Comprehensive analysis is possible! Here are examples of analysis using the EPMA guide network map method.
One of the features of EPMA is the guide network mapping method. In SEM-EDX, the measurement range is narrow, and surface analysis may not be accurately measured on curved samples. However, by using the guide network mapping method of EPMA, extensive analysis becomes possible. This method automatically measures adjacent continuous areas and displays them collectively, making it useful for measuring surfaces with uneven height differences or for measuring large surfaces. 【Features of the Guide Network Mapping Method】 ■ A method for automatically measuring adjacent continuous areas and displaying them collectively. ■ Used for measuring surfaces with uneven height differences or for measuring large surfaces. *For more details, please refer to the PDF materials or feel free to contact us.
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【Analysis Example】 <Elemental Analysis of Tablet Surface> ■ By arbitrarily dividing the measurement range into sections such as 2×2 or 3×3 and measuring, it becomes possible to conduct extensive measurements. ■ Due to the height differences, measurements using SEM-EDX become localized, making it difficult to grasp the elemental distribution on the tablet surface. <Surface Analysis (Silicon Surface Analysis in a 3×3mm Range)> ■ In standard measurements, the focus does not align with the convex part in the center of the sample, resulting in an inaccurate distribution. ■ By using the guide network map method, it was possible to obtain an accurate distribution without being affected by height differences. *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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![[Data] Example of EPMA Analysis](https://image.www.ipros.com/public/catalog/image/01/694/588030/IPROS28873873053567816769.jpeg?w=120&h=170)
![[Data] EPMA Analysis Example 2](https://image.www.ipros.com/public/catalog/image/01/409/603095/IPROS75778074094365425068.jpeg?w=120&h=170)
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.