Analytical Equipment - メーカー・企業65社の製品一覧とランキング | イプロス

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Analytical Equipmentのメーカー・企業ランキング

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  1. インボディ・ジャパン 東京本社 Tokyo//Medical and Welfare
  2. null/null
  3. ビーエルテック Tokyo//others
  4. ネッチ・ジャパン Kanagawa//Building materials, supplies and fixtures manufacturers
  5. 5 アワーズテック Osaka//others
企業ランキングへ

Analytical Equipmentの製品ランキング

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  1. InBody Comprehensive Catalog インボディ・ジャパン 東京本社
  2. Portable Body Composition Analyzer "ACCUNIQ BC300"
  3. TMA 4000 SE / Thermomechanical Analysis Device ネッチ・ジャパン
  4. 4 Fluorescent X-ray analysis device 'DPO-2000' [Rental] ソーキ
  5. 4 Acoustic analyzer "XL3" suitable for large-scale event monitoring.

Analytical Equipmentの製品一覧

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River and Lake Nutrient Measurement Device - SWAT

River and Lake Nutrient Measurement Device - SWAT

Nitrate, ammonia, phosphate, and silica in environmental water, wastewater, and sewage can be measured. (Continuous flow analysis method is used)

It is used by government agencies, universities, and private water quality testing organizations. It can simultaneously measure up to five items: nitrate, nitrite, phosphate, ammonia, and silica, at a rate of 120 samples per hour. It is capable of a wide range of measurements, including rivers, brackish water, lakes, and environmental water. 【Features】 - Simultaneously measures up to five items: nitrate, nitrite, phosphate, ammonia, and silica, at a rate of 120 samples per hour. - Capable of a wide range of measurements, including rivers, brackish water, lakes, and environmental water. - Excellent automation techniques. - Outstanding cost performance. - Listed in JIS and Ministry of the Environment notification laws. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measuring instruments
  • Other analytical equipment
  • Analytical Equipment

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An analysis case using the CFA method for measuring nitrogen and phosphorus in seawater, etc.

An analysis case using the CFA method for measuring nitrogen and phosphorus in seawater, etc.

Publication of case studies using the CFA method for measuring total nitrogen and total phosphorus in seawater and wastewater.

The nitrogen and phosphorus analysis using the auto-analyzer from Sanyo Technomarine Co., Ltd. adopts the Continuous Flow Analysis (CFA) method, and we are currently using our "QuAAtro2-HR." When introducing flow analysis methods, the focus is generally on improving efficiency, but after implementation, users face unique challenges and innovations in equipment management. This document reports on the insights gained by Sanyo Technomarine Co., Ltd. as a user. 【Contents】 ■ Overview of the analysis equipment Analysis methods and specifications of the equipment in use ■ Comparison of this model with manual analysis Comparison of manual analysis and CFA from the perspectives of "effectiveness" and "burden" ■ Contamination prevention measures in NH4-N analysis Contamination prevention measures using soundproof boxes, etc. ■ Measures against carryover in total nitrogen analysis ■ Summary *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Other measuring instruments
  • Analytical Equipment

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[Presentation of Materials] Introduction of simple, rapid, and accurate measurement examples of nutritional components!

[Presentation of Materials] Introduction of simple, rapid, and accurate measurement examples of nutritional components!

Utilizing near-infrared analysis equipment. By leveraging over 1,000 measurement data points, it is possible to measure nutritional components with accuracy equivalent to traditional methods!

Our company, engaged in the development, manufacturing, and import sales of analytical machines, is currently offering case study materials on the measurement of nutritional components using "near-infrared analysis equipment." The materials provide detailed explanations of the measurements and the advantages of the measurement methods, as well as showcasing over 1,000 diverse samples, including bento, side dishes, noodles, desserts, and sandwiches, while highlighting the differences from conventional methods. 【What is Near-Infrared Analysis?】 ■ A component measurement method that does not use reagents or consumables. It allows for the measurement of target components in a simple, rapid, and accurate manner, using only physical pretreatment, such as non-destructive methods or food blenders, even with samples of unknown concentration. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other measuring instruments
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  • Other analytical equipment
  • Analytical Equipment

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Continuous Flow Analysis System (CFA) "MiSSion"

Continuous Flow Analysis System (CFA) "MiSSion"

Equipped with halogen and LED light sources! Vertical two-channel system of the auto analyzer series.

