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アイテス

EstablishmentJanuary 1, 1993
capital10000Ten thousand
number of employees92
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
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last updated:Oct 19, 2022
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Dynamic SIMS

Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. [Features] ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Best detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.

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Tensile test

Testing service for plastic films using a universal testing machine (autograph) in a heated environment!

The "tensile test" measures the load and displacement (elongation) of a material when it is pulled at a constant speed, in order to determine the material's physical and mechanical properties. By pulling the test specimen in a temperature-controlled chamber, it is possible to assess and understand the temperature dependence of these properties. Our company is capable of conducting material property tests under temperature conditions. We can also propose conditions tailored to the materials and properties you wish to measure. Please feel free to consult with us. 【Test Machine Specifications】 ■ Temperature range of the temperature-controlled chamber: -40 to 250℃ ■ Load cell: 50kN, 1kN ■ Load accuracy: ±1% of the load indication value ■ Test speed: 0.0005 to 1000 mm/min ■ Travel distance ・Tensile test section: 1485 mm *For more details, please refer to the PDF document or feel free to contact us.

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Derivatization for GC/MS analysis

Proposal tailored to the purpose of analysis and the target object! GC/MS analysis of derivatized samples.

This document introduces a pretreatment method to enable the analysis of substances that are difficult to analyze using GC/MS. The pretreatment that converts difficult-to-analyze substances into analyzable substances is called "derivatization." Methods such as esterification, acylation, and silylation are used selectively based on the type and characteristics of the difficult-to-analyze substances. GC/MS measurements were conducted on citric acid solutions and citric acid solutions after esterification. It was found that citric acid, being a carboxylic acid, could not be effectively detected without derivatization, but after esterification, trimethyl citrate was detected, proving the presence of citric acid. By performing appropriate derivatization, more accurate analysis becomes possible. [Analyzable substances] ■ High volatility ■ High thermal stability ■ Low polarity *For more details, please refer to the PDF document or feel free to contact us.

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Case study of failure analysis of oxide-based all-solid-state batteries.

It has high safety and can be used in various environments! Consistent analysis is possible.

We present a case study of a series of analyses conducted to identify failure points and perform cross-sectional observations on an oxide-based all-solid-state battery that was destroyed during reliability testing. Thermal analysis revealed a tendency for strong heat generation on the side, and X-ray transmission observations showed white linear contrast anomalies near the boundary where heat generation was observed in the X-ray transmission image. It is suspected that some abnormalities may have occurred in the white line area. When CP cross-sectional SEM observations were conducted on the areas where anomalies were visible, layer delamination was observed. It is inferred that delamination occurred between the current collector and electrolyte layers due to the expansion and contraction of the positive (negative) electrode layers during reliability testing. 【Case Overview】 ■ Sample Information: Oxide-based all-solid-state battery that experienced degradation due to charge and discharge testing ■ Thermal Analysis Results: A tendency for strong heat generation on the side was observed ■ Other Analysis Contents: - X-ray transmission observation - CP cross-sectional observation and elemental analysis via SEM *For more details, please refer to the PDF document or feel free to contact us.

  • Batteries and Capacitors

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Analysis of mica sheet adhesive components using GC/MS.

It is possible to investigate components that cannot be identified by spectroscopy alone, as well as trace additives that cannot be detected!

We will introduce the analysis of the components of mica sheet adhesive using GC/MS. To investigate what components are contained in the mica sheet, spectroscopic measurements were conducted, suggesting the use of silicone-based adhesives. To examine the composition of the silicone-based adhesive used, GC/MS measurements were performed. It was found that pentacyclooctasiloxane is used, and it was also discovered that plasticizers such as dibutyl phthalate and chain-saturated hydrocarbons like tridecane are added as lubricants. [Mica Sheet Components] ■ Pentacyclooctasiloxane (cage-like polymethylsilsesquioxane) ■ Dibutyl phthalate ■ Chain-saturated hydrocarbons such as tridecane *For more details, please refer to the PDF document or feel free to contact us.

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Comparison of Infrared Spectroscopy and Raman Spectroscopy

By conducting two analyses, it is possible to obtain more detailed and accurate results!

