アイテス List of Products and Services

The biggest advantage of angled CT is that it allows for non-destructive CT observation. It is suitable for obtaining planar information and can provide information for each layer in a multilayer substrate. Additionally, by using a length measurement tool, it is also possible to measure lengths. In our measurements, we observed a difference of about 7-14% compared to the results from optical microscopy, but it seems effective for those who want to understand internal structures non-destructively. Please feel free to contact us when needed. 【Features】 ■ Non-destructive CT observation ■ Suitable for obtaining planar information ■ Capable of obtaining information for each layer in multilayer substrates *For more details, please refer to the PDF document or feel free to contact us.

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Polyethylene resin is a versatile plastic that is commonly found and used in many applications. Depending on the application, the reaction processes (synthesis/polymerization) differ, such as soft types and hard types. Due to the differences in synthesis/polymerization, it is divided into low-density polyethylene (LDPE) and high-density polyethylene (HDPE). Our company has analyzed the subtle spectral differences using FT-IR. For more details, please refer to the PDF download below. 【Overview】 ■Polyethylene polymerization process ■IR measurement results ■Spectral overlay and spectral analysis ■Testing and evaluation analysis services *For more details, please refer to the PDF document or feel free to contact us.

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• Other services and technologies

The materials that make up the product vary, but if there is significant or uneven internal stress during the manufacturing process, it can lead to issues such as deformation, cracking, and reduced properties during use and in the operating environment. By using 'WPA (Wide Polarization Analysis)', it is possible to understand internal stress and strain conditions by evaluating the orientation, strain, and birefringence of the material. Please feel free to consult with us. 【Features】 ■ Ability to understand internal stress and strain conditions ■ Clarification of material strain and birefringence from a molecular perspective ■ Analysis of defects and theories using multiple methods in a matrix - Raman spectroscopy (qualitative/strain/crystallinity), XRD (X-ray diffraction), AFM/SEM/TEM (crystal structure observation), DSC (degree of crystallization), etc. *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

The quality of diamonds is determined by the 4Cs (Cut, Color, Carat, Clarity). Clarity refers to the degree of inclusions and blemishes. I took a look at the clarity using a microscope, and I would like to share my findings. Even items that appear clean at first glance may have inclusions or cracks when magnified. The microscope allows us to observe tiny defects that cannot be seen with the naked eye. Additionally, we also conduct inspections and observations of semiconductor electronic components and silicon chips using the microscope. Please feel free to contact us if you need our services. 【Features】 ■ Capable of observing tiny defects that cannot be seen with the naked eye using a microscope ■ Inspections and observations of semiconductor electronic components and silicon chips are also conducted *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment
• Measurement and Analysis Equipment

We would like to introduce the internal condition of aluminum electrolytic capacitors that have malfunctioned due to aging degradation, which was confirmed using X-ray CT. In degraded products, the internal pressure rises due to gas generated from the decomposition of the electrolyte, and as degradation progresses, there is a risk that the electrolyte may spout out due to the opening of the pressure relief valve. Additionally, it is believed that the gradual volatilization of the electrolyte occurs due to the deformation of the rubber cap, leading to eventual capacity loss and open failure. 【Overview】 ■Appearance Comparison - Conducted visual inspection of normal and degraded products. ■Internal Comparison using X-ray CT - Conducted internal observation of normal and degraded products using X-ray CT. *For more details, please refer to the PDF document or feel free to contact us.

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We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, detecting Li with general EDX, excluding windowless EDX, is difficult. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

Thermal analysis is a method for identifying defective areas by detecting the heat generated at leak points due to applied voltage using a high-sensitivity InSb camera. By detecting the weak heat generated from shorts and leaks with a high-sensitivity InSb camera, it is possible to non-destructively identify the failure points of electronic components such as semiconductors. Furthermore, non-destructive observation can also be performed using X-ray inspection equipment. 【Features】 ■ Identifying defective areas by detecting the heat generated at leak points with a high-sensitivity InSb camera ■ Analyzing samples in a non-destructive state, and analyzing electronic components that are difficult to analyze with OBIRCH or emission methods is also possible ■ By using the lock-in function to obtain phase information, it is possible to accurately identify the heat generation points *For more details, please refer to the PDF document or feel free to contact us.

