Confirmation methods for low molecular siloxanes! It is also possible to analyze the amount of generation.
It is known that low molecular siloxanes emitted from silicone products can cause the generation of silicon dioxide, an insulator, due to the heat from electrical sparks when present around the contacts of electronic components, leading to contact failures. Here, we introduce outgassing quantitative analysis using HS-GCMS as a method to confirm low molecular siloxanes. HS-GCMS analysis can determine whether there are materials around the electronic components that emit low molecular siloxanes and to what extent they are emitted. Please feel free to contact us regarding sample size and conditions. 【HS-GCMS Analysis of Silicone Adhesive Tapes】 ■ Tapes using silicone adhesives are sealed in vials. ■ After heating at 130°C for 30 minutes, the generated outgas is analyzed using headspace GCMS. ■ For the detected low molecular siloxanes, quantification was performed based on the equivalent of cyclic siloxane D5. *For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■Quantitative analysis of low molecular weight siloxanes *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.