microscope Product List and Ranking from 30 Manufacturers, Suppliers and Companies | IPROS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. サンコー 法人営業部 Tokyo//others
  2. エフティーエス Tokyo//Trading company/Wholesale
  3. アイテス Shiga//others
  4. 4 ブルカージャパン オプティクス事業部 Kanagawa//others
  5. 4 スリーアールソリューション Fukuoka//Trading company/Wholesale
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microscope Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. Digital Microscope "Dino-Lite for Monitor" *Demo unit available サンコー 法人営業部
  2. Digital microscope "Dino-Lite Portable" *Demo unit available サンコー 法人営業部
  3. Digital Microscope "Dino-Lite Zoom Series" *Demo unit available サンコー 法人営業部
  4. 4 Digital Microscope "Dino-Lite High Magnification Series" *Demo unit available サンコー 法人営業部
  5. 4 Brinell Reading Device Highlight Brinell Scope [0.01mm] エフティーエス

microscope Product List

1～30 item / All 96 items

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Handy Digital Microscope / Model Number M1375RMS-16BK

Handy Digital Microscope / Model Number M1375RMS-16BK

A digital microscope with an adjustable LCD angle that can be operated with one hand.

● This is a microscope with a monitor that can magnify up to 300 times optically. ● The optical zoom ranges from 20x to 300x, and the digital zoom can be adjusted up to 4x. ● It has a built-in 3-inch large LCD monitor. ● It comes with a dedicated stand that allows you to secure the camera body for use. ● The LCD screen can be rotated to change to a more viewable orientation. ● It has 8 built-in LEDs that allow you to capture bright images of the subject. ● By connecting a video cable, you can output the video to a monitor. ● It is economical as it can be repeatedly charged with a lithium-ion battery. <Notes> * The magnification displayed on the product's monitor is approximately 7x at minimum and approximately 29x at maximum. * When capturing images at a resolution of 5M with this product and displaying them on a 24-inch monitor set to a resolution of 1920x1080 pixels, the magnification will be approximately 380x. * A separately sold microSD (HC) card (up to 32GB) is required for capturing images. * If the lens part is placed snugly against the subject, it will focus at two points: high magnification and low magnification. * The magnification of the optical zoom is not displayed on the screen. * You cannot view the subject at arbitrary magnifications.

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Digital Microscope (with HDMI high-definition output) / M1375MP-17BK

Digital Microscope (with HDMI high-definition output) / M1375MP-17BK

A digital microscope capable of high-quality HDMI output. It also allows for video recording in Full HD.

A digital microscope capable of high-quality HDMI output. It also allows for video recording in Full HD. ■ Digital microscope that can capture and output in high quality ■ Easy focusing and shooting Stationary design Since it is a stationary model that can be placed on a desk, the camera does not shake during focusing and shooting. This allows for stable observation.

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Wide Range Zoom Triple Eye Stereo Microscope M511FN-0745S-RT3

Wide Range Zoom Triple Eye Stereo Microscope M511FN-0745S-RT3

Wide Range Zoom Type Three-Eye Stereo Microscope (with Smooth Arm) / Model Number M511FN-0745S-RT3

A dual optical path design that allows for simultaneous binocular observation and camera shooting.

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Measure surface shapes quickly and concisely! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary retuning, sample approach, and sample plane tilt correction are automatically performed by the software, so once the cantilever is brought close to the sample, the scan begins. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can also be conducted at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we employ various tools such as electron microscopes and component analysis devices to address our customers' inquiries. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head is available in two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe replacement can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and fully automatic inline machines *For more details, please download the PDF or feel free to contact us.

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Infrared microscope "IR-1300RL"

Infrared microscope "IR-1300RL"

An infrared reflection microscope system for measuring the dimensions of various interface parts of silicon devices with clear images.

The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark misalignment on bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark misalignment *For more details, please refer to the PDF document or feel free to contact us.

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MADE IN JAPAN! Optical-related equipment and parts 'Comprehensive Catalog'

MADE IN JAPAN! Optical-related equipment and parts 'Comprehensive Catalog'

Introducing products meticulously crafted through precise and delicate handwork, such as the air pit, major scope, image recognition lenses, and the ant-groove stage!