This document introduces the characteristics of each spectroscopy method and the spectra obtained when comparing infrared spectroscopy and Raman spectroscopy. Both infrared spectroscopy and Raman spectroscopy are vibrational spectroscopies that investigate the vibrational energy of molecules, but the shapes of the spectra obtained from each method differ even when measuring the same substance. Infrared spectroscopy and Raman spectroscopy are complementary, and by conducting both analyses, information that cannot be obtained from either method alone can be acquired in a more detailed and accurate manner. For more details, please refer to the catalog provided. 【Characteristics of Infrared Spectroscopy】 ■ Infrared absorption occurs when the dipole moment changes with vibration (infrared active). ■ Vibrations that cause a distortion in electron distribution (breaking molecular symmetry) have high infrared activity. * For more information, please refer to the PDF document or feel free to contact us.

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Composition analysis of raw materials for all-solid-state batteries.

The purity of the electrolyte greatly affects the performance of the battery! It suppresses the volatility of sulfur components and converts them into a form that can be detected by IC.

We will introduce an example of analyzing the purity of diphosphorus pentasulfide using ion chromatography for the composition analysis of raw materials for all-solid-state batteries. Diphosphorus pentasulfide is one of the raw materials used in the production of electrolytes for sulfide-based all-solid-state batteries. As a pretreatment for IC measurement, the powder of diphosphorus pentasulfide was dissolved in alkaline water and converted into phosphate and sulfide salts. Subsequently, the sulfide ions were oxidized to sulfate ions to prepare the IC measurement solution. For more details, please refer to the published catalog. 【Solid Electrolytes (Partial)】 ■Li3PS4 ■Li7P3S11 ■Li6PS5Cl ■Li6PS5Br *For more information, please refer to the PDF document or feel free to contact us.

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Analysis of quality products of overseas manufactured LCD displays.

If any issues arise, detailed analysis will be provided! A simplified analysis for customers considering the introduction of overseas LCDs.

We would like to introduce the analysis of good quality liquid crystal displays by Aites Co., Ltd. First, as part of the visual inspection, we conduct optical microscope observations focusing on the FPC, FOG, COG, and sealing materials in the cell panel state. Next, we dismantle the cell panel to check the sealing materials, PI film, and TFT shape. If any defects are found during the good quality analysis, we will propose additional analyses such as cross-sectional observation of the wiring and foreign matter analysis to investigate the cause. Please feel free to consult us when needed. [Contents of Visual Inspection] ■ Are there any corrosion or foreign matter on the FPC wiring? ■ Is there any issue with the FOG bonding? ■ Is there any issue with the COG bonding? ■ Are there any breaks or defects in the sealing materials? *For more details, please refer to the PDF document or feel free to contact us.

  • Structural Survey

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Analysis of foreign substances and component analysis: Comparison of micro-Raman and FTIR.

Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis.

We will introduce a comparison between Raman spectroscopy analysis by Aites Co., Ltd. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to use both according to the analysis target. 【Features】 ■ Measurement in the order of a few micrometers, which is difficult with IR analysis, is possible. ■ No sampling is required. *For more details, please refer to the PDF document or feel free to contact us.

  • Measurement and Analysis Equipment

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Dynamic viscoelasticity measurement of polyurethane rubber

It is also possible to create master curves in tensile, shear, and bending modes other than compression mode!

We would like to introduce the dynamic viscoelastic measurement of polyurethane rubber conducted by Aites Co., Ltd. DMA is an analysis that applies periodic oscillating loads to polymer materials and measures elasticity and viscosity as a function of temperature from the resulting stress and phase difference. In this case, measurements were conducted using cylindrical rubber samples in compression mode. The measurement results indicate a glass transition temperature of -15.7°C, as shown by the temperature dispersion curve of Tan δ, and a master curve was created using the time-temperature superposition principle. Please feel free to contact us for any inquiries. 【Methods of Applying Load】 ■ Tension ■ Compression ■ Bending of a double cantilever beam ■ Free-supported three-point bending ■ Shear (sliding) *For more details, please refer to the PDF document or feel free to contact us.

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Contribution to the SDGs: Comparison and Analysis of Materials/Recycled Raw Materials

We assist in manufacturing and research and development with a focus on SDGs by conducting comparative analysis and evaluation of recycled materials and raw materials using multiple methods.

