We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!
Our company is capable of conducting performance verification through good characteristic measurements, defective characteristic measurements, and reliability evaluations for specific TFTs in LCD panels. In the "Electrical Characteristic Measurement of TFTs at Various Temperatures," we can disassemble the monitor in display mode and perform electrical characteristic measurements on the pixel TFTs within the panel. In the "DC Bias Stress Test," we apply an arbitrary DC bias to the Gate and Drain and measure the Vth shift when stress is applied to the TFT, thereby confirming reliability. 【Features】 <Electrical Characteristic Measurement of TFTs at Various Temperatures> ■ Electrical characteristic measurements can be performed on the pixel TFTs within the panel. ■ Measurements can be conducted before and after annealing, under light exposure, heating, or cooling conditions. ■ From the measurement results, indicators such as Ion, Ioff, Vth, and mobility can be calculated. ■ Confirmation of actual values in good product analysis and clarification of defect causes can be performed. *For more details, please refer to the PDF document or feel free to contact us.
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【Other Features】 <DC Bias Stress Test> ■ Apply an arbitrary DC bias to the Gate and Drain, measure the Vth shift when stress is applied to the TFT, and confirm reliability. ■ Can be measured even in a heated state as an accelerated test. ■ By conducting measurements with multiple panel manufacturers and comparing the Vth shift amounts, superiority judgments can also be made. *For more details, please refer to the PDF materials or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