The precision and optical equipment manufactured by Mirac Optical is all MADE IN JAPAN. The products, crafted through meticulous and delicate handwork that can be said to be a traditional Japanese art, are ones that we can confidently recommend to our customers in terms of quality, precision, and durability. In the "Comprehensive Catalog of Optical Related Equipment and Parts," you will find a unique variety that accommodates various positioning needs, the smooth sliding "Ant Stage," the indispensable microscope "Major Scope" for various industrial production, processing, and inspection processes, high-quality and low-cost peripheral devices that enhance lens functionality such as "Image Recognition Lenses," and the "Air Pit," which eliminates concerns about adhesion of scratches, dirt, fingerprints, and hand oils during suction and transport, among many others. [Contents Included] ■ Ant Stage ■ Major Scope ■ Image Recognition Lenses ■ Air Pit *For more details, please download the PDF or contact us.

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Comprehensive catalog of the ant groove type XY stage and examples of improvements in inspection equipment.

Comprehensive catalog of the ant groove type XY stage and examples of improvements in inspection equipment.

A comprehensive catalog of stages and microscopes, along with examples of improvements in inspection equipment, will be given as a set!

A free set of the "comprehensive catalog" and "technical materials summarizing examples of inspection equipment improvements" is being offered by Milac Optical, a manufacturer of optical equipment that produces ant-style stages, measuring tool microscopes, and image recognition lenses! The ant-style stage is characterized by its smooth and moist sliding and high durability, and it is widely used as a positioning component and mechanical element in the FA (Factory Automation) field. The improvement case introduces a successful example of miniaturizing inspection equipment and enabling XY movement using a compact ant-style stage. [Contents] ■ Ant-style stage ■ Measuring tool microscope - MajorScope ■ Image recognition lens ■ Vacuum tweezers - AirBit *For more details, please download the PDF or feel free to contact us. *The comprehensive catalog is a digest version. If you would like the complete version, please request it through our contact form.

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[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

It is possible to perform 3D measurements of the surface irregularities of samples and surface shape measurements through transparent objects!

We offer contract analysis using the shape measurement laser microscope "VK-X200." Observations and measurements are conducted using a 408nm laser. The measurement results are based on a traceability system that connects to national standards, allowing the measurement equipment to be used for non-destructive testing. With the laser microscope, 3D measurements of the surface roughness of samples can be performed, as well as measurements of the thickness of transparent materials and surface shapes through transparent materials. 【Features】 ■ Capable of 3D measurement of the surface roughness of samples ■ Capable of measuring the thickness of transparent materials and surface shapes through transparent materials ■ Observations and measurements conducted using a 408nm laser ■ Measurement results are based on a traceability system that connects to national standards ■ Can be utilized as non-destructive measurement equipment *For more details, please refer to the PDF document or feel free to contact us.

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Even with SiC power devices, we can provide consistent support for cross-section preparation of specific areas, observation of diffusion layer shapes, as well as wiring structure and crystal structure analysis!

Our company conducts observations of the diffusion layer of SiC MOSFETs using LV-SEM and EBIC methods. We can perform cross-section fabrication of specific areas using FIB, shape observation of the diffusion layer using LV-SEM/EBIC, and further through-analysis of wiring structures and crystal structures using TEM, all applicable to SiC power devices. In "LV-SEM diffusion layer observation," secondary electrons (SE2) affected by the built-in potential of the PN junction are detected using the Inlens detector. The shape of the diffusion layer can be visualized through SEM observation of the FIB cross-section. 【Analysis methods using EBIC】 ■ PEM/OBIRCH defect location identification ■ FIB cross-section processing ■ Low acceleration SEM ■ EBIC analysis ■ TEM *For more details, please refer to the PDF document or feel free to contact us.

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Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Observation of cracks using a tabletop SEM (Scanning Electron Microscope)

Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.

This is an introduction to "Crack Observation Using Desktop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. Even small cracks that may be overlooked in optical microscopy can be clearly identified through SEM observation. Moreover, with a desktop SEM, there is no need for conductive treatment, allowing for quick and detailed observation. 【Features】 ■ No deposition required ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope).

We have published cross-sectional observations in bright field mode and normal/standard mode!

