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● Evaluation/Analysis of Solar Cell Modules We conduct failure analysis and performance evaluation of solar cell modules. - Non-destructive testing: We reveal failure conditions through EL measurements and output measurements equivalent to product shipment inspections. - Destructive testing: We identify the causes of failure through cross-sectional component analysis of defective parts. ● On-site Investigation We investigate the damage to solar panels caused by natural disasters and the causes of power generation decline. - We propose appropriate methods, starting with measurements by Solament, to investigate failure conditions and causes. - Based on the investigation results, we will submit an investigation report to the insurance company.
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●Calibration This is a service to check whether the measurement values of the measuring instrument are appropriate. Regular calibration is necessary to maintain the reliability of the measurement values. ●Inspection You can check the health status of the measuring instrument. By quickly identifying potential sources of failure, it also helps in preventing troubles.
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The "eSoraMente" series is a 750V-compatible device designed for residential and small-scale solar power generation systems. It includes the eSoraMente-Z eZ-10 and the current sensor eA-10. The eZ-10 is an inspection device that probes each string P/N terminal in the junction box to detect strings with faulty panels. It applies a special detection signal to the string circuit, measures the open-circuit voltage and series resistance (impedance), and identifies strings with abnormalities. When an abnormal string is detected during the string measurement with the eZ-10, the current sensor eA-10 is connected to the eZ-10 to identify the faulty panel. The eA-10 is an inspection device that places a sensor on the surface of the panels during generation to detect cluster failures*. It senses the generation current flowing through the interconnector and alerts you with sound if there are clusters not generating power. (*Cluster failures occur due to initial defects, aging degradation, lightning damage, etc.) The eSoraMente aims for greater ease of use with its compact and simple functionality.
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The String Checker Solamente-Z SZ-1000 can identify solar panel failures on a string-by-string basis. The SZ-1000 is an inspection device that probes the P/N terminals of each string in the junction box to detect strings with faulty panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-1000 supports DC voltages up to 1500V for high voltage and extra high voltage applications. Its user-friendly operability has been inherited from the SZ-200, and it has become even easier to read with a large LCD display.
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Introducing the "Reliability Testing, Haze Measurement, and IR Analysis Set Menu Service." Plastic (resin) materials can discolor and deteriorate depending on the usage environment. Transparent materials have valuable properties such as transparency and high transmittance, but these characteristics can diminish due to degradation, leading to a loss of functionality as a material. This document explains "Examples of Reliability Testing Equipment," "Haze Measurement Results," and "IR Analysis Results" using tables and graphs. Please take a moment to read it. [Contents] ■ Examples of Reliability Testing Equipment (Constant Temperature and Humidity Testing Equipment) ■ Haze Measurement Results ■ IR Analysis Results *For more details, please refer to the PDF document or feel free to contact us.
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I would like to introduce the topic of "Analysis of Polymer Structural Changes." This document includes "Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy" and "Structural Changes of Polymer Chains." The molecular structure of polymers influences their properties, affecting the physical characteristics of polymer products. We have evaluated the higher-order structures formed by the aggregation of polymer chains using analytical methods. Please take a moment to read it. [Contents] ■ Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy ■ Structural Changes of Polymer Chains *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces the analysis of PTP packaging sheets using EGA-MS analysis and thermal desorption/pyrolysis GC-MS analysis. Various materials are used in industrial products; for example, polymers contain low molecular weight components such as additives and high molecular weight components that are the polymers themselves. In GCMS analysis, low molecular weight components volatilize at relatively low temperatures, while high molecular weight components need to be decomposed at high temperatures before analysis. Here, we present an example of analyzing the polymer and additive components of PTP packaging sheets used for tablets. We invite you to read it. [Contents] ■ Evolved Gas Analysis Method (EGA-MS Analysis) ■ Analysis Example of PTP Packaging Sheets *For more details, please refer to the PDF document or feel free to contact us.