We have newly released the continuous flow analysis device "MiSSion." It is a vertical two-channel system from the auto-analyzer series. The measurement principle is based on the flow analysis device using the absorbance method, specifically the bubble segment type "CFA" method. The auto-analyzer series offers over 1,000 analytical methods for chemical analysis in various fields such as environment, agriculture, fisheries, and chemistry, and is widely used in many analytical institutions. 【Features】 ■ Supports ultra-low concentration measurements ■ Can be equipped with halogen and LED light sources ■ Excellent maintainability ■ Temperature control function for the detector ■ New software *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Measurement and Analysis Equipment
  • Analytical Equipment

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[Technical Document] Establishment of an Automated Measurement Method for Nutritional Component Analysis in Soy Sauce

[Technical Document] Establishment of an Automated Measurement Method for Nutritional Component Analysis in Soy Sauce

Using the NIR Nutrition Analyzer! Established a method for rapid and easy measurement!

This document introduces the establishment of an automatic measurement method for analyzing food nutritional components in soy sauce using the "NIR Nutrition Analyzer." We conducted examinations on the measurement of food nutritional components such as "calories," "protein," "lipids," "carbohydrates," and "equivalent salt content." Using near-infrared analysis equipment, we were able to establish a rapid and simple analytical method for measurements in both soy sauce and white soy sauce. 【Contents】 ■ Overview ■ What is Near-Infrared Analysis? ■ Keywords ■ Equipment Used ■ Examination Methods *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Non-destructive testing
  • Measurement and Analysis Equipment
  • Analytical Equipment

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Technical Data: Establishment of a Component Analysis Method for Green Coffee Beans

Technical Data: Establishment of a Component Analysis Method for Green Coffee Beans

Using the NIR coffee bean checker! Establishment of an automatic measurement method for component analysis of green coffee beans.

This document introduces the establishment of an automatic measurement method for component analysis of green coffee beans using a NIR coffee bean checker. Near-infrared spectroscopy is a component measurement method that does not use reagents or consumables. We have established a method to quickly and easily measure the components of green coffee beans, including "moisture," "caffeine," "potassium," "ash," "chlorogenic acid," "protein," and "trigonelline." 【Contents】 ■ Overview ■ What is Near-Infrared Analysis? ■ Keywords ■ Equipment Used ■ Examination Method *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Non-destructive testing
  • Measurement and Analysis Equipment
  • Analytical Equipment

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[Technical Document] Establishment of a Component Analysis Method for Roasted Coffee Beans

[Technical Document] Establishment of a Component Analysis Method for Roasted Coffee Beans

Using the NIR coffee bean checker! We were able to quickly and easily measure the component analysis items.

This document introduces the establishment of an automated measurement method for component analysis of roasted coffee beans using an NIR coffee bean checker. To ensure quality assurance in roasted coffee beans, the parameters measured include "roasting depth," "moisture," and "caffeine." In the component analysis of roasted coffee beans, a calibration curve that can be measured in the near-infrared range has been created. It has become possible to simultaneously measure the parameters of "roasting depth," "moisture," and "caffeine." Therefore, we have established an automated measurement method for measuring the components of roasted coffee beans using NIR (near-infrared analysis equipment). [Contents] ■ Overview ■ What is Near-Infrared Analysis? ■ Keywords ■ Equipment Used ■ Method of Examination *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Non-destructive testing
  • Measurement and Analysis Equipment
  • Analytical Equipment

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[JASIS Kansai 2025 Exhibition] Displaying analytical instruments for the environmental and food industries!

[JASIS Kansai 2025 Exhibition] Displaying analytical instruments for the environmental and food industries!

Exhibiting at "JASIS Kansai 2025," where technologies related to science and analysis come together! A wide range of products that assist in automation, from pre-treatment to measurement of the environment and food, will be showcased.

"JASIS Kansai 2025" is a science and analysis system and solutions exhibition that gathers numerous manufacturers of analytical and scientific instruments that support the advancement of science beneficial to people's lives. Many presentations and seminars on new technologies will be held. Our company, which contributes to the automation of environmental and food analysis and the improvement of efficiency and quality through analytical instruments, will showcase a variety of products, including "Heavy Metal Analysis Pretreatment Equipment" and "Near Infrared Analysis Equipment." Please feel free to visit us. [Exhibited Products] ■ Continuous Flow Analysis Device 'MiSSion' ■ Fully Automatic Acid Decomposition Pretreatment Device 'AATM' ■ Fully Automatic Acid Decomposition Pretreatment Device 'DEENA2' ■ Near Infrared Analysis Device 'SpectraStar XT' ■ Damaged Starch Measurement Device 'SDmatic 2' *For details on the exhibited products, please refer to the <PDF download>. For more information on various products, please contact us.

