Introducing examples of observation and analysis of coating films used in various products, including "microtomes" that can perform planar inclined cutting!
We will introduce examples of observation and analysis of coating films used in various products such as automobiles and mobile phones. The "Triple Ion Polisher (CP)" can process samples containing both hard and soft materials without causing damage, while the "Microtome" is capable of not only producing cross-sections but also performing planar inclined cutting. Additionally, the "Desktop Oblique Cutting Machine" can extract sample surfaces that are 6 to 300 times the original thickness as surface information, and the "Desktop SEM (Scanning Electron Microscope)" has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. [Observation of Plastic Coating (Mobile Phone Case)] - Triple Ion Polisher (CP) - Microtome - Desktop Oblique Cutting Machine - Desktop SEM (Scanning Electron Microscope) *For more details, please refer to the PDF document or feel free to contact us.
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**Features** ■ Triple Ion Polisher (CP) - Enables damage-free processing even for samples containing both hard and soft materials. ■ Microtome - Capable of not only producing cross-sections but also performing planar inclined cutting. ■ Desktop Inclined Cutting Machine - Can extract sample surfaces that are 6 to 300 times the original thickness as surface information. ■ Desktop SEM (Scanning Electron Microscope) - Has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. *For more details, please refer to the PDF document or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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![[Data] Cross-section production method](https://image.www.ipros.com/public/catalog/image/01/cfa/550895/IPROS35597836381814234211.jpeg?w=120&h=170)
Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.