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We will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between SEM images and visualized in three dimensions using three-dimensional construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area. [Contents] ■ About Slice & View and three-dimensional reconstruction ■ Continuous SEM observation and three-dimensional reconstruction of failure locations identified by OBIRCH *For more details, please download the PDF or feel free to contact us.
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At Aites Co., Ltd., we conduct "optical film analysis." Optical films used in smartphones and other devices have various functions depending on their structure and materials. We can investigate the transmission characteristics of anti-peeping films using angle-variable spectrophotometry and analyze the mechanism of function manifestation through cross-sectional observation and Raman analysis. 【Features】 ■ Measurement of optical properties ■ Analysis of the mechanism of function manifestation *For more details, please download the PDF or feel free to contact us.
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Our company conducts environmental testing using a constant temperature and humidity chamber with a front glass window and a camera, allowing us to capture and monitor the operational status, such as screen displays. During environmental testing using equipment like constant temperature and humidity chambers, monitoring the condition of the test subjects using loggers for parameters like voltage, current, resistance, and temperature is widely practiced. For samples where monitoring with loggers is difficult, we combine a constant temperature and humidity chamber equipped with a front glass window option, a camera, and monitoring software to conduct environmental tests while capturing and monitoring the condition of the testing equipment. [Example of monitoring an LCD panel] - Interval shooting at regular intervals - Motion detection shooting that captures images when changes in condition are detected - Monitoring of indicator lamps is also possible *For more details, please download the PDF or feel free to contact us.
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We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface between NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is an analytical technique based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. 【Overview】 <Elemental Analysis by EDX> ■ Surface analysis shows the distribution of Ni, Cu, and Sn within the compounds. <Crystallographic Orientation Analysis by EBSD> ■ By combining it with elemental analysis using EDX, it is possible to estimate the composition. ■ In some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. *For more details, please download the PDF or feel free to contact us.
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We would like to introduce the results of our investigation into the behavior of strain during moisture absorption and drying using strain gauges. It was observed that the material expands when absorbing moisture and contracts back to its original state when dried, with the strain returning to the condition prior to moisture absorption. Regarding FR-1, it is presumed that the material did not return to its original state due to changes in its chemical structure caused by hydrolysis. 【Test Overview】 ■ 85℃ 50% ⇒ 85℃ 85% ⇒ 85℃ 50% ■ Test Materials - FR-1 Paper Phenolic (single-sided board) - FR-4 Glass Epoxy (single-sided board) ■ Strain Gauge ■ Foil Strain Gauge for Composite Materials *For more details, please download the PDF or feel free to contact us.
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We would like to introduce our "Microscopic FT-IR Imaging Measurement." It allows for the visualization of the distribution of substances as a two-dimensional image within a specified plane. It becomes possible to evaluate changes in the distribution of substances that are difficult to assess with regular point measurements through visible images. [Analysis Suitable for Imaging Measurement] ■ Evaluation of the diffusion state of substances (assessing the mixing of substances in a mixture, identifying the locations of impurities, etc.) ■ Evaluation of molecular structural changes (assessing the degree of oxidation from the surface to the interior of resin products, etc.) ■ Qualitative analysis of micro foreign substances that are difficult to sample *For more details, please download the PDF or feel free to contact us.
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We offer the "CP Processing Device Arblade5000_Wide Area Cross-Section Milling." The "Arblade5000" enables extensive processing by combining a high milling rate with wide area cross-section milling capabilities. With the wide area cross-section milling holder, the milling width can be expanded up to 10mm, making it effective for electronic components that require wide area milling. 【Features】 ■ Approximately twice the width of processing is possible ■ The previously localized observation range can be significantly expanded ■ Equipped with a cooling temperature adjustment function to control temperature rise due to ion beam irradiation ■ The observable range is approximately 8mm *For more details, please download the PDF or feel free to contact us.
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We would like to introduce our "IOL testing of discrete semiconductors." Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to temperature changes caused by the device's own heat generation during operation. During the power OFF period (cooling), forced cooling is also performed using a fan. 【Adjustment Conditions】 ■ Temperature Rise: 125℃ ■ Heating Time: 5 minutes ■ Cooling Time: 5 minutes ■ Fan Operating Time: 2 minutes *For more details, please download the PDF or feel free to contact us.