  • Other analytical equipment
  • Analytical Equipment

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TMA (Thermomechanical Analysis)

TMA (Thermomechanical Analysis)

Information on thermal expansion, thermal contraction, and glass transition temperature can be obtained in multiple measurement modes!

TMA (Thermomechanical Analysis) is a method that measures the dimensional changes of a sample while applying a constant load and varying the sample temperature. It provides information on thermal expansion, thermal contraction, glass transition temperature, and more. The temperature range is from -150 to 1000°C, with a maximum size of Φ10×25mm (compression mode, needle insertion mode) and a maximum size of 0.7mm×5mm×20mm (tensile mode) being the measurable conditions. This document includes case studies of TMA analysis for semiconductor encapsulants. 【Features】 ■ Thermomechanical analysis ■ Applying a constant load to the sample while varying the sample temperature ■ Measuring the dimensional changes of the sample ■ Obtaining information on thermal expansion, thermal contraction, glass transition temperature, etc. ■ Multiple measurement modes *For more details, please refer to the PDF document or feel free to contact us.

  • Measurement and Inspection
  • Structural Survey
  • Analytical Equipment

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GCMS analysis of liquid crystal components

GCMS analysis of liquid crystal components

Comparison of components in liquid crystal panels using gas chromatography-mass spectrometry (GC-MS) is published!

This document introduces a comparison of components in PC monitors and digital clocks using gas chromatography-mass spectrometry (GC-MS). Liquid crystal displays contain small organic substances (liquid crystal molecules). These have evolved into molecular structures suitable for product characteristics due to technological innovations. Our company clarifies these differences at the molecular level using GC-MS, allowing us to confirm that the liquid crystal molecules are appropriate for their intended use and to check for the presence of impurities. [Contents] ■ Comparison of components in PC monitors and digital clocks using GC-MS ■ Case studies of GC-MS analysis of liquid crystal components We compared the number of components and characteristics of segment-type liquid crystal displays (digital clocks) and color TFT liquid crystal displays (PC monitors). *For more details, please refer to the PDF document or feel free to contact us.

  • Other services and technologies
  • Analytical Equipment

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State analysis using EPMA

State analysis using EPMA

Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.

In the state analysis using EPMA, changes (shifts and shapes) in the characteristic X-ray peak wavelengths due to differences in the chemical bonding states (ionic valence, crystal structure, coordination number) of oxides and silicates are utilized to estimate the bonding states by comparing with standard spectra. In the identification of two types of copper oxides, when distinguishing between black CuO and red Cu2O by color is difficult, especially for microscopic objects that require an electron microscope, it is possible to grasp the oxidation state using EPMA. Additionally, while XPS is effective for measuring thin oxide layers on aluminum surfaces, EPMA can be used to understand the oxidation state of small foreign particles, bulk materials, and composites. 【Device Specifications】 ■ Manufacturer: JEOL Ltd. Jeol-8200 ■ Analysis Method: Wavelength Dispersive X-ray Analysis (WDX) ■ Analyzable Elements: B to U ■ Energy Resolution: 20 eV (EDX is approximately 130 eV) ■ Detection Limit: 0.01% and above ■ Maximum Sample Size: 100x100 mm *For more details, please refer to the PDF document or feel free to contact us.

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EPMA analysis

EPMA analysis

Supports 100×100mm size! Wide-range mapping is possible due to stage movement.

EPMA analysis has good energy resolution and detection sensitivity, and is particularly excellent for quantitative analysis of trace components and map analysis. It can accommodate sizes of 100×100 mm, allowing for the acquisition of extensive maps. In the example of foreign substance analysis on indium-tin oxide thin films, it showed better energy resolution, detection limits, and PB ratios compared to SEM-EDX. Additionally, it enables the detection of trace elements and analyses that are difficult to perform with SEM-EDX. 【Features】 ■ Good energy resolution and detection sensitivity ■ Particularly excels in quantitative analysis of trace components and map analysis ■ Wide-ranging mapping possible due to movable stage ■ Can accommodate sizes of 100×100 mm *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment

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Outgassing analysis using headspace GC-MS analysis method.

Outgassing analysis using headspace GC-MS analysis method.

Publication of headspace GC-MS analysis method and case study of outgassing component analysis of liquid crystal panel polarizers!

