It is possible to perform 3D measurements of the surface irregularities of samples and surface shape measurements through transparent objects!
We offer contract analysis using the shape measurement laser microscope "VK-X200." Observations and measurements are conducted using a 408nm laser. The measurement results are based on a traceability system that connects to national standards, allowing the measurement equipment to be used for non-destructive testing. With the laser microscope, 3D measurements of the surface roughness of samples can be performed, as well as measurements of the thickness of transparent materials and surface shapes through transparent materials. 【Features】 ■ Capable of 3D measurement of the surface roughness of samples ■ Capable of measuring the thickness of transparent materials and surface shapes through transparent materials ■ Observations and measurements conducted using a 408nm laser ■ Measurement results are based on a traceability system that connects to national standards ■ Can be utilized as non-destructive measurement equipment *For more details, please refer to the PDF document or feel free to contact us.
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【Application Examples (Excerpt)】 ■Function: Appearance and Gloss ■Detailed Description: Light reflection, scattering, glare, luxury feel, vividness ■Observation Targets: Plated surfaces, mirror surfaces, steel plates ■Evaluation Parameters: Rq, Ra, Rku *For more details, please refer to the PDF materials or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.