Wafer can be evaluated using photoluminescence during the solar cell manufacturing process.
The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the location of defects. By applying reverse bias to the module and observing the LEAK points, defects causing PID can be easily identified.
Inquire About This Product
basic information
Product Features 1. Silicon wafers (6 inches square or smaller) 2. Ultra-high sensitivity cooled CCD camera (1 million pixels, -70°C) 3. Bulk imaging measurement possible with surface light source 4. Equipped with high-function image processing software 5. Desktop type for space-saving
Price information
-
Delivery Time
Applications/Examples of results
We can conduct a demo using customer samples. We also accept customization based on individual requests. Please feel free to contact us here.
catalog（1）
Download All Catalogs
Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.