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We will introduce the observation of metal structures through chemical treatment. By performing chemical treatment on metal samples, it is possible to clearly observe the metal structure. Observing the structure can confirm the condition of the sample and the history of applied heat and stress, providing clues about the quality of the product and any defects based on the structural shape. In the published catalog, you can find details on the observation of metal structures, such as the macrostructure of aluminum plates and the soldered parts of copper terminals. Additionally, we offer other services such as cross-sectional observation and various analysis services. Please feel free to contact us if you have any requests. [Published Content] - Macrostructure of aluminum plates - Soldered parts of copper terminals - Brass screws - Welded parts of SUS rods *For more details, please download the PDF or feel free to contact us.
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In "Microscopic FT-IR," there are three main measurement methods: "transmission method," "reflection method," and "ATR method." In "Microscopic FT-IR," which combines FT-IR with an optical microscope, it is possible to measure small substances of about tens of micrometers that are difficult to measure with conventional FT-IR, using an aperture (field stop). While the transmission method is the basic measurement method in microscopic FT-IR, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling. 【Characteristics of Measurement Methods】 ■ Transmission Method - Infrared light is irradiated onto the sample, and the transmitted light is measured. - Information is obtained from the thickness of the material that the infrared light has passed through. ■ Reflection Method - Infrared light is irradiated onto the sample, and the reflected light is measured. - Information about the surface of the sample is obtained. *For more details, please download the PDF or feel free to contact us.
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We would like to introduce an example of "observation of semiconductors by mechanical polishing" conducted by our company. While there are advantages and disadvantages, it is possible to create cross-sections with mechanical polishing that are comparable to those made by FIB or CP. Based on years of accumulated know-how, our company will propose the most appropriate processing methods according to the observation purpose, sample composition, and structure. If you have any concerns, please feel free to contact us at the information below. 【Observation Examples】 ■ Semiconductor_Si ■ Compound Semiconductor_GaN ■ Compound Semiconductor_GaP ■ Compound Semiconductor_GaAs *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce the "strain measurement in thermal shock testing" conducted by our company. A sample with a strain gauge attached was set up in the thermal shock testing device, and the wiring of the strain gauge was connected to an external data logger to record strain data in real-time during the test. For two types of copper-clad laminates, the strain behavior during the thermal shock test was observed, and it was noted that significant strain occurred with temperature changes. It was found that FR-1 exhibited greater strain compared to FR-4. [Test Conditions] ■ Temperature Cycle: -30°C to 120°C ■ Exposure Time at Each Temperature: 30 min ■ Test Materials - FR-1 Paper Phenolic (double-sided) - FR-4 Glass Epoxy (double-sided) ■ Strain Gauge: Foil strain gauge for printed circuit boards *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce a case of particle size measurement of cathode active materials using laser diffraction conducted by our company. In air or liquid, laser light is irradiated onto the particles, and the angular dependence of the intensity of the light scattered by the particles is measured. By measuring the angular dependence of the scattered light intensity, the particle size distribution (particle size distribution) is calculated from the data. Using commercially available reagents as samples, measurements were conducted in a dry state without dispersing in a solvent. The particle size measurement results for NMC oxides showed a monodisperse state with particle sizes below several tens of micrometers, and the median diameter was calculated to be 12 micrometers. [Case Overview] ■ Measurement Method ・Dry method ■ Particle Size Measurement Results for NMC Oxides ・Monodisperse state with particle sizes below several tens of micrometers ・Median diameter is 12 micrometers *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce an example of cross-sectional observation of mounted components conducted by our company. Using commercially available computer circuit boards, we observed the solder joints of mounted components and the internal structures of the components with a metal microscope. The observation modes of the metal microscope include bright field observation, dark field observation, and polarized light observation, among others. Additionally, there are observations using transmitted light, and the observation mode is selected according to the sample. By conducting cross-sectional observations before and after reliability testing, we can evaluate the reliability of the product. When observing, it is important to select an appropriate "observation mode" to clearly capture the condition of the solder joint interface and defects such as cracks. [Case Overview] ■ Using commercially available computer circuit boards ■ Observing the solder joints of mounted components and the internal structures of the components with a metal microscope ・Observation modes: bright field observation, dark field observation, polarized light observation, etc. *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce the Poisson's ratio measurement conducted by our company. Poisson's ratio is the ratio of longitudinal strain to lateral strain that occurs when a load is applied to an object, and it is necessary for strength calculations of materials. We can accommodate Poisson's ratio measurements and strength measurements through tensile testing. Please feel free to consult with us. 【Measurement Examples】 ■ Measurements using a tensile testing machine ■ Strain measurement results and Poisson's ratio calculation results *For more details, please refer to the PDF materials or feel free to contact us.
