Analytical Equipment Product List and Ranking from 67 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. インボディ・ジャパン 東京本社 Tokyo//Medical and Welfare
  2. 東洋メディック 環境事業部 Tokyo//Medical and Welfare
  3. 相互理化学硝子製作所（TOP） Kyoto//Trading company/Wholesale
  4. 4 ビーエルテック Tokyo//others
  5. 5 ブルカージャパン オプティクス事業部 Kanagawa//others
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. InBody Comprehensive Catalog インボディ・ジャパン 東京本社
  2. All That Gas Analysis Equipment JIS K-0301 Standard 相互理化学硝子製作所（TOP）
  3. Body composition analysis device InBody270 インボディ・ジャパン 東京本社
  4. 4 Body Composition Analyzer "ACCUNIQ BC380" 東洋メディック 環境事業部
  5. 4 Silica analysis device "SLIA-5000" 堀場アドバンスドテクノ 京都本社

Analytical Equipment Product List

46～60 item / All 210 items

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Evaluation of membrane quality using EELS analysis method

Evaluation of membrane quality using EELS analysis method

EELS analysis for element identification allows for the comparison of the bonding states of substances!

Our company provides analysis and reliability evaluation services. EELS analysis and EDS analysis are analytical methods that identify elements by irradiating accelerated electrons onto TEM samples. In the case of "different carbon films," we conducted film quality evaluation in the nano region using the EELS analysis method, which is characterized by state analysis. In the EDS analysis, we detected trace amounts of N and O only in the Bottom film through spectral comparison. In the EELS analysis, the difference in shoulder shapes of the two spectra allows for a comparison of the bonding states of N, O, and C present in the organic film. *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Research Institute of Chemical Reaction Mechanisms - Case Study on the Causes of Material Discoloration

[Data] Research Institute of Chemical Reaction Mechanisms - Case Study on the Causes of Material Discoloration

Clear presentation of analysis results using polyamide imide materials and IR devices, along with data analysis!

This document presents a case study that elucidates the causes of discoloration in super engineering plastic polyamide-imide (PAI) films used in coatings, composite film materials, and various molded products through instrumental analysis and reaction mechanisms. It includes analysis results from infrared (IR) devices, data analysis, and reaction mechanisms, starting with the material polyamide-imide. While the storage stability of raw materials is essential in product manufacturing, environmental conditions during the processing can sometimes induce defects. We encourage you to read on. [Contents] ■ About the material polyamide-imide ■ Analysis results from IR devices ■ Data analysis and reaction mechanisms *For more details, please refer to the PDF document or feel free to contact us.

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Detection of trace elements by EPMA.

Detection of trace elements by EPMA.

Detection sensitivity is excellent! It is particularly outstanding for quantitative analysis of trace components and map analysis.

EPMA analysis has good energy resolution and detection sensitivity, and is particularly excellent for quantitative analysis of trace components and map analysis. In a case where a defect occurred in the Au-1st bonding within the package, EDX analysis and EPMA analysis were conducted to identify the corrosive substances and confirm their distribution. Since EPMA has superior resolution, detection limits, and P/B (peak to background) ratios compared to EDX, the distribution of trace Cl could be clearly understood. 【Equipment Specifications】 ■ Manufacturer: JEOL Ltd. Jeol-8200 ■ Analysis Method: Wavelength Dispersive X-ray Analysis (WDX) ■ Analyzable Elements: B to U ■ Energy Resolution: 20 eV (EDX is approximately 130 eV) ■ Detection Limit: 0.01% and above ■ Maximum Sample Size: 100×100 mm *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of Organic Multilayer Films by Imaging FT-IR: Aluminum

Analysis of Organic Multilayer Films by Imaging FT-IR: Aluminum

Introducing a method for analyzing the vicinity of the surface through total internal reflection of infrared light by closely adhering micro ATR crystals!