A commitment to environmental consideration and waste-free development and manufacturing is required in the field of technology, and there is a need for global contributions to technology from a planetary perspective. This document presents case studies on the identification of substances in discarded and floating microplastics, as well as a comparative analysis of the degradation levels of recycled materials, assisting in the determination of their usability. We encourage you to read it. [Contents] ■ Case studies on the identification analysis of microplastic substances ■ Comparative case studies of molecular weight distribution between unused polypropylene materials and recycled products (pellets) ■ Comparative analysis case studies of polyethylene terephthalate (PET) materials using microscopic IR analysis *For more details, please download the PDF or feel free to contact us.

  • Environmental Survey
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Continuous current test of multilayer ceramic capacitors

Support from the design and production of test boards! An effective method to compare the capabilities of multiple products.

We would like to introduce our "Continuous Power Supply Test for Multilayer Ceramic Capacitors." Assuming the failure mode is a short circuit, we can conduct a continuous power supply test under high temperature and high humidity conditions while continuously measuring changes in leakage current. We believe this is an effective method for comparing the performance of multiple products by manufacturer, lot, etc. Additionally, we can assist with the design and production of the test boards. 【Features】 ■ Design and implementation of device mounting boards as needed ■ Compatible with sizes such as 0603 and 1005 ■ The monitoring device connects to the sample via a resistance board to calculate leakage current values ■ After the test, it is also possible to perform capacitance measurements to check the degree of capacitance degradation *For more details, please refer to the PDF document or feel free to contact us.

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Pressure Repetitive Test

Send compressed air at the specified pressure and maintain it for a set time! Check for any leaks.

The "Pressure Repeated Test" involves supplying compressed air at a specified pressure to products that require airtightness, checking for any leaks. It is also possible to conduct a durability test that alternates between pressurized and released states, and this can be performed in a heated state in combination with an environmental testing chamber. Additionally, the timing of any leaks can be confirmed from the pressure data logs. 【Device Specifications】 ■ Pressurization Pressure: Max 0.7 MPa (gauge pressure) ■ Maximum Number of Cycles: Max 32,000 cycles ■ Pressure Holding Time: Max 3,000 seconds ■ Monitor: Recording of the pressure sensor values (gauge pressure) during testing ■ Connection with Test Samples: Air tube (connection method can be adapted to the test sample) *For more details, please refer to the PDF document or feel free to contact us.

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The Relationship Between Materials and Heat: An Introduction to Thermal Analysis

It is also possible to estimate the relationship with molecular-level structures! Introducing the types of thermal analysis and the characteristics that can be understood.

When heat is applied to materials, various properties change. Thermal analysis is suitable for investigating such properties. Depending on the changes in the properties we want to observe, we use different devices and combine them as necessary. By understanding the various changes that occur when materials are subjected to heat, we can gain insights into how they will behave in practical applications. When combined with other chemical analyses, it is also possible to estimate relationships with molecular-level structures. If you have any questions about the relationship between materials and heat, please feel free to consult us. 【Analysis Equipment (Excerpt)】 <DSC (Differential Scanning Calorimeter)> ■ Changes observed: Heat flow (exothermic and endothermic) ■ Properties that can be determined: Melting point (freezing point), glass transition, crystallization, specific heat capacity ■ Applicable materials: Plastics, rubber, metals ■ Analysis examples: Measurement of the curing degree of thermosetting resins, measurement of the transformation temperature of shape memory alloys *For more details, please refer to the PDF document or feel free to contact us.

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Evaluation of brightness and color uniformity of LCD displays

By using a two-dimensional color brightness meter for measurement, it is possible to evaluate unevenness and other factors!

Our company conducts evaluations of brightness and color uniformity for emitting surfaces such as OLEDs, titled "Evaluation of Brightness and Color Uniformity of LCD Displays." In brightness measurement (using a two-dimensional luminance meter to measure the display surface), we compare the digital camera images of the LCD display surface with the results obtained from the luminance measurements taken with the two-dimensional luminance meter. While the distribution of uniformity is difficult to discern in the digital camera images, the color scale display of the luminance distribution highlights areas with luminance variation, making it easier to understand. 【Overview of Measurement Equipment】 ■ Measurement Items: Tristimulus Values (X, Y, Z), Chromaticity (x, y) ■ Measurement Range: 0.01 cd/m² to 1,000,000 cd/m² ■ Effective Pixel Count: 1376 × 1024 ■ Emitting Surface Size: Approximately 15 to 115 inches ■ Installation Method/Fixtures: Vertical, horizontal, etc., adaptable to shape *For more details, please refer to the PDF document or feel free to contact us.