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We would like to introduce our service for "Cross-sectional Observation of Various Mounted Components on Circuit Boards." Inside various electronic devices around us, there are circuit boards equipped with electronic components. When observing a mounted circuit board, it becomes clear that numerous components are densely soldered together, and it is necessary to confirm that the components are properly joined, as improper connections can lead to malfunction. Please contact us if you are considering observations or cross-sectional examinations before and after reliability testing. 【Examples of Observations (Partial)】 ■ Ceramic Capacitors ■ Transistors ■ Chip Resistors ■ QFP ■ Connector Pins *For more details, please refer to the PDF materials or feel free to contact us.
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We would like to introduce our "Chemical Analysis On-Demand Service." When conducting component analysis of foreign substances or stains on products, it is important to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis method is best among organic and inorganic options. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available. 【Features】 ■ Only data for which results have been obtained will be reported ■ Results will be reported for up to 2 methods ■ If you wish to receive results for more than 3 methods, additional costs will be incurred *For more details, please refer to the PDF document or feel free to contact us.
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We thoroughly evaluate and verify FPD from various angles. In structural analysis, we assess FPD products and products incorporating advanced technologies for any potential issues in characteristics and structure, and we provide reports. In defect analysis, we approach and investigate the causes of product defects in increasingly sourced overseas products via the shortest route. Additionally, in reliability testing, we propose suitable reliability testing methods and conditions based on our extensive know-how, tailored to the customer's objectives and needs. 【Our Strengths】 ■ Problem-Solving Ability - Proposal of analytical methods familiar with the LCD manufacturing process ■ Investigative Ability - Skilled insight and advanced, sub-micron level fine sample processing technology ■ Specialized Equipment - Consideration using a combination of diverse analytical instruments *For more details, please refer to the PDF document or feel free to contact us.
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We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) is deposited on its surface for conductivity. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and the connection state, cross-sectional observations were conducted, revealing that the amount of particle deformation was "medium," indicating an appropriate level of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional perspectives, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related issues. [Summary] ■ In implemented ICs, slight "warping" or "tilting" can cause differences in particle deformation between the edges and the center, potentially leading to display defects. ■ By examining the deformation of conductive particles from both the planar and cross-sectional perspectives, we can explore the correlation with display defects. *For more details, please refer to the PDF document or feel free to contact us.
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Since a malfunction was suspected at the switch part of the appliance that would not power on, we will introduce analysis cases along with the work flow. First, we check for any shape changes such as swelling, cracking, or discoloration through visual observation. In the electrical check, we confirm whether the malfunction can be reproduced and whether it is an open or short circuit. Internal observation using X-rays revealed that the contact terminals inside the switch had melted, scattered, and disappeared, resulting in an open failure. Ultimately, we will submit a report that includes an analysis of the cause. We also welcome inquiries regarding analysis consultations after non-destructive testing, so please feel free to reach out. 【Basics of Non-Destructive Observation】 ■1: Visual Confirmation ■2: Electrical Confirmation ■3: Internal Observation with X-rays *For more details, please refer to the PDF document or feel free to contact us.
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Our company analyzes the spectra of UV-curable resins before and after UV irradiation. We irradiate UV-curable resins (acrylic-based) with ultraviolet light and obtain Raman spectra before and after irradiation. Through the analysis of the Raman spectra, the curing reaction can be estimated to some extent. For a more detailed analysis of the curing mode, analyses such as GCMS are necessary, but our company can provide not only structural estimation but also reaction estimation through spectral analysis. 【Features of Raman Spectral Analysis】 ■ The curing reaction can be estimated to some extent. ■ We can accommodate not only structural estimation but also reaction estimation. *For more details, please refer to the PDF document or feel free to contact us.
