be easily identified.

• Measurement and Analysis Equipment
• Solar power generation
• Measurement and Inspection

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structures of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess the damage to the passivation layer around the laser contact holes. Additionally, by using a DC power supply for EL observation of the modules, it is possible to pinpoint the locations of defects.

• Measurement and Analysis Equipment
• Solar power generation
• Measurement and Inspection

The hassle of removing PV cables for checking CIS thin-film panels has been eliminated. High-speed checks from the panel surface during power generation significantly improve the efficiency of CIS inspections. By simply replacing the sensor unit of the Solamente-iS SI-200, the Solamente CiS Adapter (optional) SC-200 enables high-speed inspections of CIS thin-film panels when attached to the widely used Solamente-iS (SI-200) in solar panel inspection sites. By utilizing the iS panel checker function, which detects power generation current from the panel surface, specifically for CIS, it has become economically feasible to inspect CIS panels. Without removing the PV cables, it is now easy to efficiently identify failures in CIS thin-film panels (such as bypass diode short circuits) in a short amount of time.

• Measurement and Analysis Equipment
• Solar power generation

A new feature of Solamente that detects faulty panels during pre-power transmission inspections and power outage inspections. A new inspection method that links SZ-200 and SI-200. Inspection Method By linking Solamente-Z (SZ-200) and Solamente-iS (SI-200), sensors (SR-200) check the panels along the string circuit. A faulty panel is located where the sensor's response is interrupted.

• Measurement and Analysis Equipment
• Solar power generation

The Solar Panel Checker Solamente-iS SI-200 is an inspection device that detects cluster failures* by placing a sensor on the surface of panels during power generation. It senses the generated current flowing through the interconnector and displays it in musical notes and LED levels, allowing for instant identification of clusters that are not generating power. (*Cluster failures can occur due to initial defects, aging deterioration, lightning damage, etc.) With just a press of a button, the built-in illuminance sensor automatically adjusts the sensitivity. The measurement speed is approximately 5 seconds per panel, making it high-speed. With the super long extension pole (optional), it can reach panels up to 3.6 meters away.

• Measurement and Analysis Equipment
• Solar power generation

The String Checker Solamente-Z SZ-200 is an inspection device that probes each string P/N terminal of the connection box to detect strings with fault panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-200 achieves fast inspections, is resistant to changes in sunlight, and offers high operability, ensuring reliable results and significantly improving the efficiency of inspection work.

• Measurement and Analysis Equipment
• Solar power generation

Aites' wafer business division offers professional wafer processing services that widely meet a diverse range of test wafer needs. Aites boasts a dedicated 8-inch processing line as its flagship, providing services in the wafer processing field for over 12 years. We utilize our accumulated technical know-how and unique processing resources to broadly accommodate processing requirements ranging from 2 inches to 12 inches. A notable feature of Aites wafer services is the high number of repeat customers, as we gain strong trust from our clients by supporting wafer processing projects quickly and extensively.

• Processing Technology
• Other services and technologies

Dynamic light scattering allows for the measurement of particle size and size distribution of nanoparticles dispersed in a liquid without separating the particles. Here, we present examples of particle size measurement for silica and alumina particles in an aqueous medium. Particles in solution exhibit Brownian motion that depends on their size, and the fluctuations in the scattered light generated when the particles are illuminated depend on the particle size. By observing and analyzing these fluctuations, we can determine the particle size and size distribution. [Alumina Measurement Results and Discussion] - As alumina approaches neutrality from strong alkaline conditions, it approaches its isoelectric point. - The surface charge of the particles decreases. - The repulsion between particles diminishes. - It can be inferred that particle aggregation is occurring. *For more details, please refer to the PDF document or feel free to contact us.*

• others

Liquid crystal displays use various organic materials, including liquid crystals, sealing materials, encapsulants, and polarizers. Considering the material properties and degradation mechanisms of each component from a chemical perspective is important for product evaluation and failure analysis. This document presents examples of chemical analyses for the components of liquid crystal displays. [Examples of Chemical Analysis] - FT-IR: Principal component analysis - EDX: Elemental analysis - GCMS: Liquid crystal component analysis - HS-GCMS: Outgassing analysis (degradation analysis), among others *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Inspection
• Other services and technologies
• Measurement and Analysis Equipment