If solvents, low molecular organic substances, or unreacted materials remain in the constituent materials, packaging materials, or cushioning materials of a product, they may outgas, diffuse, or permeate into the constituent materials, potentially affecting the product's lifespan, characteristics, and the environment or human health. The headspace method of GCMS is effective for qualitative and quantitative analysis of trace residual substances. This document presents a case study of the qualitative analysis of outgassing components from polarizers used in liquid crystal panels. We invite you to read it. [Contents] - Headspace GC-MS analysis method - Analysis of outgassing components from polarizers in liquid crystal panels *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system
  • Other services and technologies
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  • Analytical Equipment

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Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Appropriate acceleration conditions for accurate analysis results! The detection depth in EDX changes with different acceleration voltages!

This introduces the detection sensitivity related to differences in acceleration voltage during SEM-EDX analysis. When analyzing the gold-plated surface of a typical printed circuit board (PCB), there are cases where the underlying nickel is detected even though it is not exposed. This is related to the scattering depth of the electron beam, and it is necessary to set appropriate acceleration conditions to obtain accurate analysis results. In this study, we conducted a verification of the EDX detection depth based on differences in acceleration voltage using Monte Carlo simulations. This is just one example, but it is important to set the acceleration voltage while imagining how electrons are scattered in order to obtain accurate analysis results. [Test Board Overview] - The sample used was a gold-plated pad from a typical printed circuit board (PCB). - The layer structure consists of nickel plating and gold plating on copper wiring. - The thickness of the gold plating, as observed in cross-section, is 212 nm. *For more details, please refer to the PDF document or feel free to contact us.*

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Analysis of Polymer Structural Changes

Analysis of Polymer Structural Changes

Evaluate higher-order structures using analytical methods! Raman analysis is also effective for analyzing polymer structures.

I would like to introduce the topic of "Analysis of Polymer Structural Changes." This document includes "Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy" and "Structural Changes of Polymer Chains." The molecular structure of polymers influences their properties, affecting the physical characteristics of polymer products. We have evaluated the higher-order structures formed by the aggregation of polymer chains using analytical methods. Please take a moment to read it. [Contents] ■ Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy ■ Structural Changes of Polymer Chains *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system
  • Analytical Equipment

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[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

We detect and analyze the atomic emission that occurs when an atom returns from an excited state to its ground state!

In ICP emission spectroscopic analysis, multiple metal elements contained in a sample can be detected simultaneously. This document introduces examples of the analysis of trace metal elements contained in liquid crystals. It includes the principles and overview of ICP-AES analysis as well as measurement examples. Please feel free to contact us regarding the sample state or the elements to be analyzed. [Contents] ■ Principles and overview of ICP-AES analysis ■ Measurement example: Qualitative analysis of metal elements in liquid crystal panels using ICP-AES *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system
  • Analytical Equipment

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of problems are possible! We will introduce case studies verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis using surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results via XPS (ESCA) ■ Bonding State Analysis Results via XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results via XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system
  • Analytical Equipment

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[Example of TOF-SIMS] Analysis of Li

[Example of TOF-SIMS] Analysis of Li

It is possible to detect with high sensitivity! We present a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, detecting Li with general EDX, excluding windowless EDX, is difficult. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF materials or feel free to contact us.

  • Other analytical equipment
  • Analytical Equipment

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[Data] Analysis of Additive Defects in Polymers by Thermal Desorption GC-MS

[Data] Analysis of Additive Defects in Polymers by Thermal Desorption GC-MS

It is possible to analyze with high sensitivity using thermal desorption GC-MS analysis! We propose methods tailored to the symptoms of malfunctions and your objectives.

Various additives are used in polymers to improve stability and processability; however, due to environmental impact and long-term storage, additive components may precipitate on the polymer surface, or the additives themselves may undergo chemical changes, leading to discoloration and degradation. This document presents examples of analyses conducted using thermal desorption GC-MS to examine the bleed-out of additives and the chemical changes of additive components due to UV irradiation. Although additive components are present in small quantities compared to the main polymer components, they can be analyzed sensitively using thermal desorption GC-MS. We propose methods tailored to specific issues or objectives, such as predicting product degradation in combination with reliability testing, thermal analysis, and main component analysis, so please feel free to contact us. [Contents] ■ Analysis of additive components that bled out from nitrile rubber ■ Analysis of additive components in nylon 66 subjected to UV irradiation *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Example by EDS] Bonding Interface of Cu Pads

[Analysis Example by EDS] Bonding Interface of Cu Pads

It is possible to view the distribution of each element in two dimensions! This can also be effective when analyzing multilayer samples.

