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Visualizing oral biofilms to launch lifestyle disease prevention from dentistry.
Visualizing oral biofilms to prevent lifestyle-related diseases starting from dentistry. It allows for a wide examination of samples with a low magnification lens and detailed observation of areas of interest with a high magnification lens, making it easy for anyone to use.
Can be added to your existing optical microscope! Achieve super-resolution imaging at a low cost!
The Abberior-made super-resolution STED microscope unit STEDYCON can be easily upgraded to a STED microscope by attaching it to the C-mount of existing fluorescence microscopes. It achieves imaging with a resolution of 30nm while keeping initial investment low. It is equipped with four lasers, multiple interchangeable pinholes, and up to four APDs. Utilizing patented technology, the laser optics are maintenance-free. 【Features】 - No optical adjustment required, easy setup - Equipped with a pulsed laser that significantly reduces light intensity - Compact and robust scan head achieved with a four-mirror design - Compatible with optical microscopes from Olympus, Nikon, Zeiss, and Leica *For more details, please refer to the documentation. Feel free to contact us with any inquiries.
Introduction of atomic force microscopes (AFM) capable of customized proposals for various systems, from research use to production sites.
Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have models such as "CoreAFM," which features an active vibration isolation mechanism and supports various measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever exchange using dedicated tools. Customization options are available, ranging from small models for research settings to large stage models for production environments, as well as automated systems for quality control. 【Product Lineup (Excerpt)】 ◎ Tabletop Atomic Force Microscope "CoreAFM" ■ Equipped with active vibration isolation and wind protection ■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" ■ Integrates controller, XY stage, wind protection, and vibration isolation ■ Features a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we offer. You can view detailed information by downloading the PDF.
A microscope with various possible combinations! We also introduce a lens camera that can transmit wirelessly!
The "Major Scope" is an essential microscope for various industrial production, processing, and inspection processes. It is a highly valuable product that can be used as peripheral equipment to optically support positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications from visual inspection to monitor observation, image measurement, and digital camera photography. 【Major Scope Features】 - The optical system provides a bright and wide actual field of view with a completely upright image microscope. - Designed with a long working distance and parfocality suitable for industrial use (objective lenses 2× to 10×). - By simply replacing the eyepiece micrometer, it can accommodate various applications such as measurement, inspection, centering, and positioning. - The objective lens features a gold frame mechanism that allows for easy fine magnification correction. Additionally, when attached to the Major Scope, the "Digital Catch" allows for measurement, inspection, and positioning while projecting the object and scale glass onto a tablet device or similar screen. *For more details, please refer to the PDF document or feel free to contact us.
From product selection to combination proposals and even on-site verification, everything is free!
At Mirac Optical Co., Ltd., our product utilization proposal and verification service is handled individually by our design engineers, rather than sales representatives, to address various concerns and inquiries from our customers. We leverage our accumulated know-how to provide the best proposals to solve your challenges. 【Recommended for those who:】 ○ Are unsure which Mirac product to choose from a wide range… ○ Want suggestions for the best combination of products that match the working conditions and target workpieces ○ Will send the actual workpiece and would like to test it with the appropriate equipment configuration *For more details, please contact us.
![[Case Study] Examples of Microscope Use](https://image.www.ipros.com/public/product/image/666/2000179243/IPROS07259804965685962386.png?w=280&h=280)
We will introduce examples of use in pin shape inspections and burr inspections of rubber products.
Microscopes are essential for various industrial production, processing, and inspection processes, and we would like to introduce some examples of their use. They are highly valuable products that can also be utilized as peripheral equipment to optically support positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, they can be employed for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. [Usage Examples] - Pushpin shape inspection - Burr inspection of rubber products - Inspection of remaining gate removal - Crack inspection equipment - Pin tip angle inspection *For more details, please download the PDF or contact us.
A microscope that is essential for various industrial production, processing, and inspection processes! Comprehensive catalog available for free!
The major scope is an essential microscope for various industrial production, processing, and inspection processes. It is also a highly valuable product as a peripheral device that optically supports positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. We offer a wide variety of models and accessories to meet diverse needs at low prices. 【Features】 - The optical system provides a bright and wide actual field of view with a completely upright image microscope. - Designed for industrial use with a long working distance and parfocal (objective lenses 2× to 10×). - By simply replacing the eyepiece micrometer, it can accommodate various measurements, inspections, centering, and positioning. - The objective lens has a gold frame mechanism that allows for easy fine magnification correction. *For more details, please download the PDF or contact us.
Introducing the flow from optical microscope observation, which has a wide range of applications, to SEM observation and EDX elemental analysis!
We will introduce the flow from basic and widely applicable optical microscopy observations to SEM observations and EDX elemental analysis. Observation using optical microscopy is one of the fundamental observation techniques and allows for quick examination of general shapes. Additionally, its feature is that it provides color information, making it useful for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "SEM observations" and "EDX elemental analysis" using photos and graphs. Please take a moment to read it. 【Contents】 ■ Observation using optical microscopy ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.
![[Information] Differentiating the Use of Optical Microscopes and SEM](https://image.www.ipros.com/public/product/image/e70/2000701513/IPROS38819552626942510479.png?w=280&h=280)
Comparing optical microscopes and SEM using the same sample! I will explain the advantages and disadvantages.
Optical microscopes and SEMs (scanning electron microscopes) are often used for sample observation, but each has its own characteristics, so it is important to choose the appropriate device according to the purpose. In this document, we compare optical microscopes and SEMs using the same sample and introduce the commonly mentioned advantages and disadvantages. Please take a moment to read it. [Contents] ■ Characteristics of Optical Microscopes ・Advantages / Disadvantages ・Recommended for this type of observation ■ Characteristics of SEM (Scanning Electron Microscope) ・Advantages / Disadvantages ・Recommended for this type of observation *For more details, please refer to the PDF document or feel free to contact us.
Improved resolution of TEM and STEM! Performance has been significantly enhanced, allowing EDS analysis with four detectors.
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, including the capability for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which allows for the integration of multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration Voltage: 200kV, 80kV ■ TEM Information Limit: ≦0.11nm ■ STEM Resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・Integrates multiple frames while correcting for drift *For more details, please download the PDF or feel free to contact us.
It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.
"LUMOS II" makes microscopic infrared spectroscopy and imaging analysis easier, faster, and more comfortable. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covers large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.
Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!
Are you having trouble with micro material analysis? - Can't prepare liquid nitrogen, it's a hassle. The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro IR that is easy to use for beginners. The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro IR with better image quality? - I want to try high-speed imaging functions, etc. The 'LUMOS II' makes micro infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With long working distance objectives for easy access, the fully automated electric sample stage is also one of its features. [Features] ■ Achieves high-sensitivity measurements without liquid nitrogen ■ Exceptional imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping functions: covers large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes.
【Equipped with high-speed imaging and high-speed mapping functions】FTIR imaging is now faster, more comfortable, and more accurate than ever!
"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that allows anyone to use it, from beginners to advanced users, regardless of their analytical skill level, all users can utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluations of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping capabilities: Covers wide areas in a short time ■ Superior imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.
Providing a new analysis method based on high-speed imaging and machine learning!
Bruker Japan can provide spectroscopic analysis solutions specialized in microplastics due to many years of experience. Our FT-IR and Raman microscopes are used daily by leading microplastic scientists around the world. This material clearly explains: ▶ The effectiveness of micro-infrared and Raman spectroscopy ▶ Why Bruker products are suitable for microplastic analysis *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibiting at JASIS2023◆ Please check the basic information below for details about the exhibition.