Polyethylene (PE) comes in several types with different material properties depending on the length and number of its side chain branches. From the melting peak of crystalline polymer polyethylene, we measured the melting point and crystallinity using DSC and compared them by type of polyethylene. LDPE, which has many long side chains and is less dense, resulted in a low melting point and low crystallinity. In contrast, HDPE, which tends to have a denser molecular chain, showed high values for both melting point and crystallinity. Additionally, LLDPE, which has many relatively short side chains and is more likely to be dense than LDPE, exhibited intermediate values for both melting point and crystallinity between LDPE and HDPE. **Types of Polyethylene** - **LDPE (Low-Density Polyethylene):** Low rigidity and high flexibility - **LLDPE (Linear Low-Density Polyethylene):** Stronger than LDPE but inferior processability - **HDPE (High-Density Polyethylene):** High rigidity, excellent tensile strength, impact strength, and hardness *For more details, please refer to the PDF document or feel free to contact us.*

• Measurement and Inspection
• Other services and technologies

Aites Co., Ltd. has introduced the KEYENCE manufactured one-shot 3D shape measurement device 'VR-6200'. It comes with an electric rotation unit, allowing for the reproduction of cross-sectional shapes without cutting. The HDR scanning algorithm enables measurement of glossy surfaces as well. From profile measurement to flat measurement, volume area, and comparative measurement, this single device can perform various measurements. 【Measurable Items】 ■ Profile Measurement ■ Flat Measurement ■ Volume Area ■ Surface Roughness Measurement ■ Flatness Measurement ■ Comparative Measurement *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

Introducing our Raman spectrum acquisition service for rocks. If you send us thin-sectioned rock samples or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the designated areas. We also offer thin-sectioning, elemental analysis (EDX/EPMA), and EBSD analysis services. Please feel free to contact us when needed. 【Features】 ■ Raman spectra are very effective for identifying and analyzing mineral species in rocks. ■ If you send us thin-sectioned rock samples or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the designated areas. ■ We also offer thin-sectioning, elemental analysis (EDX/EPMA), and EBSD analysis services. *For more details, please refer to the PDF document or feel free to contact us.

• others

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, we can produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Damage layer reduction through low acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Fully automated TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

"Laminating film" is used in various industries to protect the display surface while maintaining the visibility of printed materials by using highly transparent materials. During processing, heat bonding is performed, so it is assumed that the molecular state changes compared to before processing. In this study, we attempted to clarify the residual stress remaining in the product by comparing conditions with and without heat applied to the laminating film, using birefringence. This document presents measurement results using a laminating film composed of polyethylene terephthalate (PET) and ethylene-vinyl acetate (EVA) as an example. [Contents] ■ Measurement of glass transition temperature by DSC ■ Birefringence measurement by WPA ■ Effects of combining PET and EVA *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

As a pre-treatment for GC-MS analysis, solvent extraction can sometimes allow for highly sensitive analysis of target substances. This document introduces examples of component comparison of dirt wiped with a cloth and component comparison of color developers contained in thermal paper using solvent extraction. In addition to solvent extraction, we can propose suitable methods from various pre-treatment techniques tailored to your samples and analysis targets, so please feel free to contact us. [Contents] ■ Comparative analysis of dirt components and surrounding materials ■ Component comparison of color developers contained in thermal paper *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will introduce sample processing using mechanical polishing and mechanical polishing combined with ion milling treatment. Mechanical polishing is a well-established and historically long-standing method for producing cross-sections, allowing for a wide range of cross-sectional fabrication. Additionally, by combining it with ion milling treatment, it is possible to create observation surfaces comparable to those produced by CP processing. At Aites, we propose appropriate processing and observation methods or combinations based on our accumulated know-how. Please feel free to contact us for consultations or inquiries. 【Features】 ■ Mechanical polishing allows for extensive processing and observation. ■ By repeating mechanical polishing and imaging, three-dimensional observation is possible. ■ Observation at any desired location can be performed based on the constructed 3D image. ■ After mechanical polishing, depending on the sample, observation comparable to that of CP processed samples may be possible. *For more details, please refer to the PDF materials or feel free to contact us.