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This is an example of evaluating the maximum pore diameter and pore size distribution of non-woven fabric sheets using the bubble point method. The sample is immersed in a chemical solution, and air pressure is applied. The pressure is increased until it overcomes the surface tension of the chemical solution absorbed in the sheet, at which point the appearance of bubbles occurs; this pressure is referred to as the bubble point. The maximum pore diameter can be calculated based on the bubble point pressure and the surface tension of the chemical solution. 【Calculation Formula】 ■d = Cy/P ・d: maximum pore diameter ・C: constant ・y: surface tension of the chemical solution ・P: differential pressure *For more details, please refer to the PDF document or feel free to contact us.
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"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. [Features] ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Best detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.
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The "tensile test" measures the load and displacement (elongation) of a material when it is pulled at a constant speed, in order to determine the material's physical and mechanical properties. By pulling the test specimen in a temperature-controlled chamber, it is possible to assess and understand the temperature dependence of these properties. Our company is capable of conducting material property tests under temperature conditions. We can also propose conditions tailored to the materials and properties you wish to measure. Please feel free to consult with us. 【Test Machine Specifications】 ■ Temperature range of the temperature-controlled chamber: -40 to 250℃ ■ Load cell: 50kN, 1kN ■ Load accuracy: ±1% of the load indication value ■ Test speed: 0.0005 to 1000 mm/min ■ Travel distance ・Tensile test section: 1485 mm *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces a pretreatment method to enable the analysis of substances that are difficult to analyze using GC/MS. The pretreatment that converts difficult-to-analyze substances into analyzable substances is called "derivatization." Methods such as esterification, acylation, and silylation are used selectively based on the type and characteristics of the difficult-to-analyze substances. GC/MS measurements were conducted on citric acid solutions and citric acid solutions after esterification. It was found that citric acid, being a carboxylic acid, could not be effectively detected without derivatization, but after esterification, trimethyl citrate was detected, proving the presence of citric acid. By performing appropriate derivatization, more accurate analysis becomes possible. [Analyzable substances] ■ High volatility ■ High thermal stability ■ Low polarity *For more details, please refer to the PDF document or feel free to contact us.
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We present a case study of a series of analyses conducted to identify failure points and perform cross-sectional observations on an oxide-based all-solid-state battery that was destroyed during reliability testing. Thermal analysis revealed a tendency for strong heat generation on the side, and X-ray transmission observations showed white linear contrast anomalies near the boundary where heat generation was observed in the X-ray transmission image. It is suspected that some abnormalities may have occurred in the white line area. When CP cross-sectional SEM observations were conducted on the areas where anomalies were visible, layer delamination was observed. It is inferred that delamination occurred between the current collector and electrolyte layers due to the expansion and contraction of the positive (negative) electrode layers during reliability testing. 【Case Overview】 ■ Sample Information: Oxide-based all-solid-state battery that experienced degradation due to charge and discharge testing ■ Thermal Analysis Results: A tendency for strong heat generation on the side was observed ■ Other Analysis Contents: - X-ray transmission observation - CP cross-sectional observation and elemental analysis via SEM *For more details, please refer to the PDF document or feel free to contact us.
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We will introduce the analysis of the components of mica sheet adhesive using GC/MS. To investigate what components are contained in the mica sheet, spectroscopic measurements were conducted, suggesting the use of silicone-based adhesives. To examine the composition of the silicone-based adhesive used, GC/MS measurements were performed. It was found that pentacyclooctasiloxane is used, and it was also discovered that plasticizers such as dibutyl phthalate and chain-saturated hydrocarbons like tridecane are added as lubricants. [Mica Sheet Components] ■ Pentacyclooctasiloxane (cage-like polymethylsilsesquioxane) ■ Dibutyl phthalate ■ Chain-saturated hydrocarbons such as tridecane *For more details, please refer to the PDF document or feel free to contact us.
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This document introduces the characteristics of each spectroscopy method and the spectra obtained when comparing infrared spectroscopy and Raman spectroscopy. Both infrared spectroscopy and Raman spectroscopy are vibrational spectroscopies that investigate the vibrational energy of molecules, but the shapes of the spectra obtained from each method differ even when measuring the same substance. Infrared spectroscopy and Raman spectroscopy are complementary, and by conducting both analyses, information that cannot be obtained from either method alone can be acquired in a more detailed and accurate manner. For more details, please refer to the catalog provided. 【Characteristics of Infrared Spectroscopy】 ■ Infrared absorption occurs when the dipole moment changes with vibration (infrared active). ■ Vibrations that cause a distortion in electron distribution (breaking molecular symmetry) have high infrared activity. * For more information, please refer to the PDF document or feel free to contact us.
