I received the Excellent Award at the 38th Electronics Packaging Society Spring Conference.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with flying probe testers excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires dedicated fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures that connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors), by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

• Measurement and Inspection

It is a board inspection device capable of ultra-fast in-circuit testing at a top-class level in the industry.

We have completely revamped the platform compared to the conventional model, increasing the probe movement speed by up to 50% and dramatically improving contact position accuracy. Our new high-precision, wide-range measurement system, along with the groundbreaking 4-head 6-flying probe mechanism, significantly reduces inspection costs and enhances quality in the assembly process, regardless of substrate variety or production volume. ★You can bring your own substrates for evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

• Measurement and Inspection

It is a board inspection device capable of ultra-fast in-circuit testing at a top-class level in the industry. (Supported board size for inspection: up to 985×610)

The APT-1340J maintains its basic performance while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 10kg, making it suitable for inspecting boards used in automotive, aerospace, and medical devices, as well as power supply boards and probe cards, which are larger and heavier. ★You can bring your boards to our demonstration room at our Okayama headquarters for evaluation testing★ We can conduct a series of tests, including creating inspection programs, inspecting actual boards, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below. *For product information, please download the PDF or feel free to contact us.*

• Measurement and Inspection

This is a flagship model that arranges probe heads above and below, enabling simultaneous in-circuit testing of both sides of the substrate.

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in standard. By using the upper and lower flying probes simultaneously, a combination inspection of up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

• Measurement and Inspection

The probe heads are arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)

The simultaneous use of upper and lower flying probes allows for a combination inspection of up to 6 probes, enabling the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Additionally, by adding an optional split inspection function, it can also inspect long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing in substrates to the demo room at our Okayama headquarters★ A complete testing process is possible, including the creation of inspection programs, testing using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

• Measurement and Inspection

We would like to inform you that, in order to further strengthen and enhance our sales and service operations, there will be changes to our Nagoya Sales Office as of April 1st, as detailed below. ■ Relocation of Nagoya Sales Office 【New Address】 〒460-0003 6th Floor, Sando Building, 1-7-27 Nishiki, Naka Ward, Nagoya City, Aichi Prefecture TEL: 052-212-6520 / FAX: 052-212-6521 *Please note that the TEL and FAX numbers will also change. Taking this opportunity, all of our staff will continue to make even greater efforts. Please feel free to contact us.

To combat heatstroke during the summer, Sysmet Co., Ltd. has started providing black globe thermometers again this year. Differences from conventional black globe thermometers: - 17-day ahead heat index (WBGT) forecast with a 500m mesh - 1-minute updates of heat index (WBGT) measurements compliant with JIS standards - Email alerts when threshold values are exceeded, along with alarm devices (electronic display boards, rotating lights) and notifications via direct LINE WORKS, etc.

We will introduce the implementation results of the sensor technology developed by the Hotron Group, which has been cultivated over more than half a century, through customer case studies. In addition to automatic door sensors, we also offer a wide range of vehicle detection sensors and nursing/care sensors. We have many implementation examples available, so please take a look at the case study page.

■ Evaluation Points of the Award-Winning Work "OPELAIII Cx" A rigorous evaluation was conducted by 129 design experts from approximately 10,000 submitted designs from 68 countries and regions around the world. Our "OPELAIII Cx" received high praise in the following three pillars, leading to its award. Innovative Innovation: A new approach that is not bound by existing concepts has realized the [wearable shadowless lamp]. Thorough Usability: Based on a comprehensive user perspective, we pursued intuitive and stress-free excellent operability. Design Pursuing Ergonomics: From material selection to the details of product design, we prioritized the health and comfort of doctors around the world who work in harsh environments. We thoroughly implement ergonomics to reduce physical strain and maximize performance. Details of the award-winning work are published on the official iF design portal site at https://ifdesign.com/en/winner-ranking/project/opelaiii-cx/739885.

This product is a light source device utilized in a wide range of processes such as curing, surface treatment, sterilization, analysis, and material evaluation using ultraviolet (UV) light. With stable light output and an easy-to-handle design, it can be widely used from manufacturing sites to research and development fields. Depending on the application, you can select the type and output of the lamp, ensuring stable processing quality. Main UV lamp light source products: 1. Excimer light source Covers special wavelength ranges that cannot be achieved with LEDs, making it ideal for research and evaluation applications requiring specific wavelengths, such as semiconductor and material evaluation, surface modification, and photochemical reactions. 2. Low-pressure mercury lamp light source Emits high-energy short-wavelength UV, used in various fields such as sterilization, surface cleaning, resin pretreatment, analytical devices, and environmental measurement instruments. 3. High-pressure mercury lamp and metal halide lamp light source (for UV curing devices) Compatible with resins that are difficult to cure with LEDs, it plays a significant role in the adhesion, printing, and coating processes of UV-curable resins, as well as in the manufacturing of electronic components and the curing processes of optical materials. It also supports selection tests for light sources and filters, proposing optimal irradiation conditions tailored to resin characteristics. Custom specifications are also available. Please feel free to consult us regarding irradiation range and required functions.