• others

The molecular weight of resins such as plastics is not a single value but is composed of multiple molecular weights. By understanding this molecular weight and its distribution, it leads to a better understanding of the mechanisms and theories related to the properties and degradation of resins. In this document, we will introduce a case study where we measured polypropylene resin (PP) samples with and without ultraviolet (UV) irradiation using a high-temperature GPC device suitable for measuring polyolefin-based materials that are difficult to dissolve in solvents at room temperature, and conducted data analysis. We encourage you to read it. 【Contents】 ■ Configuration and principles of high-temperature SEC ■ Analysis case: Molecular weight measurement of PP subjected to UV irradiation ■ Application examples ■ Specifications and considerations for high-temperature SEC *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Inspection

Organic materials such as solvents, additives, pharmaceuticals, and plastics are essential materials alongside metals and inorganic materials. They have a wide variety of types due to the combination of light elements, and their specificity is manifested through structure, intermolecular forces, and electron behavior. However, it seems that chemical instrumentation analysis and evaluation are necessary for a fundamental understanding of their properties. This document presents case studies of analysis and evaluation services for organic materials. [Contents] ■ FT-IR Analysis ■ GC-MS Analysis ■ Molecular Weight Distribution Evaluation by GPC (SEC) *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment
• Measurement and Analysis Equipment

GC-MS analysis is a method commonly used for the analysis of organic components and organic structure analysis. With auxiliary devices, it can accommodate a wide range of analyses, from low molecular substances like solvents to high molecular substances like plastics. This document introduces the sample introduction devices owned by Aites, as well as the types of analysis samples and analysis content that each device specializes in. Please take a moment to read it. 【Contents】 ■ Overview ■ Conditions ■ Samples ■ Data Obtained ■ Analysis Examples *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will introduce a case of TOF-SIMS that enables wide-area image map measurement by combining it with an electric stage. Two types of black markers were drawn on a metal plate, and wide-area (30mm × 30mm) image mapping measurement was conducted. It is difficult to distinguish between the two types of markers in the optical image, but by confirming the image map with characteristic secondary ion peaks for each marker, we can visualize the distribution of the markers. In addition, there are cases where detailed analysis results were obtained from the spectrum after wide-area image map measurement using TOF-SIMS. [Overview] ■ Standard measurement (beam scan measurement) targets sizes of 500μm × 500μm or smaller. ■ By combining with an electric stage, wide-area image map measurement is possible. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will introduce a 3D construction method using mechanical polishing as a case study. Ceramic capacitors have a structure where thin film electrodes are stacked internally, and the internal electrodes cannot be confirmed using X-ray CT as they appear transparent. Additionally, 3D construction using FIB slice cross-sections is limited to localized confirmation due to the sample being a few millimeters in size. The 3D construction method using mechanical polishing can sometimes enable 3D construction to compensate for the areas where X-ray CT and FIB slice cross-sections are not effective. [Case Study of 3D Construction of Ceramic Capacitors Using Mechanical Polishing] ■ X-ray CT image: Internal electrodes cannot be confirmed ■ 3D construction using FIB slice cross-sections: Limited to localized confirmation ■ 3D construction using mechanical polishing: Internal electrodes can be confirmed, allowing for extensive 3D observation *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Here, we present an example of EDS analysis at the Cu pad interface. In the qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Analysis Equipment
• Other services and technologies

"Energy Dispersive X-ray Spectroscopy (EDS or EDX)" is a method for obtaining elemental information about samples or foreign substances by detecting characteristic X-rays generated by electron beam irradiation using a detector attached to an electron microscope (SEM or TEM). When characteristic X-rays generated by irradiating a material with an electron beam enter the detector, a number of electron-hole pairs equivalent to the energy of the characteristic X-rays are produced. By measuring this number (current), it is possible to determine the energy of the characteristic X-rays, and since the energy varies by element, it is possible to investigate the elemental information of the material. 【Analysis by EDS (Partial)】 ■ Qualitative analysis of intermetallic compounds (point analysis) - By examining which element's characteristic X-ray energy corresponds to the characteristic X-rays in the measured spectrum, it is possible to determine the type of elements. ■ Semi-quantitative analysis of intermetallic compounds - By examining the intensity (count number) of each characteristic X-ray, it is possible to calculate the concentration of the contained elements. *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Analysis Equipment
• Other services and technologies

The "Reuse Checker RUC-100" is a simple diagnostic device designed to allow individuals without electrical expertise to determine defective solar panels. It automatically assesses five measurement items comprehensively and displays the results as pass/fail on an LCD screen, making it easy to sort and judge. Measurement items can be saved in the device's built-in memory for each panel, and CSV data can be output. 【Features】 ■ Displays pass/fail results on an LCD screen ■ Easy sorting and judgment ■ Five measurement items can be saved in the device's built-in memory for each panel ■ CSV data can be output *For more details, please refer to the PDF document or feel free to contact us.