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At AITES, we are conducting a structural analysis of Nylon 6.10. Nylon possesses flexibility and a texture similar to silk, while also having high strength and durability that natural fibers lack, being "stronger than steel and finer than spider silk." We will elucidate these characteristics at the molecular level using our FT-IR and pyrolysis GC-MS. 【Nylon 6.10 Interfacial Polymerization Reaction Mechanism】 1. Electron withdrawal by chlorine leads to a deficiency of electrons in adjacent carbon. 2. Non-bonding electrons from amine attack the carbon nucleophilically. 3. An oxygen atom is activated to form an unstable intermediate. 4. Hydrogen chloride is eliminated, forming an amide bond. 5. Interfacial polymerization progresses, resulting in polymerization. *For more details, please refer to the PDF document or feel free to contact us.

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We conduct "pigment and polymer analysis using MALDI-TOFMS." With "MALDI-TOFMS," it is possible to obtain molecular weight information for insoluble substances such as pigments and large molecules, molecular weight information for synthetic polymers, and information on terminal groups. Please feel free to contact us for mass confirmation of synthetic compounds or for structural analysis in combination with other analytical methods. 【Features】 ■ Adoption of Matrix-Assisted Laser Desorption Ionization Mass Spectrometry (MALDI) ■ Ability to obtain information regarding the composition of compounds ■ Suitable for analyzing polymers that are small compared to GPC and large compared to LCMS ■ Mass numbers are detected as absolute values *For more details, please refer to the PDF document or feel free to contact us.

• Non-destructive testing

Various defects such as cracks, discoloration, delamination, deformation, and reduced material strength can occur in products and components. Many of these issues are often caused by the materials that make up the products, and analyzing these materials can sometimes lead to solutions. This document introduces methods to approach what is happening through chemistry and reaction mechanisms. [Contents] ■ Cracks (breaks), delamination ■ Discoloration, deformation ■ Chemical reaction mechanisms (example of epoxy resin curing) *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

At AITES, we conduct "Simple Measurement of Band Gap Using XPS." It is possible to simply measure the band gaps of materials and thin films with relatively wide band gaps among semiconductors and insulators using XPS. When measuring the band gap of β-Ga2O3 using the O1s peak, the band gap of β-Ga2O3 was measured to be approximately 4.9 eV, based on the difference between the O1s peak position and the energy loss edge due to the band gap. 【Features】 ■ Simple measurement can be performed using XPS ■ Simple measurement of thin films with wide band gaps, such as SiON, is also possible ■ Compatible with semiconductors other than oxide-based materials *For more details, please refer to the PDF materials or feel free to contact us.

• Other measuring instruments

There are many types of vinyl polymers, and they exhibit various properties depending on the molecular structure of their side chains. Additionally, differences in crystallinity arise from the bonding configuration of these side chains (stereoisomers). In this document, we present the results of IR analysis of representative vinyl polymers, including polyethylene, polypropylene, polystyrene, and polyvinyl chloride (PVC). Aites conducts advanced data analysis based on chemical theory, ensuring that even subtle differences are not overlooked. Please feel free to consult us at any time. [Contents] ■ Analysis Sample: Vinyl Polymers ■ IR Spectrum (ATR Method) ■ IR Spectrum Comparison (Overlay) *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

At AITES, we conduct "Authenticity Investigations (Comparative Observations)." We compare the item under investigation with genuine or standard products to examine differences in structure and to check for any silent changes. We support various observations, including visual inspections, unboxing observations, electrical property measurements, destructive and non-destructive observations, reliability testing, and material investigations. 【Features】 ■ Comparison of the item under investigation with genuine or standard products ■ Investigation of differences in structure and checks for any silent changes *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Polarizing films and light diffusion films are used in LCD products and design applications. They may deteriorate due to environmental conditions such as temperature and humidity, which can lead to a decline in their polarizing and diffusion properties, affecting LCD screens and designs. This document presents case studies analyzing the deterioration caused by temperature and humidity stress using FT-IR. [Contents] - Sample used and its properties - Deterioration analysis results of polarizing films (Comparison of IR spectra before and after testing at 70°C and 85% humidity for 1 week) - Deterioration analysis results of light diffusion films (Comparison of IR spectra before and after testing at 70°C and 85% humidity for 1 week) - Other available analytical methods *For more details, please refer to the PDF document or feel free to contact us.