This document introduces the cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope). Samples with magnetic properties, such as neodymium magnets, cannot be observed in a magnetized state using SEM, but by applying demagnetization treatment, SEM observation and elemental analysis can be performed. Please take a moment to read it. 【Contents】 ■ Demagnetization of neodymium magnets and cross-sectional observation using SEM (Hitachi High-Tech TM3030Plus) - Demagnetization treatment (SEM observation of magnets in a magnetized state is not possible, so demagnetization is performed) - Cross-sectional observation - Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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Cross-sectional observation of large samples (expansion valve)

Cross-sectional observation of large samples (expansion valve)

Introducing a case study on the cross-section preparation of large samples (65mm × 28mm) and the observation of their internal structures!

We present an observation case of a large sample (expansion valve) measuring 65mm × 28mm. This sample uses magnetic materials, and due to distortion in the images during SEM observation, we primarily conducted observations using an optical microscope. From the appearance and X-ray radiographic observation, it was found that there are some areas that are not visible in the X-ray. 【Overview】 ■ Appearance and X-ray radiographic observation ■ Cross-sectional observation using an optical microscope *For more details, please refer to the PDF document or feel free to contact us.

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis is possible even at low acceleration voltages. 【Features】 ■ High-resolution SEM images with a high-brightness electron gun ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained using two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without coating *For more details, please refer to the PDF document or feel free to contact us.

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Observation of the coating film

Observation of the coating film

Introducing examples of observation and analysis of coating films used in various products, including "microtomes" that can perform planar inclined cutting!

We will introduce examples of observation and analysis of coating films used in various products such as automobiles and mobile phones. The "Triple Ion Polisher (CP)" can process samples containing both hard and soft materials without causing damage, while the "Microtome" is capable of not only producing cross-sections but also performing planar inclined cutting. Additionally, the "Desktop Oblique Cutting Machine" can extract sample surfaces that are 6 to 300 times the original thickness as surface information, and the "Desktop SEM (Scanning Electron Microscope)" has a mode for observation under low vacuum (charge reduction), allowing for the observation and elemental analysis of samples that release volatile components. [Observation of Plastic Coating (Mobile Phone Case)] - Triple Ion Polisher (CP) - Microtome - Desktop Oblique Cutting Machine - Desktop SEM (Scanning Electron Microscope) *For more details, please refer to the PDF document or feel free to contact us.

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Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!

We would like to introduce our ultrasonic microscope, the SAM (Scanning Acoustic Microscope). It is highly effective in detecting defects in the internal conditions and adhesion states of semiconductor packages, substrates, and electronic components. Observation can be performed non-destructively, and defects such as delamination can be detected from the reflected waves of the ultrasonic waves incident on the sample. 【Specifications (excerpt)】 ■ Pulse Receiver: 500MHz ■ Observation Methods: Supports both reflection and transmission methods ■ Acoustic Lenses/Reflection Method: 15, 25, 30, 50, 80, 100, 230MHz ■ Acoustic Lenses/Transmission Method: 15, 25, 30, 50, 100MHz *For more details, please refer to the PDF document or feel free to contact us.

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Ultrasonic microscope observation of semiconductor packages

Ultrasonic microscope observation of semiconductor packages

Ultrasonic microscope observation of transistors! It is possible to check the delamination conditions at various locations even at the same focus.

We would like to introduce the ultrasonic microscope observation of semiconductor packages that we conduct. Due to storage conditions and mounting conditions, delamination can occur between the metal parts (die pad) and the package resin in semiconductor packages. Delamination inside the package is a defect that significantly affects product quality, but it cannot be confirmed from the appearance. By using an ultrasonic microscope, we can clearly capture the internal structure of the package and contribute to reliability evaluation. 【Features】 ■ Ultrasonic microscope observation from the chip side - By changing the focal position, areas that were previously not visible can be seen, even with the same sample. ■ Ultrasonic microscope observation from the die pad side - Delamination conditions can be confirmed at various locations, even with the same focus. *For more details, please download the PDF or feel free to contact us.

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Wireless Digital Microscope '3R-WM601WIFI'

Wireless Digital Microscope '3R-WM601WIFI'

Achieving wireless operation! It excels even in environments where the cord made it difficult to use the microscope.