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Introducing the "Transmittance Measurement Service Using an Automatic Spectrophotometer." The transmittance of transparent materials is an important characteristic item in the specifications of the products used. This characteristic may deteriorate or be lost due to degradation from heat, humidity, ultraviolet light, and other factors. This document includes the principles of the equipment, as well as a comparative evaluation of the changes in transmittance before and after constant temperature and humidity testing of transparent resins, along with discussions on the results. We encourage you to read it. [Contents] ■ Principles and specifications of the automatic spectrophotometer ■ Changes in transmittance of PET resin (polyethylene terephthalate) ■ Changes in transmittance of PVC resin (polyvinyl chloride) *For more details, please refer to the PDF document or feel free to contact us.
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We will introduce the flow from basic and widely applicable optical microscopy observations to SEM observations and EDX elemental analysis. Observation using optical microscopy is one of the fundamental observation techniques and allows for quick examination of general shapes. Additionally, its feature is that it provides color information, making it useful for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "SEM observations" and "EDX elemental analysis" using photos and graphs. Please take a moment to read it. 【Contents】 ■ Observation using optical microscopy ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.
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When conducting EDX analysis, many people may use high acceleration voltages to increase the detection sensitivity of elements. However, depending on the purpose, analysis at high acceleration voltages is not always the best option. White LEDs generate white light by combining blue LEDs with yellow phosphors (powder), and in this study, we examined how changing the acceleration voltage affects the surface analysis of these phosphors. Please take a moment to read this. [Contents] - Test sample (LED phosphor) - Surface analysis images at different acceleration voltages - Considerations from Monte Carlo simulations of electron beam scattering regions *For more details, please refer to the PDF document or feel free to contact us.
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Reliability testing of materials that make up a product under thermal and humidity stress is essential, but the analysis and evaluation after testing is also an indispensable process. Constant temperature and humidity testing is a device that applies temperature and humidity stress to products and materials to check for changes in physical properties, characteristics, appearance, and lifespan. Our company has also devised various ways to accommodate a wide range of samples. In this document, we will introduce a case study that verified changes in the molecular structure of materials before and after constant temperature and humidity testing through IR analysis. We encourage you to read it. [Contents] ■ Examples of reliability testing equipment (constant temperature and humidity testing equipment) ■ Innovations in sample placement ■ Comparative evaluation before and after testing through chemical analysis *For more details, please refer to the PDF document or feel free to contact us.
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EPMA has seven spectroscopic crystals, and by selecting the spectrometer according to the wavelength of the target element, it achieves good energy resolution and detection sensitivity, allowing for excellent results in quantitative analysis of trace components and map analysis. This document provides detailed information using diagrams, including the "Measurement Principle of Wavelength Dispersive X-ray Spectrometer (WDS)" and "Measurement Example of 22Ti." Please take a moment to read it. [Contents] ■ Wavelength Dispersive X-ray Spectrometer (WDS) ■ Measurement Example 22Ti *For more details, please refer to the PDF document or feel free to contact us.
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This document presents a case study on a broken crab claw due to long-term use, including observations from cross-sections, elemental analysis, and ultra-microhardness measurements. It clearly includes comparisons of hardness using an ultra-microhardness tester, as well as the relationship between surface analysis results of the fracture and ultra-microhardness (low load), illustrated with photos and diagrams. We encourage you to take a look. 【Contents】 ■ Observation of the broken crab claw ■ Hardness comparison using an ultra-microhardness tester ■ Relationship between surface analysis results of the fracture and ultra-microhardness (low load) *For more details, please refer to the PDF document or feel free to contact us.
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SEM observation involves detecting secondary and backscattered electrons generated when electrons irradiate the surface of a sample and scatter in the sample's outermost layer. These electrons are captured by a detector and displayed as an image on a monitor. There are various types of detectors for capturing electrons, each yielding images that leverage their unique characteristics, and the appearance can change by varying the acceleration voltage. In this document, we introduce SEM images captured under various conditions. We encourage you to read it. 【Contents】 ■ Backscattered Electron Images - Backscattered electron images at high acceleration voltage (AsB detector) - Backscattered electron images at low acceleration voltage (EsB detector) ■ Secondary Electron Images - Differences in appearance due to acceleration voltage - Differences in appearance due to detector position *For more details, please refer to the PDF document or feel free to contact us.