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• Other services and technologies

PMMA (acrylic), PET (polyethylene terephthalate), and PC (polycarbonate) are utilized in many applications, taking advantage of their characteristic transparency. They are essential materials for industrial products such as peripheral components of liquid crystal displays, protective films for mobile device screens, headlight covers, optical fibers, and textiles. This document presents the results of IR analysis of these raw materials (pellets). [Contents] ■ Analysis samples: Characteristics of ester/carbonate-based polymers ■ IR spectra (ATR method) ■ Spectral comparison (overlay) ■ Other related analysis services *For more details, please refer to the PDF document or feel free to contact us.

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• Other services and technologies

Aites analyzed photopolymerization initiators in UV-curable resins using GCMS and detected Irgacure 184, a type of photoinitiator (light radical polymerization initiator). There are various structures of photoinitiators, and the wavelength of light they absorb and their reaction mechanisms differ depending on their structure. Such substances cannot be identified through main component analysis like IR, making thermal desorption GCMS analysis effective. Our company conducts characterization of various materials by analyzing and identifying trace components in materials using thermal desorption GCMS. Please feel free to contact us when needed. [Examples of photoinitiators] ■ Light radical polymerization initiators ■ Photoinitiators for positive photoresists ■ Light crosslinking agents for negative photoresists *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

This document introduces the structural analysis of MEMS components. It includes "non-destructive observation of accelerometers" using X-ray tomography to observe the internal structure of the package, as well as "optical microscope and SEM observation after mechanical polishing of accelerometers" and "cross-sectional observation of microphones (CROSS BEAM FIB/SEM)." Please feel free to download and take a look. [Contents] ■ Non-destructive observation of accelerometers ■ Optical microscope and SEM observation after mechanical polishing of accelerometers ■ Cross-sectional observation of microphones (CROSS BEAM FIB/SEM) *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 47Ag and 17Cl. It includes cross-sectional observations of chip resistors, X-ray spectra of 47Ag, and mapping comparisons. [Contents] - Peak separation of 47Ag and 17Cl - X-ray spectrum of 47Ag - Mapping comparison *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Our company utilizes various surface analysis techniques to assist in resolving issues such as foreign substances, discoloration, and contamination. We conduct a wide range of analyses, from micro-regions to bulk samples, including "EDX," which is energy-dispersive X-ray analysis, "AES," which detects Auger electrons using electron beams, and "XPS," which allows for the analysis of insulators and chemical bonding states. Please feel free to contact us when you need our services. 【Analysis Methods】 ■EDX (EDS): Energy Dispersive X-ray Analysis ■AES: Auger Electron Spectroscopy ■XPS (ESCA): X-ray Photoelectron Spectroscopy ■TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis using surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results via XPS (ESCA) ■ Bonding State Analysis Results via XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results via XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Here is a case study of a silicon wafer analyzed using EBSD. A small piece was cut from the wafer, and an IPF map was obtained for a central area of 50×50 μm. The measurement area shows red, indicating the {001} plane, and the absence of grain boundaries confirms that it is a single crystal. Since the measured silicon wafer is a single crystal, the IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes. *For more details, please refer to the PDF document or feel free to contact us.*

• Other analytical equipment
• Electrical Equipment Testing

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis is possible even at low acceleration voltages. 【Features】 ■ High-resolution SEM images with a high-brightness electron gun ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained using two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without coating *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

In the evaluation of BGA and CSP solder, the area ratio of voids within the solder can be measured from transmitted X-ray image data. Furthermore, by combining mechanical polishing, a comprehensive evaluation is possible. Please feel free to consult us when needed. 【Features】 ■ Non-destructive evaluation of BGA (Ball Grid Array) solder - The area ratio (%) of voids within the solder can be measured non-destructively from images obtained through X-ray transmission observation. ■ Cross-sectional observation of CSP (Chip Size Package) and BGA (Ball Grid Array) - Cross-sectional observation through mechanical polishing allows for the observation of defects such as shrinkage cavities that are difficult to see with X-ray observation. *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