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Accelerated Weathering Test <Xenon Weather Meter>

Automobiles, paints, construction, plastics, printed materials, textiles, etc.! They are adopted as tests in various fields.

The "Xenon Weather Meter" is an accelerated weathering test device that uses a xenon arc lamp as its light source. By combining exposure conditions such as irradiation, temperature and humidity, and rainfall, it artificially reproduces outdoor and indoor environments, allowing for the evaluation of weather resistance and light resistance of test specimens in a shorter time than natural exposure tests. The xenon lamp used as the light source has a spectral distribution that closely approximates the ultraviolet and visible parts of sunlight, with precise control of appropriate filters and irradiance. This enables tests with good correlation and reproducibility to outdoor exposure. This test is conducted as a service by our partner companies. 【Features】 - The combination of filters used can reproduce outdoor direct sunlight and indoor sunlight through window glass. - The high-energy test device irradiates at about three times the intensity of sunlight, allowing for a quicker evaluation of light resistance. - It is adopted as a test in various fields such as automobiles, paints, construction, plastics, printed materials, and textiles. *For more details, please refer to the PDF materials or feel free to contact us.*

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Examples of observing intermetallic compounds through etching treatment.

Observe the state of the compound from the rear direction and the surface! We will consider and propose processing, pretreatment, observation methods, and combinations.

The method of processing observation samples can result in different information being obtained. You may have observed the solder joints in two dimensions from a cross-section, but have you ever wondered how the compounds grow in three dimensions? In this document, we present examples of observing the joint between the Cu pad and the solder. We include both "cross-sectional observation" and "planar observation." [Contents] ■ Cross-sectional Observation - Before etching treatment - After etching treatment ■ Planar Observation *For more details, please refer to the PDF document or feel free to contact us.

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Identification of natural components by GCMS

Focusing on sandalwood (byakudan), which is used as a raw material for incense! Here is an example of component analysis using GC-MS.

Due to the risk of depletion of natural ingredients, artificially synthesized alternative components may be used, and their identification is suitable through separation and analysis methods such as GCMS. This time, we focused on sandalwood (Byakudan), which is used as a raw material for incense. We tested whether the components of sandalwood could be detected in two types of incense (A and B) with sandalwood scent. In incense A, santanol was detected, whereas in incense B, santanol was not detected, and another aromatic component was found. Among these, bugdanol is a type of synthetic fragrance, and due to its structural characteristics, it is believed to have a sandalwood-like scent. [Components of Incense A] ■ Bugdanol: Trace amount ■ Cedrol: None ■ α-Santalol: Present ■ β-Santalol: Present *For more details, please refer to the PDF document or feel free to contact us.

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Measurement of the transformation temperature of shape memory alloys

When a substance undergoes a phase change due to a temperature change, a change in thermal energy occurs.

Shape memory alloys are alloys that return to their original shape when heated above a specific temperature, even after being deformed. The manifestation of shape memory properties is due to phase transformation (martensitic transformation). By capturing the thermal energy changes during the transformation using DSC, we measured the transformation temperatures of three types of shape memory alloy products and investigated their relationship with composition through elemental analysis. When deformed wire is immersed in hot water, it instantly returns to its original shape. 【Transformation Temperature Measurement by DSC】 ■ Investigation of transformation temperatures of three types of shape memory alloys using DSC - It was found that the transformation temperatures are in the order of A > B > C. - Shape memory alloy C is considered to be in a superelastic state at room temperature. - Af: A 45.91, B 41.20, C 11.83 - Ms: A 43.75, B 36.25, C -15.59 *For more details, please refer to the PDF document or feel free to contact us.

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Condensation cycle test

Implemented by a partner company! Forcing condensation to occur on test samples to reproduce the condensation state.

Condensation caused by rapid changes in temperature and humidity can lead to product corrosion, leaks due to ion migration, and malfunctions. The "Condensation Cycle Test" involves temperature changes and humidification, forcing condensation to occur repeatedly to evaluate resistance to condensation. We can also observe the time-dependent changes before and after the condensation test, so please feel free to contact us if you need assistance. 【Test Chamber Specifications】 ■ Model: TSA-203D (ESPEC) ■ Internal Dimensions: W650×H460×D670 ■ Temperature Range ・High-Temperature Exposure: -10℃ to +100℃ ・Low-Temperature Exposure: -40℃ to +10℃ ■ Humidity Range: 40 to 95% RH (High-Temperature Exposure) ■ Power supply during testing is also possible *For more details, please refer to the PDF document or feel free to contact us.

