Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
This is an introduction to "Crack Observation Using Desktop SEM (Scanning Electron Microscope)." In the evaluation of product reliability, cross-sectional observation of cracks is essential. Even small cracks that may be overlooked in optical microscopy can be clearly identified through SEM observation. Moreover, with a desktop SEM, there is no need for conductive treatment, allowing for quick and detailed observation. 【Features】 ■ No deposition required ■ Easy visibility of crystal grains ■ Fine cracks are easily visible *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
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