The materials that make up a product are diverse, but the performance of the product is often closely tied to the characteristics of those materials. At Aites, we provide comprehensive support from reliability testing of materials to observation and physical/chemical analysis. This document presents a case study comparing the molecular structure and thermal property changes of plastic materials before and after exposure to ultraviolet light and constant temperature and humidity conditions. [Contents] ■ Constant temperature and humidity testing, and ultraviolet irradiation (Sample: Polyethylene (PE) pellets) ■ Results of IR, Raman, and EGA analysis *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Plastic extrusion/injection molding processing is set according to the heat resistance temperature (melting point Tm) of the raw materials; however, due to the degradation and alteration of the materials, there are cases where molding becomes difficult at the specified setting temperature. By checking the melt flow rate (MFR) of plastic raw materials in pellet or powder form, it is possible to determine whether there are any changes compared to conventional products. We present a case where untreated (no load), temperature and humidity load (constant temperature and humidity test), and UV-irradiated PP (polypropylene) were injected and evaluated at a temperature of 230°C and a load of 5kg, so please take a look at the PDF download. [Evaluation Case] ■PP: Polypropylene ■8585: 85°C 85% × 336 hours ■UV: UV irradiation 253.7nm × 336 hours ■Injection time: 10 minutes (converted from 3 minutes) *For more details, please refer to the PDF document or feel free to contact us.

• Other services and technologies
• Measurement and Inspection

Epoxy resin is transparent, has a low shrinkage rate, and is often used for making cross-sections, but since it is a thermosetting resin, it generates heat during the curing process. The temperature of heat generation varies depending on the amount used and the mixing ratio of the main agent and hardener, but when embedding large samples such as printed circuit boards or touch panels, the epoxy resin can generate enough heat to deform the sample substrate. Therefore, we checked how much heat is actually generated during the curing process. For more details, please refer to the PDF download below. [Overview] ■ Temperature profile acquisition - Without heat generation prevention treatment for a large amount of resin (large container) ■ Temperature profile acquisition - With heat generation prevention treatment for a large amount of resin (large container) ■ Even with larger printed circuit boards, resin embedding is possible without cutting before embedding. *For more details, please refer to the PDF document or feel free to contact us.

• Other services and technologies

We would like to introduce a case study on cross-sectional observation of connector plating. We observed the cross-section to see how the plating condition of the connector terminals has changed due to usage. This time, we prepared cross-sectional samples from two locations with different degrees of streaks, one without streaks and one with streaks, to confirm the plating condition. As a result, it was found that compared to the area without streaks, Streak A and Streak B had uneven plating thickness. This is believed to be due to the plating being dragged during the insertion and removal of the connector, causing variations in thickness. 【Overview of Connector Plating Cross-Section】 ■ Cross-section preparation was done using a triple ion milling polisher (commonly known as CP) ■ The plating condition at the streaked locations was observed using SEM ■ Results - No streaks: Surface Au plating thickness is uniform (approximately 350nm) - Streak A: Surface Au plating thickness is uneven (approximately 490nm / approximately 350nm) - Streak B: Surface Au plating thickness is uneven (approximately 130nm / approximately 650nm) *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment
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Resins are used in many products because they are easy to mold and color. It is also true that they can easily discolor depending on the environment in which they are used, and evaluating the color system and transmittance before and after reliability testing is essential. This document presents the results of changes in the color system and transmittance of transparent resins before and after constant temperature and humidity testing. [Contents] ■ About (xyY) and L*a*b* color systems ■ Measurements before and after constant temperature and humidity testing (85°C, 85%, 168 hours) *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Whiskers are often thought to occur at solder joints or component lead areas, but they can also arise from the plated surfaces of flat components. Observing them requires a bit of technique. This document covers differences in appearance based on the equipment used, as well as differences in appearance due to sample angles and the angles of light sources and lenses. [Contents] ■ Differences in appearance based on equipment ■ Differences in appearance based on sample angles ■ Differences in appearance based on light sources and lens angles *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

In the event of a display failure on a liquid crystal panel, it is necessary to clarify the cause in order to prevent recurrence. This document presents a case study comparing panel A, which exhibited display unevenness due to temperature stress, and panel B, which showed no display issues, through chemical analysis. Aites can investigate the cause through chemical analysis of the liquid crystal interior when initial analyses, such as observations, do not reveal any issues. We can also propose analytical methods tailored to the samples and objectives beyond the techniques mentioned here. [Contents] ■ Reliability testing (80°C / dry conditions / 1000 hours) ■ Liquid crystal GC-MS analysis ■ Metal element ICP-AES analysis within the liquid crystal ■ Summary *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