Here, we present an example of EDS analysis at the Cu pad interface. In the qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

  • Measurement and Analysis Equipment
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  • Analytical Equipment

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[Data] Analysis and evaluation of organic materials and polymer materials.

[Data] Analysis and evaluation of organic materials and polymer materials.

Essential materials alongside metals and inorganic materials! Introducing examples of analysis and evaluation services for organic materials.

Organic materials such as solvents, additives, pharmaceuticals, and plastics are essential materials alongside metals and inorganic materials. They have a wide variety of types due to the combination of light elements, and their specificity is manifested through structure, intermolecular forces, and electron behavior. However, it seems that chemical instrumentation analysis and evaluation are necessary for a fundamental understanding of their properties. This document presents case studies of analysis and evaluation services for organic materials. [Contents] ■ FT-IR Analysis ■ GC-MS Analysis ■ Molecular Weight Distribution Evaluation by GPC (SEC) *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
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Dynamic SIMS

Dynamic SIMS

Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. [Features] ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Best detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.

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Refrigerant Analyzer Checkmate

Refrigerant Analyzer Checkmate

Refrigerant Analyzer Checkmate

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Effective for exhaust gas measurement! High-performance gas analyzer FT-IR "MATRIX-MG"

Effective for exhaust gas measurement! High-performance gas analyzer FT-IR "MATRIX-MG"

Verified through the "EURO6" measurement test for phased automobile emissions regulations in the EU.

Are you familiar with the phased automotive exhaust gas regulation "EURO6" implemented by the EU (European Union)? Bruker's high-performance FT-IR gas analysis device "MATRIX-MG" has been validated in actual measurement tests for EURO6. We introduce the pinnacle of FT-IR gas analysis equipment, featuring a compact design that can be loaded onto a vehicle's cargo area and unparalleled high resolution. ■ Features of MATRIX-MG - Achieves rapid, continuous, and automatic qualitative and quantitative gas analysis - Exceptional sensitivity, capable of detecting from a few ppb to 100% - Wide detectable range - No calibration required for target gases - Easy operation and maintenance - Automatic correction for the influence of gases and interfering components in the atmosphere - Gas cell with temperature control function capable of heating up to 191°C - Continuous monitoring of temperature and pressure within the gas cell, providing feedback for quantitative analysis - Measurement results can be output to industrial communication interfaces

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Gas Analysis Device MATRIX-MG/OMEGA5

Gas Analysis Device MATRIX-MG/OMEGA5

■Ammonia Measurement■ Capable of measuring a full range from low concentration to high concentration!

It has been said that there have been very few analytical devices capable of measuring ammonia across a full range from low to high concentrations. Bruker's device supports full-range measurement. 【OMEGA5】 This is a gas analysis FT-IR system equipped with a multi-reflection gas cell with an optical path length of 5 meters, suitable for measuring industrial gases, all housed in a compact body compatible with 19-inch racks. It is designed to automatically monitor gas concentrations with high precision and in real-time, making it applicable in various fields. The OMEGA5 achieves a reduction in overall costs, including operation and maintenance. 【MATRIX-MG】 Achieving qualitative and quantitative gas analysis quickly, continuously, and automatically! Measurement results can be output to industrial communication interfaces. The 'MATRIX-MG series' is a high-performance FT-IR gas analyzer characterized by its robustness and compact design. It is designed to automatically analyze each component and concentration of target gases with high precision and in real-time for gas analysis in various fields. It can identify and quantify over 300 types of compounds without calibration measurements.

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Compact FT-IR Spectroscopic Analyzer 'ALPHA II'

Compact FT-IR Spectroscopic Analyzer 'ALPHA II'

Stable results and high reliability! The compact design, equivalent to one A4 sheet of paper, allows for effective use of lab space.

"ALPHA II" is a chemical analysis device that rapidly performs qualitative and quantitative analysis of various samples. With a robust and sophisticated design, it features touch-operated software. New users can be trained in just a few minutes, and centralized data management is also possible. Additionally, it maximizes analytical work efficiency with simple operability without wasting valuable space in the laboratory. 【Features】 ■ Sampling modules that accommodate various applications ■ Long-lasting components (up to 10 years warranty) ■ Pre-set analytical workflows ■ All-in-one panel PC option ■ High humidity environment compatibility option ■ Effective use of lab space *For more details, please refer to the PDF materials or feel free to contact us.