Based on imaging obtained from FT-IR spectra using the ATR method, cross-sectional analysis of organic multilayer films such as aluminum laminate film can be performed. The ATR method (Attenuated Total Reflection) is a technique that involves closely attaching a micro ATR crystal to the sample, allowing for analysis near the surface through total internal reflection of infrared light. Due to the influence of the refractive index of the crystal applied to the sample, the apparent spatial resolution is enhanced, enabling the analysis of smaller foreign substances. 【Features of the ATR Method】 ■ A technique that analyzes near the surface through total internal reflection of infrared light ■ The apparent spatial resolution is enhanced due to the influence of the refractive index of the crystal applied to the sample ■ Enables the analysis of smaller foreign substances *For more details, please refer to the PDF materials or feel free to contact us.

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Analysis of Organic Multilayer Films Using Imaging FT-IR Multilayer Films

Analysis of Organic Multilayer Films Using Imaging FT-IR Multilayer Films

It is possible to investigate the layer composition of organic films! Introducing imaging FT-IR analysis of high-performance multilayer film cross-sections.

It is possible to investigate the layer composition of organic films using FT-IR imaging through transmission of organic multilayer membranes that have been sectioned with a microtome. The document introduces imaging FT-IR analysis of high-performance multilayer film cross-sections using photographs and graphs. 【Imaging FT-IR Analysis of High-Performance Multilayer Film Cross-Sections】 ■Sample: High-performance multilayer film ■Measurement Area: Transmission/Reflection method 175μm, ATR method 35μm ■Spatial Resolution (Pixel Size): Transmission/Reflection method 5.5μm, ATR method 1.1μm *For more details, please refer to the PDF document or feel free to contact us.

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Would you like to confirm the degradation of resin through FT-IR analysis?

Would you like to confirm the degradation of resin through FT-IR analysis?

Detect and analyze the absorption wavelengths of organic molecular groups (functional groups)!

At Aites Co., Ltd., we conduct "FT-IR analysis" to confirm the degradation of resins. The degradation of resins can manifest as visible discoloration or invisible changes. Discoloration can be detected through changes in appearance, but invisible changes can lead to a decrease in strength and become the source of various issues. Analysis using IR allows us to understand the changes in molecular structure caused by these alterations. *For more details, please refer to the PDF document or feel free to contact us.*

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  • Non-destructive testing

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Changes due to differences in acceleration voltage during EDX analysis.

Changes due to differences in acceleration voltage during EDX analysis.

Confirm changes due to differences in acceleration voltage! Analyze under appropriate conditions based on accumulated know-how!

When conducting EDX analysis, many people may use high acceleration voltages to increase the detection sensitivity of elements. However, depending on the purpose, analysis at high acceleration voltages is not always the best option. White LEDs generate white light by combining blue LEDs with yellow phosphors (powder), and in this study, we examined how changing the acceleration voltage affects the surface analysis of these phosphors. Please take a moment to read this. [Contents] - Test sample (LED phosphor) - Surface analysis images at different acceleration voltages - Considerations from Monte Carlo simulations of electron beam scattering regions *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

By using LIF and LIFH spectroscopic crystals, peak separation of 22Ti and 56Ba becomes possible!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 22Ti and 56Ba, including analysis examples of multilayer ceramic capacitors and X-ray spectra of barium titanate (BaTiO3). [Contents] - Peak separation of 22Ti and 56Ba - Analysis example: multilayer ceramic capacitors - X-ray spectrum of barium titanate (BaTiO3) *For more details, please refer to the PDF document or feel free to contact us.

  • Analysis and prediction system

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[Data] Analysis of SEG-LCD Panel Display Malfunction

[Data] Analysis of SEG-LCD Panel Display Malfunction

We introduce case studies of comparative analysis conducted through chemical analysis, such as GC-MS analysis and ICP-AES analysis!