In ICP emission spectroscopic analysis, multiple metal elements contained in a sample can be detected simultaneously. This document introduces examples of the analysis of trace metal elements contained in liquid crystals. It includes the principles and overview of ICP-AES analysis as well as measurement examples. Please feel free to contact us regarding the sample state or the elements to be analyzed. [Contents] ■ Principles and overview of ICP-AES analysis ■ Measurement example: Qualitative analysis of metal elements in liquid crystal panels using ICP-AES *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 22Ti and 56Ba, including analysis examples of multilayer ceramic capacitors and X-ray spectra of barium titanate (BaTiO3). [Contents] - Peak separation of 22Ti and 56Ba - Analysis example: multilayer ceramic capacitors - X-ray spectrum of barium titanate (BaTiO3) *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Our "Chemical Analysis Services" analyze various industrial products and materials, such as panel products, semiconductor products, and resin molded products, at the molecular and atomic levels. We clarify their functions, characteristics, and conditions to contribute to solving our customers' challenges. We can propose analytical methods that are suitable for the material being analyzed and the purpose of the analysis. Please feel free to consult us. 【Examples of Analysis Content】 ◎ Foreign substances in products ◎ Condition of materials used ◎ Material degradation ◎ Trace components and elements contained in materials ◎ Physical properties of products and materials due to heat

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● Evaluation/Analysis of Solar Cell Modules We conduct failure analysis and performance evaluation of solar cell modules. - Non-destructive testing: We reveal failure conditions through EL measurements and output measurements equivalent to product shipment inspections. - Destructive testing: We identify the causes of failure through cross-sectional component analysis of defective parts. ● On-site Investigation We investigate the damage to solar panels caused by natural disasters and the causes of power generation decline. - We propose appropriate methods, starting with measurements by Solament, to investigate failure conditions and causes. - Based on the investigation results, we will submit an investigation report to the insurance company.

• Solar power generation equipment

●Calibration This is a service to check whether the measurement values of the measuring instrument are appropriate. Regular calibration is necessary to maintain the reliability of the measurement values. ●Inspection You can check the health status of the measuring instrument. By quickly identifying potential sources of failure, it also helps in preventing troubles.

• Solar power generation equipment

The "eSoraMente" series is a 750V-compatible device designed for residential and small-scale solar power generation systems. It includes the eSoraMente-Z eZ-10 and the current sensor eA-10. The eZ-10 is an inspection device that probes each string P/N terminal in the junction box to detect strings with faulty panels. It applies a special detection signal to the string circuit, measures the open-circuit voltage and series resistance (impedance), and identifies strings with abnormalities. When an abnormal string is detected during the string measurement with the eZ-10, the current sensor eA-10 is connected to the eZ-10 to identify the faulty panel. The eA-10 is an inspection device that places a sensor on the surface of the panels during generation to detect cluster failures*. It senses the generation current flowing through the interconnector and alerts you with sound if there are clusters not generating power. (*Cluster failures occur due to initial defects, aging degradation, lightning damage, etc.) The eSoraMente aims for greater ease of use with its compact and simple functionality.

• Solar power generation equipment

The String Checker Solamente-Z SZ-1000 can identify solar panel failures on a string-by-string basis. The SZ-1000 is an inspection device that probes the P/N terminals of each string in the junction box to detect strings with faulty panels. It applies a special detection signal to the string circuit, measures the open circuit voltage and series resistance (impedance), and identifies strings with abnormalities. The SZ-1000 supports DC voltages up to 1500V for high voltage and extra high voltage applications. Its user-friendly operability has been inherited from the SZ-200, and it has become even easier to read with a large LCD display.

