Observe the crystal structure with EBSD! Data can be obtained for each metal.
We will introduce an example of analysis using EBSD for high melting point solder (Pb-based solder containing a small amount of Sn). The EBSD method allows for the estimation of grain distribution and residual stress. Additionally, there are methods that can simultaneously analyze metals with different crystal structures, enabling data acquisition for each metal. 【Features】 ■ Ability to estimate grain distribution and residual stress ■ Methods available for simultaneous analysis of metals with different crystal structures, allowing for data acquisition for each metal *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.