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  6. LCD Panel Analysis Data Collection

LCD Panel Analysis Data Collection

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last updated:Oct 05, 2023

アイテス
アイテス
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If you're having trouble with LCD analysis, we at ITES are here to help you find a solution!

Are you struggling with LCD analysis? We, at Aites, are here to help you find a solution! Structural Analysis: We evaluate and report on potential issues related to characteristics and structure in FPD products and advanced technologies that are constantly evolving. Failure Analysis: We approach and investigate the causes of manufacturing defects in increasing overseas products through the shortest route. Reliability Testing: Based on your objectives and needs, we propose the optimal reliability testing methods and conditions using our extensive know-how. [Contents] ■ Did you know? What is a display? ■ Panel analysis case studies ■ Tell me more! Aites' LCD analysis ■ Aites can perform these types of analyses!

    othersOther PCs and OA equipment
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LCD Panel Analysis Data Collection

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LCD Panel Analysis Data Collection

LCD Panel Analysis Data Collection

OTHER
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[Case Study] X-ray Fluoroscopy and CT Examination Equipment

[Case Study] X-ray Fluoroscopy and CT Examination Equipment

TECHNICAL
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Total support service for chemical analysis

Total support service for chemical analysis

OTHER
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Total Support Service for Reliability

Total Support Service for Reliability

OTHER
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Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

OTHER
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Evaluation of TFT characteristics of liquid crystal panels

Evaluation of TFT characteristics of liquid crystal panels

PRODUCT
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[Information] Transmittance measurement service using a self-recording spectrophotometer

[Information] Transmittance measurement service using a self-recording spectrophotometer

OTHER
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[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

OTHER
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[Data] We will solve the cause of the issue from a chemical perspective.

[Data] We will solve the cause of the issue from a chemical perspective.

OTHER
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Measurement of haze for transparent materials, total light/diffuse transmittance measurement service.

Measurement of haze for transparent materials, total light/diffuse transmittance measurement service.

PRODUCT
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[Data] FT-IR Analysis of Transparent Resin

[Data] FT-IR Analysis of Transparent Resin

OTHER
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Flow of Chemical Analysis

Flow of Chemical Analysis

DOCUMENT
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[Data] Analysis of SEG-LCD Panel Display Malfunctions

[Data] Analysis of SEG-LCD Panel Display Malfunctions

OTHER
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[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

OTHER
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[Data] Set menu service for reliability testing, haze measurement, and IR analysis.

[Data] Set menu service for reliability testing, haze measurement, and IR analysis.

OTHER
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Evaluation of transmittance and yellowing degree (yellowness) using a color difference meter.

Evaluation of transmittance and yellowing degree (yellowness) using a color difference meter.

OTHER
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Panel Polarizer Degradation Analysis

Panel Polarizer Degradation Analysis

OTHER
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Observation of the coating layer of eyeglass lenses using a microtome.

Observation of the coating layer of eyeglass lenses using a microtome.

TECHNICAL
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Outgassing analysis using headspace GC-MS analysis method.

Outgassing analysis using headspace GC-MS analysis method.

OTHER
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Shall we clarify the molecular structure of organic compounds a bit more?

Shall we clarify the molecular structure of organic compounds a bit more?

TECHNICAL
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Total Quality Technology Solutions

Total Quality Technology Solutions

PRODUCT
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LED failure analysis

LED failure analysis

OTHER
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Defective analysis of LCD panels

Defective analysis of LCD panels

PRODUCT
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LCD panel quality analysis

LCD panel quality analysis

PRODUCT
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Failure analysis of ICs

Failure analysis of ICs

PRODUCT
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Cross-section polishing (CP) method for cross-sectional observation service.

Cross-section polishing (CP) method for cross-sectional observation service.

PRODUCT
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[Analysis Example by EBSD] Chip

[Analysis Example by EBSD] Chip

PRODUCT
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Cross-sectional observation pre-treatment (sample cutting and resin embedding)

Cross-sectional observation pre-treatment (sample cutting and resin embedding)

PRODUCT
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GCMS analysis of liquid crystal components

GCMS analysis of liquid crystal components

TECHNICAL
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TOF-SIMS analysis of trace contaminants

TOF-SIMS analysis of trace contaminants

TECHNICAL
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[Information] Liquid Crystal Materials and Their Analytical Techniques

[Information] Liquid Crystal Materials and Their Analytical Techniques

OTHER
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Total solution for the reliability of LCD displays.

Total solution for the reliability of LCD displays.

PRODUCT
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Electronic Device Repair: Panel Computer

Electronic Device Repair: Panel Computer

OTHER
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Surface observation of IC chips implemented on LCD panels.

Surface observation of IC chips implemented on LCD panels.

TECHNICAL
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Analysis of defects in overseas manufactured displays.

Analysis of defects in overseas manufactured displays.

PRODUCT
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Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

PRODUCT
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Analysis of good quality overseas manufactured LCD displays

Analysis of good quality overseas manufactured LCD displays

TECHNICAL
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Observation of conductive particle shape in COG implementation

Observation of conductive particle shape in COG implementation

TECHNICAL
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Observation of conductive particle shapes in COG implementation

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We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection state, cross-sectional observations were conducted, revealing that the amount of particle deformation was "medium," indicating an appropriate level of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any investigations related to panel issues.

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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