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Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

Measurable contrast ratio and color temperature! Quantitative evaluation of changes in optical properties.

Our company can measure the optical properties of LCD displays and OLEDs using a spectroradiometer. By conducting measurements before and after testing, we can quantitatively evaluate changes in optical properties. Spectral radiance is measured in four patterns: white, red, green, and blue. It is possible to measure various optical properties such as luminance, chromaticity, and dominant wavelength. 【Measurement Device Overview】 ■ Measurement Items: Spectral radiation, luminance, chromaticity ■ Measurement Range: 0.0005 cd/m² to 5,000,000 cd/m² ■ Wavelength Measurement Range: 380 nm to 780 nm ■ Wavelength Resolution: 1 nm (Effective wavelength width [half-width]: 5 nm) ■ Installation Method/Fixture: Vertical, horizontal, etc., depending on the shape *For more details, please refer to the PDF document or feel free to contact us.

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Solder Heat Resistance Test (SMD)

Reproducing temperature stress during transportation! Evaluating the presence or absence of delamination and cracks through heat treatment.

Our company conducts a "Solder Heat Resistance Test (SMD)" to evaluate the heat resistance of surface mount device (SMD) soldering processes. We replicate moisture absorption prior to mounting through humidification treatment and assess the presence of delamination or cracks through heating treatment that corresponds to thermal stress during soldering. As part of the post-test inspection, we perform the same inspections as the initial measurements, and if necessary, we also conduct analyses such as cross-sectional observation of defective areas. 【Flow of Solder Heat Resistance Test】 ■ Initial Measurement ■ Temperature Cycle (Shipping Condition) ■ Drying Treatment (Baking) ■ Humidification Treatment (Soaking) ■ Heating Treatment (Reflow) ■ Final Measurement *For more details, please refer to the PDF document or feel free to contact us.

  • Heat and Drying Treatment Systems
  • Measurement and Inspection

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Analysis of defects in overseas manufactured displays

Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to inferring the mechanisms of defect occurrence.

Our company conducts "failure analysis of overseas manufactured displays." We can perform detailed analyses, from confirming phenomena to hypothesizing the failure mechanisms and narrowing down the production processes that caused the issues. We carry out lighting observations, panel disassembly, and optical microscope observations tailored to the failure symptoms. If it is necessary to narrow down the defective areas and conduct detailed analysis, we will propose appropriate methods. 【Examples of detailed analysis (partial)】 ■ Cross-sectional observation of wiring ■ Foreign matter analysis ■ Liquid crystal component analysis ■ Electrical characteristic measurement *Additional costs will be incurred. *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of trace metal elements in liquid crystals

Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, and quantification was performed. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. It is known that ionic substances can increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES/MS is used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of film property changes due to UV irradiation

Investigating how the light transmittance of blue light cut film changes using a spectrophotometer!

The blue light cut film has the effect of suppressing the transmission of visible light, especially light with wavelengths below 500nm, compared to regular PET film. Using a spectrophotometer, we examined how the light transmission properties of the blue light cut film change under UV irradiation. The transmission of light in the wavelength range of 350 to 400nm further decreased due to UV irradiation. Additionally, we conducted an analysis of the reactions occurring within the film using GC-MS. [Analysis Content] - Light transmission characteristics of regular PET film and blue light cut film - UV irradiation on blue light cut film - GC-MS analysis of components within the film *For more details, please refer to the PDF document or feel free to contact us.

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Reverse bias test of power devices (up to 2000V)

It is possible to set the failure criteria (current value)! Evaluate device degradation and characteristics through high temperature and high voltage power supply.

At Aites Co., Ltd., high-temperature reverse bias testing (HTRB) for evaluating the oxide film and junction of power devices can be applied up to 2000V. By monitoring the leakage current during the test, the degradation status of the device can be grasped in real-time. Since the power supply is independent, even if one device fails during the test, it does not affect the other devices. Additionally, it is possible to set a failure criterion (current value) and to cut off the power supply to the device deemed faulty at the time of failure judgment. 【Features】 ■ Real-time monitoring of the leakage current during the test allows for understanding the degradation status of the device. ■ The independent power supply ensures that the failure of one device during the test does not affect other devices. ■ The power supply to the device deemed faulty can be cut off at the time of failure judgment. *For more details, please refer to the PDF document or feel free to contact us.

