We provide testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.
■ We will support each specification waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using diode characteristic judgment methods (consultation required).
Inquire About This Product
basic information
■Applied voltage from 0V to ±4000V, in 5V steps ■Supports up to a maximum of 1024 pins. ■Probe movement accuracy: 0.1mm ■Applied unit: JEDEC (JESD22-C101F), JEITA, EIAJ, AEC ■Charge methods FI-CDM: Field Induced Method (JEDEC, AEC) D-CDM: Direct Charge Method (JEITA, EIAJ, AEC) ☆Started testing services for automotive electronic component standards: AEC-Q100-011 Capable of supporting AEC standard Field Induced CDM (FI-CDM) testing. Capable of supporting AEC standard Direct CDM (D-CDM) testing.
Price information
We will provide a quotation based on the examination conditions.
Delivery Time
※It will vary depending on the test conditions and quantity.
Applications/Examples of results
JEDEC JEITA EIAJ AEC Various standard tests
catalog（17）
Download All Catalogs
Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.