microscope Product List and Ranking from 28 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. サンコー 法人営業部 Tokyo//others
  2. ブルカージャパン オプティクス事業部 Kanagawa//others
  3. アイテス Shiga//others
  4. 4 ノダキ 本社 Aichi//others
  5. 4 日本カンタム・デザイン Tokyo//Government
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microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Digital Microscope "Dino-Lite High Magnification Series" *Demo unit available サンコー 法人営業部
  2. Digital microscope "Dino-Lite WiFi compatible" *Demo unit available サンコー 法人営業部
  3. FT-IR and QCL Microscope "HYPERION II Series" ブルカージャパン オプティクス事業部
  4. Digital Microscope "Dino-Lite Zoom Series" *Demo unit available サンコー 法人営業部
  5. 4 Digital microscope "Dino-Lite Portable" *Demo unit available サンコー 法人営業部

microscope Product List

1～15 item / All 91 items

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Handy Digital Microscope / Model Number M1375RMS-16BK

Handy Digital Microscope / Model Number M1375RMS-16BK

A digital microscope with an adjustable LCD angle that can be operated with one hand.

● This is a microscope with a monitor that can magnify up to 300 times optically. ● The optical zoom ranges from 20x to 300x, and the digital zoom can be adjusted up to 4x. ● It has a built-in 3-inch large LCD monitor. ● It comes with a dedicated stand that allows you to secure the camera body for use. ● The LCD screen can be rotated to change to a more viewable orientation. ● It has 8 built-in LEDs that allow you to capture bright images of the subject. ● By connecting a video cable, you can output the video to a monitor. ● It is economical as it can be repeatedly charged with a lithium-ion battery. <Notes> * The magnification displayed on the product's monitor is approximately 7x at minimum and approximately 29x at maximum. * When capturing images at a resolution of 5M with this product and displaying them on a 24-inch monitor set to a resolution of 1920x1080 pixels, the magnification will be approximately 380x. * A separately sold microSD (HC) card (up to 32GB) is required for capturing images. * If the lens part is placed snugly against the subject, it will focus at two points: high magnification and low magnification. * The magnification of the optical zoom is not displayed on the screen. * You cannot view the subject at arbitrary magnifications.

  • Other measuring instruments

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Digital Microscope (with HDMI high-definition output) / M1375MP-17BK

Digital Microscope (with HDMI high-definition output) / M1375MP-17BK

A digital microscope capable of high-quality HDMI output. It also allows for video recording in Full HD.

A digital microscope capable of high-quality HDMI output. It also allows for video recording in Full HD. ■ Digital microscope that can capture and output in high quality ■ Easy focusing and shooting Stationary design Since it is a stationary model that can be placed on a desk, the camera does not shake during focusing and shooting. This allows for stable observation.

  • Other measuring instruments

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Wide Range Zoom Triple Eye Stereo Microscope M511FN-0745S-RT3

Wide Range Zoom Triple Eye Stereo Microscope M511FN-0745S-RT3

Wide Range Zoom Type Three-Eye Stereo Microscope (with Smooth Arm) / Model Number M511FN-0745S-RT3

A dual optical path design that allows for simultaneous binocular observation and camera shooting.

  • Other measuring instruments

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Measure surface shapes quickly and concisely! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary retuning, sample approach, and sample plane tilt correction are automatically performed by the software, so once the cantilever is brought close to the sample, the scan begins. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can also be conducted at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we employ various tools such as electron microscopes and component analysis devices to address our customers' inquiries. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

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  • Structural Survey

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head is available in two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe replacement can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and fully automatic inline machines *For more details, please download the PDF or feel free to contact us.

  • Other measuring instruments
  • Non-destructive testing
  • Other analytical equipment

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Infrared microscope "IR-1300RL"

Infrared microscope "IR-1300RL"

An infrared reflection microscope system for measuring the dimensions of various interface parts of silicon devices with clear images.

The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark misalignment on bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark misalignment *For more details, please refer to the PDF document or feel free to contact us.

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MADE IN JAPAN! Optical-related equipment and parts 'Comprehensive Catalog'

MADE IN JAPAN! Optical-related equipment and parts 'Comprehensive Catalog'

Introducing products meticulously crafted through precise and delicate handwork, such as the air pit, major scope, image recognition lenses, and the ant-groove stage!

The precision and optical equipment manufactured by Mirac Optical is all MADE IN JAPAN. The products, crafted through meticulous and delicate handwork that can be said to be a traditional Japanese art, are ones that we can confidently recommend to our customers in terms of quality, precision, and durability. In the "Comprehensive Catalog of Optical Related Equipment and Parts," you will find a unique variety that accommodates various positioning needs, the smooth sliding "Ant Stage," the indispensable microscope "Major Scope" for various industrial production, processing, and inspection processes, high-quality and low-cost peripheral devices that enhance lens functionality such as "Image Recognition Lenses," and the "Air Pit," which eliminates concerns about adhesion of scratches, dirt, fingerprints, and hand oils during suction and transport, among many others. [Contents Included] ■ Ant Stage ■ Major Scope ■ Image Recognition Lenses ■ Air Pit *For more details, please download the PDF or contact us.

  • Other analytical equipment

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Comprehensive catalog of the ant groove type XY stage and examples of improvements in inspection equipment.

Comprehensive catalog of the ant groove type XY stage and examples of improvements in inspection equipment.

A comprehensive catalog of stages and microscopes, along with examples of improvements in inspection equipment, will be given as a set!

A free set of the "comprehensive catalog" and "technical materials summarizing examples of inspection equipment improvements" is being offered by Milac Optical, a manufacturer of optical equipment that produces ant-style stages, measuring tool microscopes, and image recognition lenses! The ant-style stage is characterized by its smooth and moist sliding and high durability, and it is widely used as a positioning component and mechanical element in the FA (Factory Automation) field. The improvement case introduces a successful example of miniaturizing inspection equipment and enabling XY movement using a compact ant-style stage. [Contents] ■ Ant-style stage ■ Measuring tool microscope - MajorScope ■ Image recognition lens ■ Vacuum tweezers - AirBit *For more details, please download the PDF or feel free to contact us. *The comprehensive catalog is a digest version. If you would like the complete version, please request it through our contact form.

  • Other analytical equipment

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[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

It is possible to perform 3D measurements of the surface irregularities of samples and surface shape measurements through transparent objects!

We offer contract analysis using the shape measurement laser microscope "VK-X200." Observations and measurements are conducted using a 408nm laser. The measurement results are based on a traceability system that connects to national standards, allowing the measurement equipment to be used for non-destructive testing. With the laser microscope, 3D measurements of the surface roughness of samples can be performed, as well as measurements of the thickness of transparent materials and surface shapes through transparent materials. 【Features】 ■ Capable of 3D measurement of the surface roughness of samples ■ Capable of measuring the thickness of transparent materials and surface shapes through transparent materials ■ Observations and measurements conducted using a 408nm laser ■ Measurement results are based on a traceability system that connects to national standards ■ Can be utilized as non-destructive measurement equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Analysis and prediction system

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through-analysis of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) affected by the built-in potential of the PN junction are detected using the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. 【Analysis methods using EBIC】 ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment

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Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

This is an introduction to "Crack Observation Using Desktop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. Even small cracks that may be overlooked in optical microscopy can be clearly identified through SEM observation. Moreover, with a desktop SEM, there is no need for conductive treatment, allowing for quick and detailed observation. 【Features】 ■ No deposition required ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

We have published cross-sectional observations in bright field mode and normal/standard mode!

This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM, but by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of magnets in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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