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Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove wiring and conductive particles from a glass substrate, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of impurities in organic solvents

The aldol reaction progresses under the influence of temperature, humidity, and light! Example of impurity analysis in ethanol and acetone.

This is an example of analyzing impurities detected in a solvent when stored in inappropriate conditions. Ethanol, which was stored in a light-protective reagent bottle in a cool, dark place, was transferred to a used plastic wash bottle and left at room temperature for about a month. As a result, impurities such as triethyl borate and alkylbenzenes were detected. Additionally, acetone stored in a light-protective reagent bottle in a cool, dark place was transferred to a transparent glass bottle without light protection and left at room temperature for about a month, resulting in the detection of diacetone alcohol as an impurity. [Impurity Analysis in Ethanol] - Ethanol stored in a light-protective reagent bottle in a cool, dark place was transferred to a used plastic wash bottle and left at room temperature for about a month (the wash bottle was not sealed as the opening was exposed). - Result: Impurities such as triethyl borate and alkylbenzenes were detected. *For more details, please refer to the PDF document or feel free to contact us.*

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Analysis of fragrance components by GC-MS.

GC-MS is used for qualitative and quantitative analysis of low molecular weight organic substances! Data was obtained and compared using incense and sandalwood!

Using fragrance as a keyword, we analyzed familiar incense and compared the characteristics of its molecular structure with other materials. The three representative aromatic woods obtained from trees are sandalwood, agarwood, and kyara; in this case, data was collected from incense and sandalwood. It is speculated that the woody scent is primarily due to the aliphatic cyclic structure, characterized by aldehyde groups. [Analysis Overview] ■ Analysis Samples: Incense, Sandalwood ■ Identification of fragrance components using thermal desorption GC-MS (180°C) - Confirmed peaks with the same detection time as sandalwood - Indicates that sandalwood is used as a fragrance in the incense *For more details, please refer to the PDF document or feel free to contact us.

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Cross-sectional hardness of aluminum welds (spot welding)

Cross-sectional observation and hardness measurement of the weld joint were conducted! It was found that the void in the center is a blowhole.

We conducted hardness measurements on aluminum spot welds after performing cross-sectional observations, and we would like to present an example of the trends observed in Vickers hardness, Young's modulus, and elasticity ratio. From X-ray radiographic observations, voids were confirmed within the weld area. Cross-sectional observations revealed that the void in the center was a blowhole. Additionally, the hardness measurement results indicated that the area near the blowhole was hard but had low stiffness, making it prone to deformation, while areas slightly away from the blowhole exhibited higher stiffness and were somewhat brittle. [Summary] ■ Observation case of aluminum spot welds: optical microscope images, X-ray images - Voids confirmed within the weld area from X-ray radiographic observations ■ Hardness measurement of cross-section of aluminum spot welds - Measurements conducted focusing on the blowhole - Investigation of trends based on Vickers hardness, Young's modulus, and elasticity ratio *For more details, please refer to the PDF document or feel free to contact us.

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Roundness / Circularity Measurement

We will respond to your request to evaluate roundness and circularity!

Are you having trouble evaluating whether the axes and shaped holes are according to the design specifications? At our company, we attach samples to the KEYENCE "VR-6200" electric rotary unit, rotate them 360 degrees to obtain 3D data, and measure roundness from the profile. Additionally, we measure circularity using the image processing software "WinROOF2021." Please feel free to contact us when you need our services. 【Features】 <Roundness Measurement Using VR-6200> ■ Attach samples to the electric rotary unit and rotate them 360 degrees ■ Obtain 3D data and measure from the profile <Circularity Measurement Using Image Processing Software> ■ When measuring the circularity of commercially available probe pins using WinROOF2021, it was observed in the SEM image that they are not perfectly circular. *For more details, please refer to the PDF document or feel free to contact us.

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Material evaluation using ultra-micro hardness testing for metals, polymers, plastics, etc.

