This is a flagship model that arranges probe heads above and below, enabling simultaneous in-circuit testing of both sides of the substrate.
Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in standard. By using the upper and lower flying probes simultaneously, a combination inspection of up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.
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basic information
To ensure that electronic devices function correctly, the electronic circuit board within the device must operate normally. The electronic circuit board becomes operational when electronic components are correctly mounted on the printed circuit board (PCB) and power is supplied. The process of contacting a specialized probe to the electronic circuit board, which has the electronic components mounted, and applying a minute electrical signal for inspection is called In-Circuit Testing (ICT), and the device used for this inspection is referred to as an In-Circuit Tester. This method allows for the inspection of "the connection reliability between electronic components and the board," "the values of individual mounted electronic components (such as resistors and capacitors)," and "the polarity of diodes," without imposing unnecessary loads on the board itself. It is also known as MDA (Manufacturing Defect Analyzer). Main inspection items include: ● Solder shorts and opens ● Pattern disconnections ● Missing components ● Incorrect component values ● Reverse insertion of polarized components ● Lifted leads of ICs and connectors ● Operation confirmation of digital transistors, optocouplers, and Zener diodes ● Other simple function tests.
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Applications/Examples of results
【Adopted Industries】 EMS, EMDS companies Semiconductor manufacturing equipment Communication infrastructure and servers Automotive, aircraft, and marine Medical devices Industrial machinery and robots FA machine tools Power generation and power systems 【Use Cases】 ■ Inspection of mass-produced items Connected to loaders/unloaders for automated and unmanned inspection even in large lots ■ Inspection of multi-variety, small-quantity substrates No need for dedicated jig manufacturing costs; easy identification of defective areas ■ Inspection of prototype substrates Function tests responsive to design changes (applying voltage to the substrate to confirm circuit operation (ON/OFF) and measure direct current) ■ Implementation confirmation inspection during model switching Verification of the mounting program for the first lot and checking for setup errors during model changes ■ Defect analysis inspection Inspection of substrates that failed functional tests and defect analysis of substrates that failed in the market We have a proven track record of various applications. For more details, please contact your sales representative.
Detailed information
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APT-1600FD
Line up（4）
| Model number | overview |
|---|---|
| APT-1600FD | Double-sided inspection compatible machine |
| APT-1600FD-A | Double-sided inspection compatible, inline machine (model with automatic transport conveyor) |
| APT-1600FD-SL | Double-sided inspection, large board compatible machine |
| APT-1600FD-SL-A | Double-sided inspection, large board compatible, inline machine |
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![Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Ehime University Collaborative Research Materials]](https://image.www.ipros.com/public/catalog/image/01/b78/706831/IPROS8285943113191609983.jpeg?w=120&h=170)
![Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research Material with Ehime University]](https://image.www.ipros.com/public/catalog/image/01/844/760295/IPROS14771536501121226558.jpeg?w=120&h=170)
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Company information
Founded in 1894 as a textile company, Takaya Textile expanded and established its electronics division in 1966, starting the assembly of transistor radios. Today, in addition to contract manufacturing services (EMS) related to electronic devices, the company actively manufactures and sells various electronics, including in-circuit testers (printed circuit board inspection devices) and RFID (a technology that enables information exchange through short-range wireless communication from tags containing IC information), as well as IT consulting and system solutions, both domestically and internationally. We continue to evolve as a corporate group that contributes to societal development, with textiles and electronics as our dual pillars.