Differences in appearance due to SEM observation conditions.

Introducing SEM images taken under various conditions! An explanation of the differences in appearance based on SEM observation conditions.

SEM observation involves detecting secondary and backscattered electrons generated when electrons irradiate the surface of a sample and scatter in the sample's outermost layer. These electrons are captured by a detector and displayed as an image on a monitor. There are various types of detectors for capturing electrons, each yielding images that leverage their unique characteristics, and the appearance can change by varying the acceleration voltage. In this document, we introduce SEM images captured under various conditions. We encourage you to read it. 【Contents】 ■ Backscattered Electron Images - Backscattered electron images at high acceleration voltage (AsB detector) - Backscattered electron images at low acceleration voltage (EsB detector) ■ Secondary Electron Images - Differences in appearance due to acceleration voltage - Differences in appearance due to detector position *For more details, please refer to the PDF document or feel free to contact us.

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