It is also possible to analyze many material properties such as Young's modulus, plastic hardness, plastic deformation amount, elastic ratio, and creep! Variations in hardness and other properties can be expressed using standard deviation.

Our company can perform ultra-microhardness measurements on various materials such as metals, polymers, plastics, and ceramics. Additionally, since hardness can be quantified, the characteristics of the materials become clearer. The ultra-microhardness tester "Fischer scope H100" measures by gradually increasing the load up to the set load, allowing for the continuous profiling of hardness, indentation depth, and information on the effects on the material from the surface layer. By determining the hardness value from the penetration depth of the indenter into the material and the load/penetration depth curve after unloading, it is possible to analyze many physical properties beyond hardness, including Young's modulus, plastic hardness, plastic deformation amount, elastic ratio, and creep. Please feel free to contact us if you are considering evaluating the characteristics of materials. *For more details, please refer to the PDF document or feel free to contact us.

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Solar Cell EL Image Measurement Device PVX330

Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.

24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third of conventional models Free sample evaluation demo now available.

  • Measurement and Analysis Equipment
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Solar cell PL imaging unit POPLI-3C

Solar cell 6-inch cell compatible PL excitation light source. By combining it with the EL image inspection device PVX series, PL observation becomes possible.

Free sample evaluation demo now available. POPLI is an advanced PL imaging device that adds a PL imaging unit as an option to the EL image inspection device PVX, achieving clear PL imaging and cost-effectiveness by utilizing the detection capabilities and software of the PVX.

  • Measurement and Analysis Equipment
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EL/PL Imaging Device PVX1000+POPLI-Octa

Wafer can be evaluated using photoluminescence during the solar cell manufacturing process.

The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the location of defects. By applying reverse bias to the module and observing the LEAK points, defects causing PID can be easily identified.

  • Measurement and Analysis Equipment
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Microscopic EL/PL imaging device PVX1000+POPLI-μ

Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.

The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structures of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess the damage to the passivation layer around the laser contact holes. Additionally, by using a DC power supply for EL observation of the modules, it is possible to pinpoint the locations of defects.

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  • Solar power generation
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Solar panel maintenance and upkeep - Solament SC-200

The CIS adapter SC-200 enables high-speed inspection of CIS thin-film panels simply by replacing the sensor unit of Solamente-iS.

The hassle of removing PV cables for checking CIS thin-film panels has been eliminated. High-speed checks from the panel surface during power generation significantly improve the efficiency of CIS inspections. By simply replacing the sensor unit of the Solamente-iS SI-200, the Solamente CiS Adapter (optional) SC-200 enables high-speed inspections of CIS thin-film panels when attached to the widely used Solamente-iS (SI-200) in solar panel inspection sites. By utilizing the iS panel checker function, which detects power generation current from the panel surface, specifically for CIS, it has become economically feasible to inspect CIS panels. Without removing the PV cables, it is now easy to efficiently identify failures in CIS thin-film panels (such as bypass diode short circuits) in a short amount of time.

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Solar panel maintenance and upkeep - Solament SR-200

With Solamente SR-200, panel inspection before interconnection is now possible.

A new feature of Solamente that detects faulty panels during pre-power transmission inspections and power outage inspections. A new inspection method that links SZ-200 and SI-200. Inspection Method By linking Solamente-Z (SZ-200) and Solamente-iS (SI-200), sensors (SR-200) check the panels along the string circuit. A faulty panel is located where the sensor's response is interrupted.

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Solar panel maintenance and upkeep - Solament SI-200

The Solar Panel Checker SI-200 can easily detect faulty panels during power generation.

The Solar Panel Checker Solamente-iS SI-200 is an inspection device that detects cluster failures* by placing a sensor on the surface of panels during power generation. It senses the generated current flowing through the interconnector and displays it in musical notes and LED levels, allowing for instant identification of clusters that are not generating power. (*Cluster failures can occur due to initial defects, aging deterioration, lightning damage, etc.) With just a press of a button, the built-in illuminance sensor automatically adjusts the sensitivity. The measurement speed is approximately 5 seconds per panel, making it high-speed. With the super long extension pole (optional), it can reach panels up to 3.6 meters away.

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Solar panel maintenance and upkeep - Solament SZ-200

The String Checker SZ-200 can identify solar panel failures at the string level.