The "3R-WM601WIFI" is a wireless digital microscope that displays images captured by the microscope on a tablet or smartphone with WiFi functionality. Captured data can also be saved directly within the device. Additionally, it supports both wireless and wired connections, allowing you to choose the connection method according to your usage environment, such as using a wired connection in environments with wireless restrictions. 【Features of the dedicated app】 ■ Can compare with dual screen display ■ Allows continuous measurement within the same image ■ Measured values can be used in other images ■ Can save correction results ■ Scale display is possible *For more details, please refer to the PDF document or feel free to contact us.

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Confocal Microscopic Laser Raman "SENTERRA II"

Confocal Microscopic Laser Raman "SENTERRA II"

[Technical Data Presentation] Achieving both high sensitivity performance and high frequency accuracy! A compact and robust distributed micro-Raman system.

The "SENTERRA II" is a high-performance system unique to Bruker, capable of handling everything from routine analyses such as quality control to cutting-edge research fields. In typical Raman microscopes, the spectrometer is mostly a separate system from the microscope, requiring a significant amount of time to maintain performance. This product is a compact and robust integrated system that combines the excitation laser, spectrometer, and microscope, achieving high performance and stability through its efficient optical design. Additionally, it supports operators smoothly and accurately to obtain results quickly. It guides the data measurement process step by step, from visual observation of samples to confirming spectral quality and setting measurement areas. [Features] - Highly automated various functions and efficient operability - Compact and robust design - Efficiency and flexibility *For more details, please refer to the PDF materials or feel free to contact us.*

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FT-IR and QCL Microscope "HYPERION II Series"

FT-IR and QCL Microscope "HYPERION II Series"

A research and development FT-IR microscope with flexible expandability. It is possible to integrate imaging functions using QCL infrared lasers into a single device.

HYPERION II is a technological innovation in infrared microscopy. It has achieved diffraction-limited infrared imaging and set a standard in micro ATR. Furthermore, it is the world's first system to integrate both FT-IR microscopy and infrared laser imaging microscopy (ILIM) functions in a single device across all measurement modes: transmission, reflection, and ATR. *For more details, please refer to the PDF document or feel free to contact us.*

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[Technical Data] High-Throughput Screening of Surface Contamination

[Technical Data] High-Throughput Screening of Surface Contamination

A dramatic improvement in operational efficiency is expected, as well as new applications!

The infrared microscope "HYPERION II" supports infrared laser imaging using QCL in addition to conventional micro FT-IR measurements. This document includes topics such as "QA/QC of precision machinery using FT-IR," "rapid detection of Regions of Interest (ROI)," and "detection of ROI using infrared laser imaging." The combination of QCL and FT-IR enables the swift detection of ROIs and more accurate qualitative analysis based on that information. [Contents] ■ QA/QC of precision machinery using FT-IR ■ Rapid detection of Regions of Interest (ROI) ■ Benefits of the combination of FT-IR and QCL ■ Detection of ROI using infrared laser imaging ■ Improved reliability of analysis using FT-IR ■ FT-IR and laser imaging: a powerful combination *For more details, please refer to the PDF document or feel free to contact us.

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[Technical Data] Forensic Analysis of Automotive Paint Samples Using QCL and FT-IR

[Technical Data] Forensic Analysis of Automotive Paint Samples Using QCL and FT-IR

It is possible to analyze even tiny fragments of paint! In fact, it contributes to identifying accident vehicles.

The infrared microscope is one of the analytical tools capable of identifying the composition of microscopic objects and has become essential in forensic evidence analysis. The analysis method introduced in this document, using Bruker's "HYPERION II-ILIM System," combines IR laser imaging with micro FT-IR measurements, significantly reducing analysis time while further improving the quality of analysis. Please feel free to download and take a look. [Contents] ■ Differences in light sources used for IR laser imaging and FT-IR ■ Analysis method combining IR laser imaging and FT-IR ■ Application example: Automotive paint chips ■ Game changer: Achieving IR laser imaging and FT-IR measurements with a single device ■ Measurement results: Improved efficiency and reliability *For more details, please refer to the PDF document or feel free to contact us.