• Photovoltaic power generation system (solar system, energy-saving housing, electricity sales business)
• Other measuring instruments
• Measurement and Analysis Equipment

Carbon materials include various types such as graphite, activated carbon, and carbon fibers, and are widely used in applications such as the active materials for the negative electrode of lithium-ion batteries, additives for conductive plastics, inks, and CFRP. Our company evaluates the structural differences of carbon materials using Raman analysis. In the case of carbon black (CB) and activated carbon, the G band peak becomes broader compared to graphite, and the full width at half maximum increases. This indicates that the crystallite sizes are different, with graphite having a larger crystallite size than CB and activated carbon. **Differences in Raman spectra due to carbon materials:** - Graphite shows a strong and sharp G band around 1580 cm-1. - It indicates the disruption of the hexagonal ring structure, which is the unit cell of graphite, and that the layered structure is more disordered. - In CB and activated carbon, the G band peak is broader compared to graphite, with a larger full width at half maximum. - Graphite has a larger crystallite size than CB and activated carbon. *For more details, please refer to the PDF document or feel free to contact us.*

• Measurement and Analysis Equipment
• Other services and technologies

Various additives are used in polymers to improve stability and processability; however, due to environmental impact and long-term storage, additive components may precipitate on the polymer surface, or the additives themselves may undergo chemical changes, leading to discoloration and degradation. This document presents examples of analyses conducted using thermal desorption GC-MS to examine the bleed-out of additives and the chemical changes of additive components due to UV irradiation. Although additive components are present in small quantities compared to the main polymer components, they can be analyzed sensitively using thermal desorption GC-MS. We propose methods tailored to specific issues or objectives, such as predicting product degradation in combination with reliability testing, thermal analysis, and main component analysis, so please feel free to contact us. [Contents] ■ Analysis of additive components that bled out from nitrile rubber ■ Analysis of additive components in nylon 66 subjected to UV irradiation *For more details, please refer to the PDF document or feel free to contact us.

• others

Optical microscopes and SEMs (scanning electron microscopes) are often used for sample observation, but each has its own characteristics, so it is important to choose the appropriate device according to the purpose. In this document, we compare optical microscopes and SEMs using the same sample and introduce the commonly mentioned advantages and disadvantages. Please take a moment to read it. [Contents] ■ Characteristics of Optical Microscopes ・Advantages / Disadvantages ・Recommended for this type of observation ■ Characteristics of SEM (Scanning Electron Microscope) ・Advantages / Disadvantages ・Recommended for this type of observation *For more details, please refer to the PDF document or feel free to contact us.

• others

Polycarbonate is a material that excels in impact resistance, weather resistance, and transparency, making it widely used in everything from industrial materials to everyday products. However, even polymers with excellent properties can undergo chemical changes, known as degradation, due to the usage environment and the passage of time. This document presents examples of degradation analysis of polycarbonate materials subjected to UV irradiation and constant temperature and humidity testing. [Contents] ■ Thermal decomposition GC-MS analysis of polycarbonate *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Here is a case study comparing two types of brass with similar elemental compositions. When spectral analysis was conducted using SEM-EDX, it was found that brass primarily consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. Additionally, an EBSD analysis was performed to check the phase map, revealing that a portion of sample 1 exhibited a β phase with a different crystal structure. 【Case Overview】 <Comparison of Two Brass Materials through Elemental Analysis> ■ Analysis Method: SEM-EDX Analysis ■ Results - Spectral analysis indicated that brass primarily consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. - Surface analysis was conducted for elements Cu and Zn, and no bias in the in-plane distribution was observed. *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Inspection