In the event of a display failure on a liquid crystal panel, it is necessary to clarify the cause in order to prevent recurrence. This document presents a case study comparing panel A, which exhibited display unevenness due to temperature stress, and panel B, which showed no display issues, through chemical analysis. Aites can investigate the cause through chemical analysis of the liquid crystal interior when initial analyses, such as observations, do not reveal any issues. We can also propose analytical methods tailored to the samples and objectives beyond the techniques mentioned here. [Contents] ■ Reliability testing (80°C / dry conditions / 1000 hours) ■ Liquid crystal GC-MS analysis ■ Metal element ICP-AES analysis within the liquid crystal ■ Summary *For more details, please refer to the PDF document or feel free to contact us.

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[Document] Mass Spectrometry Guide

[Document] Mass Spectrometry Guide

Analyze using various analytical methods to obtain information such as functional groups and skeletal structures! Introducing the mass spectrometry guide.

This document introduces a mass spectrometry guide. In the analysis of organic compounds, information is obtained and analyzed using various analytical methods based on the functional groups, skeletal structures, and masses of the compounds. There are various methods for analyzing the mass of compounds, each with its own strengths in terms of the type of analysis and targets. Additionally, these methods can be selectively used according to the application or combined with other analytical techniques to obtain the necessary information. [Contents] ■ Methods mainly used in mass spectrometry - GC-MS - LC-MS - MALDI-TOFMS - GPC *For more details, please refer to the PDF document or feel free to contact us.

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[Case of EBSD] Comparison of two brass materials

[Case of EBSD] Comparison of two brass materials

Visualizing the differences between two samples based on differences in crystal structure! Introducing a case study of EBSD analysis.

Here is a case study comparing two types of brass with similar elemental compositions. When spectral analysis was conducted using SEM-EDX, it was found that brass primarily consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. Additionally, an EBSD analysis was performed to check the phase map, revealing that a portion of sample 1 exhibited a β phase with a different crystal structure. 【Case Overview】 <Comparison of Two Brass Materials through Elemental Analysis> ■ Analysis Method: SEM-EDX Analysis ■ Results - Spectral analysis indicated that brass primarily consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. - Surface analysis was conducted for elements Cu and Zn, and no bias in the in-plane distribution was observed. *For more details, please refer to the PDF document or feel free to contact us.

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[Information] GC-MS Analysis Device Guide

[Information] GC-MS Analysis Device Guide

Introducing the sample introduction device and the types of analytical samples and analysis that each device specializes in!

GC-MS analysis is a method commonly used for the analysis of organic components and organic structure analysis. With auxiliary devices, it can accommodate a wide range of analyses, from low molecular substances like solvents to high molecular substances like plastics. This document introduces the sample introduction devices owned by Aites, as well as the types of analysis samples and analysis content that each device specializes in. Please take a moment to read it. 【Contents】 ■ Overview ■ Conditions ■ Samples ■ Data Obtained ■ Analysis Examples *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of foreign substances and component analysis: Comparison of micro-Raman and FTIR.

Analysis of foreign substances and component analysis: Comparison of micro-Raman and FTIR.

Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis.

We will introduce a comparison between Raman spectroscopy analysis by Aites Co., Ltd. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to use both according to the analysis target. 【Features】 ■ Measurement in the order of a few micrometers, which is difficult with IR analysis, is possible. ■ No sampling is required. *For more details, please refer to the PDF document or feel free to contact us.

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Example of analysis of compounds at the interface between SAC solder and Ni pads.

Example of analysis of compounds at the interface between SAC solder and Ni pads.

It is also possible to display various maps of each phase! Analysis is based on the information of the crystal structure possessed by the sample.

We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface between NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is an analytical technique based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. 【Overview】 <Elemental Analysis by EDX> ■ Surface analysis shows the distribution of Ni, Cu, and Sn within the compounds. <Crystallographic Orientation Analysis by EBSD> ■ By combining it with elemental analysis using EDX, it is possible to estimate the composition. ■ In some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. *For more details, please download the PDF or feel free to contact us.

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