Cross-sectional observation by SEM: Connector plating

Seeking the truth! If the communication worsens, it might be worth considering a malfunction in the connector terminal.

We would like to introduce a case study on cross-sectional observation of connector plating. We observed the cross-section to see how the plating condition of the connector terminals has changed due to usage. This time, we prepared cross-sectional samples from two locations with different degrees of streaks, one without streaks and one with streaks, to confirm the plating condition. As a result, it was found that compared to the area without streaks, Streak A and Streak B had uneven plating thickness. This is believed to be due to the plating being dragged during the insertion and removal of the connector, causing variations in thickness. 【Overview of Connector Plating Cross-Section】 ■ Cross-section preparation was done using a triple ion milling polisher (commonly known as CP) ■ The plating condition at the streaked locations was observed using SEM ■ Results - No streaks: Surface Au plating thickness is uniform (approximately 350nm) - Streak A: Surface Au plating thickness is uneven (approximately 490nm / approximately 350nm) - Streak B: Surface Au plating thickness is uneven (approximately 130nm / approximately 650nm) *For more details, please refer to the PDF document or feel free to contact us.

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