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We will introduce an example of analyzing the purity of diphosphorus pentasulfide using ion chromatography for the composition analysis of raw materials for all-solid-state batteries. Diphosphorus pentasulfide is one of the raw materials used in the production of electrolytes for sulfide-based all-solid-state batteries. As a pretreatment for IC measurement, the powder of diphosphorus pentasulfide was dissolved in alkaline water and converted into phosphate and sulfide salts. Subsequently, the sulfide ions were oxidized to sulfate ions to prepare the IC measurement solution. For more details, please refer to the published catalog. 【Solid Electrolytes (Partial)】 ■Li3PS4 ■Li7P3S11 ■Li6PS5Cl ■Li6PS5Br *For more information, please refer to the PDF document or feel free to contact us.
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We would like to introduce the analysis of good quality liquid crystal displays by Aites Co., Ltd. First, as part of the visual inspection, we conduct optical microscope observations focusing on the FPC, FOG, COG, and sealing materials in the cell panel state. Next, we dismantle the cell panel to check the sealing materials, PI film, and TFT shape. If any defects are found during the good quality analysis, we will propose additional analyses such as cross-sectional observation of the wiring and foreign matter analysis to investigate the cause. Please feel free to consult us when needed. [Contents of Visual Inspection] ■ Are there any corrosion or foreign matter on the FPC wiring? ■ Is there any issue with the FOG bonding? ■ Is there any issue with the COG bonding? ■ Are there any breaks or defects in the sealing materials? *For more details, please refer to the PDF document or feel free to contact us.
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We will introduce a comparison between Raman spectroscopy analysis by Aites Co., Ltd. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to use both according to the analysis target. 【Features】 ■ Measurement in the order of a few micrometers, which is difficult with IR analysis, is possible. ■ No sampling is required. *For more details, please refer to the PDF document or feel free to contact us.
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We would like to introduce the dynamic viscoelastic measurement of polyurethane rubber conducted by Aites Co., Ltd. DMA is an analysis that applies periodic oscillating loads to polymer materials and measures elasticity and viscosity as a function of temperature from the resulting stress and phase difference. In this case, measurements were conducted using cylindrical rubber samples in compression mode. The measurement results indicate a glass transition temperature of -15.7°C, as shown by the temperature dispersion curve of Tan δ, and a master curve was created using the time-temperature superposition principle. Please feel free to contact us for any inquiries. 【Methods of Applying Load】 ■ Tension ■ Compression ■ Bending of a double cantilever beam ■ Free-supported three-point bending ■ Shear (sliding) *For more details, please refer to the PDF document or feel free to contact us.
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A commitment to environmental consideration and waste-free development and manufacturing is required in the field of technology, and there is a need for global contributions to technology from a planetary perspective. This document presents case studies on the identification of substances in discarded and floating microplastics, as well as a comparative analysis of the degradation levels of recycled materials, assisting in the determination of their usability. We encourage you to read it. [Contents] ■ Case studies on the identification analysis of microplastic substances ■ Comparative case studies of molecular weight distribution between unused polypropylene materials and recycled products (pellets) ■ Comparative analysis case studies of polyethylene terephthalate (PET) materials using microscopic IR analysis *For more details, please download the PDF or feel free to contact us.
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We would like to introduce our "Continuous Power Supply Test for Multilayer Ceramic Capacitors." Assuming the failure mode is a short circuit, we can conduct a continuous power supply test under high temperature and high humidity conditions while continuously measuring changes in leakage current. We believe this is an effective method for comparing the performance of multiple products by manufacturer, lot, etc. Additionally, we can assist with the design and production of the test boards. 【Features】 ■ Design and implementation of device mounting boards as needed ■ Compatible with sizes such as 0603 and 1005 ■ The monitoring device connects to the sample via a resistance board to calculate leakage current values ■ After the test, it is also possible to perform capacitance measurements to check the degree of capacitance degradation *For more details, please refer to the PDF document or feel free to contact us.
