Reliable application through the contact confirmation function of the applied pin! Compatible with direct charging method and electric field induction method.
The "ESD (CDM) Testing Contract Service" evaluates the resistance of semiconductor products and electronic components, which are crucial for reliability, to damage caused by ESD in device charging models. It supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit replacement. ■ Supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ Also complies with AEC-Q100-011 for Direct Charge Method and Field Induced Method. ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments. ■ Ensures reliable application through contact confirmation functions for applied pins. *For more details, please refer to the PDF materials or feel free to contact us.
Inquire About This Product
basic information
【Device Specifications】 ■ Applied (Charging) Voltage: 0 to ±4000V ■ Step Voltage: 5V ■ Number of Applications: 1 to 99 times ■ Number of Pins: Up to 1024 pins ■ Application Unit: JEDEC, JEITA, EIAJ, AEC ■ Charging Methods ・D-CDM (Direct Charging Method): JEITA, EIAJ, AEC ・FI-CDM (Field Induction Method): JEDEC, AEC *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog(10)
Download All CatalogsCompany information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.