From DUT board production to testing! We will propose and conduct tests according to your requests and objectives.
The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We support products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests based on customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF materials or feel free to contact us.
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【Device Overview / Evaluation Content】 ■ HBM Test (C=100pF, R=1.5kΩ) ±5V to ±4000V (Step: 5V) ■ MM Test (C=200pF, R=0Ω) ±5V to ±2000V (Step: 5V) ■ Supports various application conditions such as single/step-up application and pin combination application ■ Breakdown judgment methods: Supports four types of evaluations: protection diode characteristic evaluation, IiL/IiH characteristic evaluation, VoL/VoH characteristic evaluation, and power pin characteristic evaluation ■ Handles everything from arranging sockets and dedicated conversion boards to creating DUT boards for testing and conducting tests *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.