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The "Pressure Repeated Test" involves supplying compressed air at a specified pressure to products that require airtightness, checking for any leaks. It is also possible to conduct a durability test that alternates between pressurized and released states, and this can be performed in a heated state in combination with an environmental testing chamber. Additionally, the timing of any leaks can be confirmed from the pressure data logs. 【Device Specifications】 ■ Pressurization Pressure: Max 0.7 MPa (gauge pressure) ■ Maximum Number of Cycles: Max 32,000 cycles ■ Pressure Holding Time: Max 3,000 seconds ■ Monitor: Recording of the pressure sensor values (gauge pressure) during testing ■ Connection with Test Samples: Air tube (connection method can be adapted to the test sample) *For more details, please refer to the PDF document or feel free to contact us.
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When heat is applied to materials, various properties change. Thermal analysis is suitable for investigating such properties. Depending on the changes in the properties we want to observe, we use different devices and combine them as necessary. By understanding the various changes that occur when materials are subjected to heat, we can gain insights into how they will behave in practical applications. When combined with other chemical analyses, it is also possible to estimate relationships with molecular-level structures. If you have any questions about the relationship between materials and heat, please feel free to consult us. 【Analysis Equipment (Excerpt)】 <DSC (Differential Scanning Calorimeter)> ■ Changes observed: Heat flow (exothermic and endothermic) ■ Properties that can be determined: Melting point (freezing point), glass transition, crystallization, specific heat capacity ■ Applicable materials: Plastics, rubber, metals ■ Analysis examples: Measurement of the curing degree of thermosetting resins, measurement of the transformation temperature of shape memory alloys *For more details, please refer to the PDF document or feel free to contact us.
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Our company conducts evaluations of brightness and color uniformity for emitting surfaces such as OLEDs, titled "Evaluation of Brightness and Color Uniformity of LCD Displays." In brightness measurement (using a two-dimensional luminance meter to measure the display surface), we compare the digital camera images of the LCD display surface with the results obtained from the luminance measurements taken with the two-dimensional luminance meter. While the distribution of uniformity is difficult to discern in the digital camera images, the color scale display of the luminance distribution highlights areas with luminance variation, making it easier to understand. 【Overview of Measurement Equipment】 ■ Measurement Items: Tristimulus Values (X, Y, Z), Chromaticity (x, y) ■ Measurement Range: 0.01 cd/m² to 1,000,000 cd/m² ■ Effective Pixel Count: 1376 × 1024 ■ Emitting Surface Size: Approximately 15 to 115 inches ■ Installation Method/Fixtures: Vertical, horizontal, etc., adaptable to shape *For more details, please refer to the PDF document or feel free to contact us.
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The "Xenon Weather Meter" is an accelerated weathering test device that uses a xenon arc lamp as its light source. By combining exposure conditions such as irradiation, temperature and humidity, and rainfall, it artificially reproduces outdoor and indoor environments, allowing for the evaluation of weather resistance and light resistance of test specimens in a shorter time than natural exposure tests. The xenon lamp used as the light source has a spectral distribution that closely approximates the ultraviolet and visible parts of sunlight, with precise control of appropriate filters and irradiance. This enables tests with good correlation and reproducibility to outdoor exposure. This test is conducted as a service by our partner companies. 【Features】 - The combination of filters used can reproduce outdoor direct sunlight and indoor sunlight through window glass. - The high-energy test device irradiates at about three times the intensity of sunlight, allowing for a quicker evaluation of light resistance. - It is adopted as a test in various fields such as automobiles, paints, construction, plastics, printed materials, and textiles. *For more details, please refer to the PDF materials or feel free to contact us.*
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The method of processing observation samples can result in different information being obtained. You may have observed the solder joints in two dimensions from a cross-section, but have you ever wondered how the compounds grow in three dimensions? In this document, we present examples of observing the joint between the Cu pad and the solder. We include both "cross-sectional observation" and "planar observation." [Contents] ■ Cross-sectional Observation - Before etching treatment - After etching treatment ■ Planar Observation *For more details, please refer to the PDF document or feel free to contact us.