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We will introduce the lamp heating test (infrared irradiation test). The test sample is placed in an environmental test chamber, where the ambient temperature is controlled under a blown air condition, and infrared lamps (up to 7) are used to irradiate light, controlling the temperature of the surface temperature sensors of the sample to be higher than the ambient temperature. For example, it can simulate the stress of overheating due to sunlight in a car interior that has reached high temperatures during the day. 【Features】 ■ Capable of conducting infrared irradiation tests under blown air conditions in an environmental test chamber ■ Can recreate an environment where the surface temperature of the sample is higher than the ambient temperature *For more details, please refer to the PDF materials or feel free to contact us.
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At Aites Co., Ltd., we conduct "FT-IR analysis" to confirm the degradation of resins. The degradation of resins can manifest as visible discoloration or invisible changes. Discoloration can be detected through changes in appearance, but invisible changes can lead to a decrease in strength and become the source of various issues. Analysis using IR allows us to understand the changes in molecular structure caused by these alterations. *For more details, please refer to the PDF document or feel free to contact us.*
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This introduces the detection sensitivity related to differences in acceleration voltage during SEM-EDX analysis. When analyzing the gold-plated surface of a typical printed circuit board (PCB), there are cases where the underlying nickel is detected even though it is not exposed. This is related to the scattering depth of the electron beam, and it is necessary to set appropriate acceleration conditions to obtain accurate analysis results. In this study, we conducted a verification of the EDX detection depth based on differences in acceleration voltage using Monte Carlo simulations. This is just one example, but it is important to set the acceleration voltage while imagining how electrons are scattered in order to obtain accurate analysis results. [Test Board Overview] - The sample used was a gold-plated pad from a typical printed circuit board (PCB). - The layer structure consists of nickel plating and gold plating on copper wiring. - The thickness of the gold plating, as observed in cross-section, is 212 nm. *For more details, please refer to the PDF document or feel free to contact us.*
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This introduction covers the evaluation of transmittance and yellowing (yellowness) using a color difference meter. By making the product's constituent materials transparent and rich in color, necessary functional characteristics, artistic qualities, and design elements for the product's application are imparted. However, yellowing (discoloration) may occur due to the environment in which they are used, potentially compromising those characteristics. By quantifying transparency and color not through human visual perception but as numerical data, objective evaluation becomes possible. [Overview] ■ Principles of color difference measurement and acquired data (XYZ Yxy color space) - Light emitted from the light source passes through the transparent sample, and within the integrating sphere box, data on the transmitted wavelengths (transmittance) and converted color space data is obtained. *For more details, please refer to the PDF document or feel free to contact us.
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The polarizers used in LCD panels are made of multilayer films laminated with materials such as triacetyl cellulose, polyvinyl alcohol, and polyethylene terephthalate. This document presents a case study of the degradation analysis of panel polarizers after reliability testing, conducted through HS-GCMS analysis and thermal desorption GCMS analysis. Even invisible degradation might be detected with this analysis?! Please take a moment to read it. [Contents] ■ Reliability Testing ■ Outgassing Analysis via HS-GCMS ■ Low Boiling Point Component Analysis via Thermal Desorption GCMS *For more details, please refer to the PDF document or feel free to contact us.
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In research and development, analysis and evaluation are essential processes that serve as checkpoints, and often the materials that make up the product are noteworthy subjects of focus. Aites assists manufacturers in their research and development with a diverse range of analytical instruments, observation devices, reliability testing equipment, and accumulated knowledge and chemical reaction mechanisms. We are ready to support you with our abundant technology, knowledge, and equipment, so please feel free to contact us. 【Features】 <Examples of Analytical Instruments> ■ Microscopic IR ■ Microscopic Raman ■ (EGA/TD/Pyr) GC-MS ■ TOF-SIMS *For more details, please refer to the PDF document or feel free to contact us.