• Solar power generation equipment

Introducing the "Reliability Testing, Haze Measurement, and IR Analysis Set Menu Service." Plastic (resin) materials can discolor and deteriorate depending on the usage environment. Transparent materials have valuable properties such as transparency and high transmittance, but these characteristics can diminish due to degradation, leading to a loss of functionality as a material. This document explains "Examples of Reliability Testing Equipment," "Haze Measurement Results," and "IR Analysis Results" using tables and graphs. Please take a moment to read it. [Contents] ■ Examples of Reliability Testing Equipment (Constant Temperature and Humidity Testing Equipment) ■ Haze Measurement Results ■ IR Analysis Results *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

I would like to introduce the topic of "Analysis of Polymer Structural Changes." This document includes "Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy" and "Structural Changes of Polymer Chains." The molecular structure of polymers influences their properties, affecting the physical characteristics of polymer products. We have evaluated the higher-order structures formed by the aggregation of polymer chains using analytical methods. Please take a moment to read it. [Contents] ■ Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy ■ Structural Changes of Polymer Chains *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

This document introduces the analysis of PTP packaging sheets using EGA-MS analysis and thermal desorption/pyrolysis GC-MS analysis. Various materials are used in industrial products; for example, polymers contain low molecular weight components such as additives and high molecular weight components that are the polymers themselves. In GCMS analysis, low molecular weight components volatilize at relatively low temperatures, while high molecular weight components need to be decomposed at high temperatures before analysis. Here, we present an example of analyzing the polymer and additive components of PTP packaging sheets used for tablets. We invite you to read it. [Contents] ■ Evolved Gas Analysis Method (EGA-MS Analysis) ■ Analysis Example of PTP Packaging Sheets *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

Introducing the "Transmittance Measurement Service Using an Automatic Spectrophotometer." The transmittance of transparent materials is an important characteristic item in the specifications of the products used. This characteristic may deteriorate or be lost due to degradation from heat, humidity, ultraviolet light, and other factors. This document includes the principles of the equipment, as well as a comparative evaluation of the changes in transmittance before and after constant temperature and humidity testing of transparent resins, along with discussions on the results. We encourage you to read it. [Contents] ■ Principles and specifications of the automatic spectrophotometer ■ Changes in transmittance of PET resin (polyethylene terephthalate) ■ Changes in transmittance of PVC resin (polyvinyl chloride) *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

We will introduce the flow from basic and widely applicable optical microscopy observations to SEM observations and EDX elemental analysis. Observation using optical microscopy is one of the fundamental observation techniques and allows for quick examination of general shapes. Additionally, its feature is that it provides color information, making it useful for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "SEM observations" and "EDX elemental analysis" using photos and graphs. Please take a moment to read it. 【Contents】 ■ Observation using optical microscopy ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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When conducting EDX analysis, many people may use high acceleration voltages to increase the detection sensitivity of elements. However, depending on the purpose, analysis at high acceleration voltages is not always the best option. White LEDs generate white light by combining blue LEDs with yellow phosphors (powder), and in this study, we examined how changing the acceleration voltage affects the surface analysis of these phosphors. Please take a moment to read this. [Contents] - Test sample (LED phosphor) - Surface analysis images at different acceleration voltages - Considerations from Monte Carlo simulations of electron beam scattering regions *For more details, please refer to the PDF document or feel free to contact us.

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Reliability testing of materials that make up a product under thermal and humidity stress is essential, but the analysis and evaluation after testing is also an indispensable process. Constant temperature and humidity testing is a device that applies temperature and humidity stress to products and materials to check for changes in physical properties, characteristics, appearance, and lifespan. Our company has also devised various ways to accommodate a wide range of samples. In this document, we will introduce a case study that verified changes in the molecular structure of materials before and after constant temperature and humidity testing through IR analysis. We encourage you to read it. [Contents] ■ Examples of reliability testing equipment (constant temperature and humidity testing equipment) ■ Innovations in sample placement ■ Comparative evaluation before and after testing through chemical analysis *For more details, please refer to the PDF document or feel free to contact us.

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EPMA has seven spectroscopic crystals, and by selecting the spectrometer according to the wavelength of the target element, it achieves good energy resolution and detection sensitivity, allowing for excellent results in quantitative analysis of trace components and map analysis. This document provides detailed information using diagrams, including the "Measurement Principle of Wavelength Dispersive X-ray Spectrometer (WDS)" and "Measurement Example of 22Ti." Please take a moment to read it. [Contents] ■ Wavelength Dispersive X-ray Spectrometer (WDS) ■ Measurement Example 22Ti *For more details, please refer to the PDF document or feel free to contact us.

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