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Due to the risk of depletion of natural ingredients, artificially synthesized alternative components may be used, and their identification is suitable through separation and analysis methods such as GCMS. This time, we focused on sandalwood (Byakudan), which is used as a raw material for incense. We tested whether the components of sandalwood could be detected in two types of incense (A and B) with sandalwood scent. In incense A, santanol was detected, whereas in incense B, santanol was not detected, and another aromatic component was found. Among these, bugdanol is a type of synthetic fragrance, and due to its structural characteristics, it is believed to have a sandalwood-like scent. [Components of Incense A] ■ Bugdanol: Trace amount ■ Cedrol: None ■ α-Santalol: Present ■ β-Santalol: Present *For more details, please refer to the PDF document or feel free to contact us.
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Shape memory alloys are alloys that return to their original shape when heated above a specific temperature, even after being deformed. The manifestation of shape memory properties is due to phase transformation (martensitic transformation). By capturing the thermal energy changes during the transformation using DSC, we measured the transformation temperatures of three types of shape memory alloy products and investigated their relationship with composition through elemental analysis. When deformed wire is immersed in hot water, it instantly returns to its original shape. 【Transformation Temperature Measurement by DSC】 ■ Investigation of transformation temperatures of three types of shape memory alloys using DSC - It was found that the transformation temperatures are in the order of A > B > C. - Shape memory alloy C is considered to be in a superelastic state at room temperature. - Af: A 45.91, B 41.20, C 11.83 - Ms: A 43.75, B 36.25, C -15.59 *For more details, please refer to the PDF document or feel free to contact us.
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Condensation caused by rapid changes in temperature and humidity can lead to product corrosion, leaks due to ion migration, and malfunctions. The "Condensation Cycle Test" involves temperature changes and humidification, forcing condensation to occur repeatedly to evaluate resistance to condensation. We can also observe the time-dependent changes before and after the condensation test, so please feel free to contact us if you need assistance. 【Test Chamber Specifications】 ■ Model: TSA-203D (ESPEC) ■ Internal Dimensions: W650×H460×D670 ■ Temperature Range ・High-Temperature Exposure: -10℃ to +100℃ ・Low-Temperature Exposure: -40℃ to +10℃ ■ Humidity Range: 40 to 95% RH (High-Temperature Exposure) ■ Power supply during testing is also possible *For more details, please refer to the PDF document or feel free to contact us.
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Our company can measure the optical properties of LCD displays and OLEDs using a spectroradiometer. By conducting measurements before and after testing, we can quantitatively evaluate changes in optical properties. Spectral radiance is measured in four patterns: white, red, green, and blue. It is possible to measure various optical properties such as luminance, chromaticity, and dominant wavelength. 【Measurement Device Overview】 ■ Measurement Items: Spectral radiation, luminance, chromaticity ■ Measurement Range: 0.0005 cd/m² to 5,000,000 cd/m² ■ Wavelength Measurement Range: 380 nm to 780 nm ■ Wavelength Resolution: 1 nm (Effective wavelength width [half-width]: 5 nm) ■ Installation Method/Fixture: Vertical, horizontal, etc., depending on the shape *For more details, please refer to the PDF document or feel free to contact us.
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Our company conducts a "Solder Heat Resistance Test (SMD)" to evaluate the heat resistance of surface mount device (SMD) soldering processes. We replicate moisture absorption prior to mounting through humidification treatment and assess the presence of delamination or cracks through heating treatment that corresponds to thermal stress during soldering. As part of the post-test inspection, we perform the same inspections as the initial measurements, and if necessary, we also conduct analyses such as cross-sectional observation of defective areas. 【Flow of Solder Heat Resistance Test】 ■ Initial Measurement ■ Temperature Cycle (Shipping Condition) ■ Drying Treatment (Baking) ■ Humidification Treatment (Soaking) ■ Heating Treatment (Reflow) ■ Final Measurement *For more details, please refer to the PDF document or feel free to contact us.
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Our company conducts "failure analysis of overseas manufactured displays." We can perform detailed analyses, from confirming phenomena to hypothesizing the failure mechanisms and narrowing down the production processes that caused the issues. We carry out lighting observations, panel disassembly, and optical microscope observations tailored to the failure symptoms. If it is necessary to narrow down the defective areas and conduct detailed analysis, we will propose appropriate methods. 【Examples of detailed analysis (partial)】 ■ Cross-sectional observation of wiring ■ Foreign matter analysis ■ Liquid crystal component analysis ■ Electrical characteristic measurement *Additional costs will be incurred. *For more details, please refer to the PDF document or feel free to contact us.
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