FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis is possible even at low acceleration voltages. 【Features】 ■ High-resolution SEM images with a high-brightness electron gun ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained using two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without coating *For more details, please refer to the PDF document or feel free to contact us.

Analysis and prediction system