It is known that low molecular siloxanes emitted from silicone products can cause the generation of silicon dioxide, an insulator, due to the heat from electrical sparks when present around the contacts of electronic components, leading to contact failures. Here, we introduce outgassing quantitative analysis using HS-GCMS as a method to confirm low molecular siloxanes. HS-GCMS analysis can determine whether there are materials around the electronic components that emit low molecular siloxanes and to what extent they are emitted. Please feel free to contact us regarding sample size and conditions. 【HS-GCMS Analysis of Silicone Adhesive Tapes】 ■ Tapes using silicone adhesives are sealed in vials. ■ After heating at 130°C for 30 minutes, the generated outgas is analyzed using headspace GCMS. ■ For the detected low molecular siloxanes, quantification was performed based on the equivalent of cyclic siloxane D5. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Phthalate esters are used as additive components such as plasticizers in many plastic products, but four new types of phthalate esters have become regulated under the revised RoHS directive. Our "screening analysis" allows for a simple check of the presence or absence of regulated compounds, and if a content of 500 to 1500 ppm is estimated, a more detailed quantitative analysis will be conducted for determination. In addition to the four types regulated by the RoHS directive, we can also perform a simple "screening analysis" for DNOP, DINP, and DIDP, which are regulated under JIG and the Food Sanitation Act. Please feel free to contact us for details about the samples and the target compounds for measurement. 【Screening analysis of phthalate esters in bubble cushioning materials using Py-GC/MS】 ■Determination criteria: Semi-quantitative values 　・Below 500 ppm: Determined as non-containing 　・Above 1,500 ppm: Determined as containing 　・500 to 1,500 ppm: Re-examination will be conducted through quantitative analysis by solvent extraction *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Polyethylene resin can be broadly classified into two types: high-density polyethylene (HDPE) and low-density polyethylene (LDPE). Although the basic molecular structure of each is the same, the differences in the degree of branching and other factors result in different properties as polymers. Here, we present examples comparing HDPE and LDPE from various analyses. Our company not only analyzes material structures and properties but also examines variations in process conditions, defects, and degradation phenomena through various analytical methods. [Case Study Content] ■ Comparative analysis of main backbone using FT-IR ■ Comparative analysis of thermal decomposition temperatures using EGA-MS ■ Comparative analysis of thermal decomposition products using thermal decomposition GC-MS *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

At AITES Co., Ltd., we conduct "Liquid Tank Thermal Shock Testing." This testing method applies stress due to temperature changes using a liquid medium, and because the temperature changes are more abrupt than in chamber-type thermal shock testing, it is an effective method for conducting tests in a short period of time. Our equipment can accommodate maximum temperatures of up to 180°C, making it suitable for accelerated testing of high heat-resistant components and materials. 【Features】 ■ Capable of handling maximum temperatures up to 180°C ■ Effective for testing and evaluating high heat-resistant components ■ More abrupt temperature changes than chamber-type thermal shock testing ■ Effective for conducting tests in a short period of time *For more details, please refer to the PDF materials or feel free to contact us.

• Measurement and Analysis Equipment

At AITES Co., Ltd., we conduct "Thermal Shock Testing." By repeatedly exposing samples to high and low temperatures, stress is generated not only from the thermal effects of high and low temperatures but also from the expansion and contraction of various parts. Repeated stress also adds to the overall stress. This test is conducted not only for the joints of electronic components but also for evaluating fixed points such as screws. 【Main Specifications of the Thermal Shock Testing Equipment】 ■ Internal Dimensions: W650×H460×D370mm Temperature Range: -65 to 0/+60 to 200℃ ■ Internal Dimensions: W650×H460×D670mm Temperature Range: -65 to 0/+60 to 200℃ ■ Internal Dimensions: W970×H460×D670mm Temperature Range: -65 to 0/+60 to 200℃ *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Analysis Equipment

We would like to introduce our ultrasonic microscope, the SAM (Scanning Acoustic Microscope). It is highly effective in detecting defects in the internal conditions and adhesion states of semiconductor packages, substrates, and electronic components. Observation can be performed non-destructively, and defects such as delamination can be detected from the reflected waves of the ultrasonic waves incident on the sample. 【Specifications (excerpt)】 ■ Pulse Receiver: 500MHz ■ Observation Methods: Supports both reflection and transmission methods ■ Acoustic Lenses/Reflection Method: 15, 25, 30, 50, 80, 100, 230MHz ■ Acoustic Lenses/Transmission Method: 15, 25, 30, 50, 100MHz *For more details, please refer to the PDF document or feel free to contact us.

• Measurement and Analysis Equipment

This document introduces "Verification of Degree of Polymerization and Molecular Weight Differences through IR Analysis" by Aites Co., Ltd. Polyethylene oxide (PEO) is used in a wide range of applications due to its properties derived from its polar structure, including as an insulating material and electrolyte in lithium-ion polymer secondary batteries, surfactants, cosmetics, and synthetic detergent raw materials. In this study, we analyzed PEO with different degrees of polymerization and molecular weights using IR analysis, attempting to interpret the differences from the spectra and conduct data analysis. We invite you to read it. [Contents] ■ Polyethylene Oxide ■ Data analysis through overlaying IR spectra of each obtained sample ■ Other analytical approaches are also possible *Please feel free to contact us.

