Introducing the differences in appearance due to the device, the sample angle, and the light source!
Whiskers are often thought to occur at solder joints or component lead areas, but they can also arise from the plated surfaces of flat components. Observing them requires a bit of technique. This document covers differences in appearance based on the equipment used, as well as differences in appearance due to sample angles and the angles of light sources and lenses. [Contents] ■ Differences in appearance based on equipment ■ Differences in appearance based on sample angles ■ Differences in appearance based on light sources and lens angles *For more details, please refer to the PDF document or feel free to contact us.
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![[Data] Whisker Analysis using EBSD](https://image.www.ipros.com/public/catalog/image/01/84f/542861/IPROS77618350109179489644.jpeg?w=120&h=170)
![[Information] Whisker Observation - Tips for Observing Flat Whiskers](https://image.www.ipros.com/public/catalog/image/01/b86/588034/IPROS96955481838712733852.jpeg?w=120&h=170)
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