  • Measurement and Analysis Equipment
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Technical Documentation: System Validation BRAVO

Technical Documentation: System Validation BRAVO

Minimize compliance costs! We provide comprehensive system suitability assessments.

This document introduces the system validation of "BRAVO." It includes information on "performance qualification," "data integrity," and "ready-to-use system qualification." The optical system of BRAVO is designed to achieve the highest level of precision and can meet the stringent performance evaluation criteria set for bench-top devices (Ph.Eur.) and quantitative analysis (USP). [Contents] ■ Concept ■ Validated Solutions ■ 21 CFR Part 11 and beyond ■ Performance Qualification – USP <858> & <1858>, Ph.Eur. 2.2.48, JP 2.26 ■ Data Integrity ■ Ready-to-use System Qualification *For more details, please refer to the PDF document or feel free to contact us.

  • Measurement and Analysis Equipment
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Hands-on Learning: FT-NIR (Near Infrared Analysis) Seminar for the Dairy and Agriculture Industries

Hands-on Learning: FT-NIR (Near Infrared Analysis) Seminar for the Dairy and Agriculture Industries

Introducing our latest technology and case studies in the dairy, agriculture, and feed sectors. We also offer hands-on courses using actual equipment.

The "Near Infrared Analysis Method (NIR)" allows for the easy analysis of multiple components in a single measurement, and since it does not require sample pretreatment or solvents/reagents for measurement, it helps reduce labor costs and consumable expenses in quality control. In this seminar, we will showcase our products from "Routine Analysis FT-NIR" used in laboratories to "Process FT-NIR," while providing detailed case studies from the dairy, agriculture, and feed sectors. On the day of the seminar, we also plan to conduct a hands-on session using the FT-NIR spectrometer "ALPHA II." The capacity is 20 participants per session, and as registration is on a first-come, first-served basis, those interested in participating should apply as soon as possible. 【Event Overview】 'Learn with Real Equipment: FT-NIR (Near Infrared Analysis) Seminar for Dairy and Agriculture' Yokohama Venue: October 26, 2023 (Thursday) 13:00–17:00 Obihiro Venue: October 31, 2023 (Tuesday) 13:00–17:00 Participation Fee: Free (registration on a first-come, first-served basis) Registration Method: You can apply via the link below.

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Technical Data: FT-IR Gas Analysis Capable of Quantification Without Calibration Curve

Technical Data: FT-IR Gas Analysis Capable of Quantification Without Calibration Curve

FT-IR with excellent qualitative capabilities! It can accurately and in real-time quantify the concentration of each component.

FT-IR is a powerful tool that can qualitatively and quantitatively analyze the components of unknown gas by analyzing the infrared spectrum specific to the compound. The high selectivity and sensitivity of FT-IR ensure the reliable detection of trace infrared-active compounds even in mixed gases containing multiple components across a wide range of concentrations. This document includes topics such as "Gas Quantitative Analysis Using FT-IR" and "Verification of OPUS GA Analysis Accuracy." We invite you to read it. [Contents] ■ Gas Quantitative Analysis Using FT-IR ■ High-Precision Quantitative Analysis Without Calibration Curves ■ Verification of OPUS GA Analysis Accuracy ■ Advantages of Gas Analysis Without Calibration Curves *For more details, please refer to the PDF document or feel free to contact us.

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『FT-IR 基礎と応用セミナー』開催のご案内

『FT-IR 基礎と応用セミナー』開催のご案内

2024/7/12(金)13：00～16：30、ブルカージャパン横浜本社ラボ(B号ビル6階)にて開催！

ブルカージャパン株式会社は、ブルカージャパン横浜本社ラボにて、 『FT-IR 基礎と応用セミナー』を開催いたします。 FT-IRは、分子構造の解析や定性・定量分析の有力な手段として、品質管理から 研究開発まで、様々な分野で広く使われている分析機器です。 一方、その基本原理を良く知らないまま使われている現状もあります。 本セミナーは、FT-IRの基礎を学んでいただける、初級・中級レベルの講習会です。 現在FT-IRをお使いの方は、さらなる有効活用を考える機会として、 また今後FT-IRの導入をお考えの方は、 自社の目的に合致した機種・仕様を 考える機会として、本セミナーを是非ご活用ください。 【開催概要】 ■日時：2024/7/12(金) 13：00～16：30 ■会場：ブルカージャパン横浜本社ラボ(B号ビル6階) ■参加費：無料(申込み先着順) ■定員：30名 ※詳しくは関連リンクをご覧いただくか、お気軽にお問い合わせ下さい。

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