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We offer a service for measuring the haze value (haze) and total light/diffuse transmittance of transparent materials (transparent films/sheets, glass, ITO, etc.). We use a haze meter device to measure the degree of haze and the degree of light diffusion. The results are expressed as the ratio of total light transmittance (T.T), which includes both the parallel component (P.T) and all diffuse components, to the diffuse transmittance (DIF), which excludes the parallel component. In addition to providing this service, we also offer data analysis and considerations from a molecular structure perspective. Please feel free to contact us when you need our services. 【Device Specifications】 ■ Device: Manufactured by Nippon Denko Kogyo Co., Ltd. ■ Standards: JIS K7136 / JIS K7136-1 / JIS K7105 / ASTM D1003 ■ Sample Size: 40×40 to 200×280 mm ■ Data Obtained: - Total light transmittance / Haze (degree of haze) / Parallel light transmittance / Diffuse transmittance *For more details, please refer to the PDF document or feel free to contact us.
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Lenses for glasses and cameras are coated with various layers. In the case of glasses, multiple coating layers are applied, including a hard coat to protect plastic lenses, an anti-reflective coat to reduce light reflection, and a UV coat to block ultraviolet rays. These layers are applied as very thin films, so we observed them from a cross-section. When observed with a scanning electron microscope (SEM), it was noted that a hard coat/multilayer film is applied on top of the lens substrate, and in the multilayer film, SiO and Nb films are alternately stacked. [Overview] ■ Cross-section preparation method - Prepared with a microtome - The lens removed from the frame was cut into small pieces and embedded in resin - Subsequently, a cross-section was prepared using a microtome, followed by optical microscope observation, SEM observation, and EDX analysis *For more details, please refer to the PDF document or feel free to contact us.
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We present an observation case of a large sample (expansion valve) measuring 65mm × 28mm. This sample uses magnetic materials, and due to distortion in the images during SEM observation, we primarily conducted observations using an optical microscope. From the appearance and X-ray radiographic observation, it was found that there are some areas that are not visible in the X-ray. 【Overview】 ■ Appearance and X-ray radiographic observation ■ Cross-sectional observation using an optical microscope *For more details, please refer to the PDF document or feel free to contact us.
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Here is a case study of the observation of aluminum spot welds. Internal observation using X-ray radiography revealed voids within the weld, and internal observation using X-ray CT confirmed that the voids are located near the center of the weld (between the two aluminum plates). Additionally, by creating a cross-section of the same sample and combining mechanical polishing with chemical etching, we were able to observe the condition of the weld more clearly. 【Summary】 ■ Internal observation using X-ray radiography - Conducted non-destructive testing and X-ray radiographic observation - Voids were observed within the weld ■ Internal observation using X-ray CT - Conducted non-destructive testing and X-ray CT observation - Confirmed that the voids are located near the center of the weld ■ Cross-sectional observation using optical microscopy and tabletop SEM - Mechanical polishing and chemical etching A cross-section tailored to the sample allows for clearer observation. *For more details, please refer to the PDF document or feel free to contact us.
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As an example of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, and we would like to introduce it. For a sample where an aluminum plate was spot-welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a larger number of large grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It can be seen that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It is confirmed that the weld area has a greater distribution of large grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.
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In the evaluation of test environments and observation environments, whisker observation is important. However, whiskers are very delicate and sensitive to vibrations and air fluctuations, so care must be taken in handling them during post-test movement and storage. Our company has consolidated the test chamber, storage area, and observation location on one floor to reduce the risks associated with movement and storage, creating an environment where whiskers do not fall off or disappear. Additionally, we also offer migration observation before and after reliability testing, as well as solder surface observation, so please feel free to contact us. 【Features】 - Consistent service from reliability testing to observation - Consolidation of the test chamber, storage area, and observation location on one floor - Reduced risks associated with movement and storage - Whiskers do not fall off or disappear - Support for migration observation and solder surface observation before and after reliability testing *For more details, please refer to the PDF document or feel free to contact us.
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If solvents, low molecular organic substances, or unreacted materials remain in the constituent materials, packaging materials, or cushioning materials of a product, they may outgas, diffuse, or permeate into the constituent materials, potentially affecting the product's lifespan, characteristics, and the environment or human health. The headspace method of GCMS is effective for qualitative and quantitative analysis of trace residual substances. This document presents a case study of the qualitative analysis of outgassing components from polarizers used in liquid crystal panels. We invite you to read it. [Contents] - Headspace GC-MS analysis method - Analysis of outgassing components from polarizers in liquid crystal panels *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce our "Dye and Pry Test for Implementation Components." As methods for confirming the breakage and delamination of packages and implementation components, there are non-destructive tests (such as transmission X-ray and CT) and cross-sectional observations. However, these methods make it difficult to capture the spread of delamination in the "plane" of the broken layer. In the dye and pry test, by infiltrating a coloring solution or fluorescent liquid, we can observe the breakage and delamination layers. Please feel free to contact us if you would like to make a request. 【Flow of the Dye and Pry Test】 ■ Dye immersion ■ Pry ■ Observation using optical microscopy or SEM *For more details, please refer to the PDF document or feel free to contact us.