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Digital microscope "Dino-Lite Edge Series" *Demo unit available

Digital microscope "Dino-Lite Edge Series" *Demo unit available

Uneven objects can also be in focus over a wide range! A digital microscope that is ideal for electronic devices and biomedicine.

The "Dino-Lite Edge Series" is a digital microscope that achieves both ease of use and high quality through groundbreaking new features and designs. Operation is simple. You can easily obtain images without distortion, color shifts, or focus misalignment. It can be used for inspecting a wide range of subjects, including objects in liquids, delicate precision instruments that cannot be touched, and electronic components. 【Features】 ■ EDOF (Enhanced Depth of Field) function that keeps the entire image in focus even with depth ■ EDR (Enhanced Dynamic Range) function that corrects for whiteout and dark area distortion ■ AMR (Automatic Magnification Reading) function that synchronizes monitor and magnification adjustments ■ Focus bar with auto and manual focus ■ Customization options through the removal and exchange of tip attachments Demo units are available. For more details, please refer to the catalog. Feel free to contact us with any inquiries.

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Digital Microscope "Dino-Lite for Monitor" *Demo unit available

Digital Microscope "Dino-Lite for Monitor" *Demo unit available

High-definition HDMI/DVI and VGA/D-Sub output compatible microscope for monitor connection.

The "Dino-Lite Monitor Series" is a digital microscope that connects directly to the HDMI or DVI port of a monitor or TV, allowing images to be displayed without going through a computer. It enables observation in 720p digital HD ultra-high definition. Since it does not require a computer, you can easily and quickly start your work. Additionally, you can freeze the image by pressing a button on the main unit. 【Features】 ■ HDMI/DVI ultra-high definition digital output ■ D-Sub/VGA high-quality output ■ Precision die-cast body made of aluminum alloy - Extremely high rigidity and enhanced durability For more details, please refer to the catalog or feel free to contact us.

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Digital Microscope "Dino-Lite Zoom Series" *Demo unit available

Digital Microscope "Dino-Lite Zoom Series" *Demo unit available

Observe and capture objects non-contact! Digital microscope equipped with a one-touch capture button.

The "Dino-Lite Telephoto Series" is a digital microscope that allows observation and recording from a distance of about 50mm from the subject. It can be used for various professional applications, such as inspecting objects in narrow spaces where the main unit cannot fit, examining objects in liquids, and checking parts of precision equipment that should not be touched. 【Features】 ■ Non-contact observation and photography of subjects ■ Equipped with a one-touch capture button ■ New body with magnification lock mechanism ■ Removable tip model with interchangeable adapters ■ Calibration for measurements is possible - Can enhance measurement accuracy For more details, please refer to the catalog or feel free to contact us.

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Digital microscope "Dino-Lite Portable" *Demo unit available

Digital microscope "Dino-Lite Portable" *Demo unit available

We have demo units available. Please inquire. The Dino-Lite comes with a built-in battery monitor. It is a digital microscope that can be used anywhere you carry it.

The "Dino-Lite Portable Series" is a digital microscope that comes with a built-in battery recorder with a portable LCD monitor, allowing you to carry it to your desired location and use it whenever you want. You can record still images and videos directly onto an SD card on-site without a computer. It is perfect for fieldwork. 【Features】 ■ Magnification from 10x to 230x ■ Equipped with white LED lights ■ Functions for capturing videos and still images to SDHC cards (up to 16GB) and TV output ■ Built-in battery that can be charged via AC or USB For more details, please refer to the catalog or feel free to contact us.

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Tohoku University Technology: Optical information apparatus and microscope system: T15-198

Tohoku University Technology: Optical information apparatus and microscope system: T15-198

Rapid obtaining of optical information in the depth direction to create 3D optical image!

Laser scanning microscopy, used for observing a sample by scanning a laser focal spot and detecting reflecting, scattering, or fluorescence signals from a target can be increased acquisition speed of 2D images by high-speed raster scanning of a laser beam. But the rapid acquisition of 3D images is substantially restricted due to the need of changing the moving observation plane. 　Using the present invention can be possible the optical 3D imaging acquired at once without moving the optical system or target, because optical information along the optical axis obtained in different lateral position on the detector by separately concentrating the lights.

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