The String Checker Solamente-Z SZ-200 is an inspection device that probes each string P/N terminal of the connection box to detect strings with fault panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-200 achieves fast inspections, is resistant to changes in sunlight, and offers high operability, ensuring reliable results and significantly improving the efficiency of inspection work.

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Wafer processing service

Aites wafer processing service that supports the birth of new technologies.

Aites' wafer business division offers professional wafer processing services that widely meet a diverse range of test wafer needs. Aites boasts a dedicated 8-inch processing line as its flagship, providing services in the wafer processing field for over 12 years. We utilize our accumulated technical know-how and unique processing resources to broadly accommodate processing requirements ranging from 2 inches to 12 inches. A notable feature of Aites wafer services is the high number of repeat customers, as we gain strong trust from our clients by supporting wafer processing projects quickly and extensively.

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Measurement of inorganic particle size using dynamic light scattering method.

Determine particle size and particle size distribution! An example of measuring the particle size of silica and alumina particles in an aqueous medium.

Dynamic light scattering allows for the measurement of particle size and size distribution of nanoparticles dispersed in a liquid without separating the particles. Here, we present examples of particle size measurement for silica and alumina particles in an aqueous medium. Particles in solution exhibit Brownian motion that depends on their size, and the fluctuations in the scattered light generated when the particles are illuminated depend on the particle size. By observing and analyzing these fluctuations, we can determine the particle size and size distribution. [Alumina Measurement Results and Discussion] - As alumina approaches neutrality from strong alkaline conditions, it approaches its isoelectric point. - The surface charge of the particles decreases. - The repulsion between particles diminishes. - It can be inferred that particle aggregation is occurring. *For more details, please refer to the PDF document or feel free to contact us.*

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Analysis of Liquid Crystal Display Materials

We propose analytical methods tailored to materials and purposes! Here are examples of chemical analysis for each component, such as liquid crystals and sealing materials.

Liquid crystal displays use various organic materials, including liquid crystals, sealing materials, encapsulants, and polarizers. Considering the material properties and degradation mechanisms of each component from a chemical perspective is important for product evaluation and failure analysis. This document presents examples of chemical analyses for the components of liquid crystal displays. [Examples of Chemical Analysis] - FT-IR: Principal component analysis - EDX: Elemental analysis - GCMS: Liquid crystal component analysis - HS-GCMS: Outgassing analysis (degradation analysis), among others *For more details, please refer to the PDF document or feel free to contact us.

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Measurement examples of DSC (Differential Scanning Calorimetry)

Comparing thermal properties with DSC! We will discuss the impact of type discrimination and the state of polymer molecular chains on material properties!

Polyethylene (PE) comes in several types with different material properties depending on the length and number of its side chain branches. From the melting peak of crystalline polymer polyethylene, we measured the melting point and crystallinity using DSC and compared them by type of polyethylene. LDPE, which has many long side chains and is less dense, resulted in a low melting point and low crystallinity. In contrast, HDPE, which tends to have a denser molecular chain, showed high values for both melting point and crystallinity. Additionally, LLDPE, which has many relatively short side chains and is more likely to be dense than LDPE, exhibited intermediate values for both melting point and crystallinity between LDPE and HDPE. **Types of Polyethylene** - **LDPE (Low-Density Polyethylene):** Low rigidity and high flexibility - **LLDPE (Linear Low-Density Polyethylene):** Stronger than LDPE but inferior processability - **HDPE (High-Density Polyethylene):** High rigidity, excellent tensile strength, impact strength, and hardness *For more details, please refer to the PDF document or feel free to contact us.*

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One-shot 3D shape measuring device "VR-6200"

With this one device, you can measure various things! It can reproduce cross-sectional shapes without cutting, and it is also capable of measuring glossy surfaces!

Aites Co., Ltd. has introduced the KEYENCE manufactured one-shot 3D shape measurement device 'VR-6200'. It comes with an electric rotation unit, allowing for the reproduction of cross-sectional shapes without cutting. The HDR scanning algorithm enables measurement of glossy surfaces as well. From profile measurement to flat measurement, volume area, and comparative measurement, this single device can perform various measurements. 【Measurable Items】 ■ Profile Measurement ■ Flat Measurement ■ Volume Area ■ Surface Roughness Measurement ■ Flatness Measurement ■ Comparative Measurement *For more details, please refer to the PDF document or feel free to contact us.

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