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I would like to introduce the topic of "Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX." We conducted cross-section preparation of the joint area of a copper crimp terminal fixture for resistance measurement, applied chemical etching to the prepared cross-section, and observed the metal structure before and after etching. As a result, we infer that the detected elements are P (phosphorus), Ag (silver), and Cu (copper), indicating that it is a silver-containing phosphorus copper soldering material. *For more details, please refer to the PDF document or feel free to contact us.*
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At Aites Co., Ltd., we conduct analysis of resin materials (for semiconductor LED applications). Resin materials such as epoxy resin and silicone resin are widely used in semiconductor products like MOSFETs and ICs, as well as in LED packages. The properties of these materials significantly contribute to the performance of the products. Our company is capable of analyzing these resin materials and evaluating the characteristics that affect product performance. 【Analysis and Evaluation Methods】 ■DSC ■TMA ■GCMS ■SEM-EDX ■TG-DTA ■FT-IR *For more details, please refer to the PDF document or feel free to contact us.
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At Aites Co., Ltd., we conduct 1H NMR analysis of phthalate esters. NMR analysis is an effective method for distinguishing compounds with similar molecular structures and elucidating structures such as the bonding positions of side chains and substituents, as well as branching structures. In organic synthesis and polymer synthesis, it is an essential analysis to confirm whether the targeted molecular structure has been obtained. The characteristic effects and efficacy of pharmaceuticals, supplements, food, and fibers are influenced by the positions of substituents in the molecular group and the molecular structure. Our skilled team will provide in-depth organic molecular structure analysis. *For more details, please refer to the PDF document or feel free to contact us.
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At Aites Co., Ltd., we conduct 1H NMR analysis of phthalate esters. NMR analysis and GCMS analysis are effective for distinguishing and identifying compounds with similar structures. In this analysis, we can obtain information about structural features such as the number of protons from integration values, functional groups from chemical shifts, and the positional relationships with surrounding protons from coupling patterns and coupling constants. *For more details, please refer to the PDF materials or feel free to contact us.
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At Aites Co., Ltd., we conduct material degradation analysis. We propose appropriate analytical methods based on the condition of polymer materials and samples. By analyzing the degradation process that the material has undergone and optimizing the polymer materials and usage environment, it is possible to extend the product's lifespan. *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces "Load Removal Mode & Color Filter Measurement Examples Using a Ultra-Micro Hardness Tester" by Aites Co., Ltd. It explains the results obtained from hardness measurements using graphs. Additionally, it includes examples of measuring the hardness of Red, Green, and Blue color resists by extracting color filters from discarded displays, accompanied by photos and graphs. Please feel free to download and take a look. [Contents] ■ Results obtained from hardness measurements ■ Examples of hardness measurement of color filters within displays *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce our "High-Temperature Latch-Up Testing." In recent years, there has been an increasing demand for latch-up testing under maximum operating ambient temperature conditions for devices. In particular, for automotive components under AEC standards, the testing conditions are limited to Class II (maximum operating ambient temperature), and for devices that require operation in high-temperature conditions, high-temperature latch-up testing is recommended. 【Main Standards for Latch-Up Testing (Excerpt)】 ■ JEDEC (JESD78E) - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating ambient temperature ■ JEITA {JEITA ED4701/302 (Test Method 306B)} - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating temperature *For more details, please refer to the PDF document or feel free to contact us.