• Other analytical equipment

In ANSI/ESDA/JEDEC JS-002-2014, it is required that the relative humidity near the device during testing be kept below 30%. The verification method involves installing temperature and humidity sensors in two locations near the sample to continuously monitor the temperature and humidity, and the test begins when the relative humidity falls below 30%. The AEC standards also explicitly state in the 2019 revision that they comply with ANSI/ESDA/JEDEC JS-002, and it is expected that the demand for low humidity environments will continue to increase in the future. 【Humidity Requirements for Major CDM Test Standards】 ■ ANSI/ESDA/JEDEC JS-002-2018: Relative humidity below 30% ■ AEC-Q100-011 Rev-D・AEC-Q101-005 Rev-A: Relative humidity below 30% ■ JEITA ED-4701/302A (Test Method 305D): Ambient temperature 25°C ± 5°C *For more details, please refer to the PDF document or feel free to contact us.

• Other services and technologies

There are various types of liquid crystal materials, including low molecular weight compounds used in LCD panels and high molecular weight polymers used in printed circuit boards and electronic components. We will introduce examples of analyzing the molecular structures of these low molecular weight liquid crystals and high molecular weight liquid crystals (LCP). Our company, equipped with a wealth of devices and expertise, can handle reliability testing and analytical analysis not only for liquid crystal materials but also for various other materials. Please feel free to consult us regarding the understanding of molecular structures of imported goods and materials, as well as troubleshooting issues. 【Case Study Content】 ■ Molecular structure analysis using FT-IR ■ Understanding of surface functional groups (molecular groups) through XPS (ESCA) analysis ■ Example of LCD liquid crystal material analysis using GC-MS *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment
• Measurement and Analysis Equipment

Our company can conduct liquid tank thermal shock tests while keeping the LED continuously powered on, allowing for verification of the lighting state during the test and constant monitoring of current values. The liquid tank applies temperature stress using a liquid medium, resulting in more abrupt temperature changes compared to a gas chamber. Since we use a highly insulating liquid, electrical tests are possible, and by monitoring the voltage (current) during the test, we can identify points of characteristic change in the LED's lighting state. 【Features】 ■ Testing can be conducted while keeping the LED continuously powered on ■ The liquid tank applies temperature stress using a liquid medium, resulting in more abrupt temperature changes compared to a gas chamber ■ Electrical tests are possible due to the use of a highly insulating liquid ■ Points of characteristic change can be identified *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We support products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests based on customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF materials or feel free to contact us.

• Analysis and prediction system

The "ESD (CDM) Testing Contract Service" evaluates the resistance of semiconductor products and electronic components, which are crucial for reliability, to damage caused by ESD in device charging models. It supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit replacement. ■ Supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ Also complies with AEC-Q100-011 for Direct Charge Method and Field Induced Method. ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments. ■ Ensures reliable application through contact confirmation functions for applied pins. *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

In this document, we introduce the microtome and knives, along with examples of cross-sectional observations. The "microtome" is a device used to prepare cross-sectional observation samples for TEM, SEM, and OM, utilizing glass knives or diamond knives for sample cutting. Glass knives are mainly used for sample preparation (trimming), while diamond knives are used for finishing. For the cross-sectional observation, the preparation of the cross-section was carried out on the gold-plated terminal part of a flexible cable. We encourage you to read it. [Contents] ■ Equipment and knives ■ Examples of cross-sectional observations *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We would like to introduce the cross-sectional observation of Pb-free solder after the reliability tests conducted by our company. Pb-free solder assemblies (Sn/Ag/Cu alloy solder) were subjected to three types of reliability tests. We compared the initial products with those after testing to check for the presence of cracks and the growth of intermetallic compound layers. To gradually confirm the durability of the solder joints, such as monitoring crack propagation, the TC test, which allows for cross-sectional observation after each cycle, is recommended. 【Test Conditions】 (1) TC Test (Temperature Cycle) 125℃ for 20 minutes / -40℃ for 20 minutes / 1000 cycles (2) HT Test (High-Temperature Storage) 150℃ for 1000 hours (3) TH Test (Temperature and Humidity) 85℃ / 85% RH for 1000 hours *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

One of the features of EPMA is the guide network mapping method. In SEM-EDX, the measurement range is narrow, and surface analysis may not be accurately measured on curved samples. However, by using the guide network mapping method of EPMA, extensive analysis becomes possible. This method automatically measures adjacent continuous areas and displays them collectively, making it useful for measuring surfaces with uneven height differences or for measuring large surfaces. 【Features of the Guide Network Mapping Method】 ■ A method for automatically measuring adjacent continuous areas and displaying them collectively. ■ Used for measuring surfaces with uneven height differences or for measuring large surfaces. *For more details, please refer to the PDF materials or feel free to contact us.

• Analysis and prediction system