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In a typical thermal decomposition GCMS, samples are heated to detect volatile components, but it is difficult to analyze components that do not volatilize upon heating or those with low detection sensitivity. Therefore, by adding a special reagent to the sample and heating it, it becomes possible to detect substances that are usually difficult to identify. For example, in the analysis of polymers, thermal decomposition of the polymer results in the detection of a large number of decomposition products, and in some cases, peaks may overlap with other additives, making analysis challenging. However, by performing reactive thermal decomposition GCMS, it is possible to detect the monomer methyl ester and to separate and analyze it from the additives. Thus, even when the target analyte is difficult to detect using conventional analysis, reactive thermal decomposition GCMS allows for sensitive detection by selecting appropriate reagents for the analyte. [Examples] - Analysis of phthalate esters (DIDP) - Analysis of polymers (polyethylene terephthalate) - Analysis of copper corrosion inhibitors (BTA) *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces methods for preparing cross-sections. When conducting observations, analyses, or evaluations, there may be a need to prepare cross-sections. By selecting or combining methods that are appropriate for the purpose, material, and structure, it is possible to obtain highly reliable results. In mechanical processing, methods such as "mechanical polishing" and "microtome" are included. In ion beam processing, main cross-section preparation methods such as "FIB" and "ion polisher (CP)" are also listed. We encourage you to read it. [Contents] ■ Main cross-section preparation methods ■ Processing conditions ■ Advantages & disadvantages *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM, but by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of magnets in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.
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This is an introduction to "Crack Observation Using Desktop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. Even small cracks that may be overlooked in optical microscopy can be clearly identified through SEM observation. Moreover, with a desktop SEM, there is no need for conductive treatment, allowing for quick and detailed observation. 【Features】 ■ No deposition required ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.
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We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became commonplace. SEM observation has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 ■ For conductive samples such as semiconductors and electronic components, SEM observation is recommended mainly in normal/conductive mode. ■ For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces the cross-sectional observation of solar cell modules. After inspecting the solar cell module that underwent thermal shock testing, cross-sectional observations were conducted at the identified areas of abnormality, confirming that the interconnector solder joint had fractured. 【Contents】 ■ Cross-sectional observation of the fracture ■ Elemental map of the fracture *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces the processing damage associated with mechanical polishing methods. Mechanical polishing is a long-established technique for preparing cross-sections, capable of producing cross-sections over a wide range, from a few centimeters to about 10 centimeters. However, issues such as altered layers, steps, elongation (stretching), and embedding can occur during processing, leading to problems where "what should be present is absent" and "what should be absent is present." At Aites, we conduct highly reliable cross-section preparation based on the technology and experience we have cultivated over many years. [Contents] ■ Main processing damages in mechanical polishing methods ■ Importance of polishing finishes tailored to material characteristics ■ Case studies with solder (BGA) *For more details, please refer to the PDF document or feel free to contact us.
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At Aites Co., Ltd., we offer "HAST testing for power devices." 【Features】 - Capable of conducting unsaturated vapor pressure tests with a maximum voltage of 1000V - Evaluation of corrosion and migration of metal wiring through current flow under high temperature and high humidity conditions - Real-time monitoring during testing to assess sample degradation
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By mechanically polishing commercially available rectangular Li-ion batteries and observing them with optical microscopy and ultra-low acceleration FE-SEM, detailed structural analysis and elemental analysis can be performed. The materials introduce the overall structure of the Li-ion battery and detailed structural observations of the Li-ion battery using SEM and ultra-low acceleration FE-SEM, accompanied by photographs. [Analysis Overview] ■ Overall structure of the Li-ion battery and SEM observation ■ Detailed structural observation of the Li-ion battery using ultra-low acceleration FE-SEM *For more details, please refer to the PDF materials or feel free to contact us.
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While lead-free solder is becoming widespread, the whiskers generated from Sn plating or solder joints have a significant impact on the reliability of electronic components. Our company observes whiskers using a digital microscope with depth composition functionality, and conducts three-dimensional measurements to evaluate whisker growth. By collaborating with the reliability testing group, we can implement whisker evaluations quickly and eliminate transportation risks. 【Features】 ■ Support from observation to three-dimensional measurement in reliability testing ■ Observation of whiskers using a digital microscope with depth composition functionality ■ Ability to conduct whisker evaluations quickly and eliminate transportation risks *For more details, please refer to the PDF document or feel free to contact us.
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