Announcement of the introduction of Talos F200E

Improved resolution of TEM and STEM! Performance has been significantly enhanced, allowing EDS analysis with four detectors.

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, including the capability for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which allows for the integration of multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration Voltage: 200kV, 80kV ■ TEM Information Limit: ≦0.11nm ■ STEM Resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・Integrates multiple frames while correcting for drift *For more details, please download the PDF or feel free to contact us.

• Other analytical equipment

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Analysis and prediction system
• Other analytical equipment

We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for Analysis - Backside Polishing - Supports various sample forms. Si chip size: 200um to 15mm square ■ Defective Area Identification - Backside IR-OBIRCH Analysis / Backside Emission Analysis - IR-OBIRCH Analysis: Supports up to 100mA/10V and 100uA/25V Emission Analysis: Supports up to 2kV * Covers a wide range of defect characteristics such as low-resistance shorts, micro-leaks, and high-voltage breakdown failures. ■ Pinpoint Cross-Section Observation of Leak Areas - SEM/TEM - Select SEM or TEM observation based on the predicted defects, allowing for pinpoint physical observation and elemental analysis of leak defect areas.

• Other analytical equipment

TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and material evaluation.

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

• Other analytical equipment

Since semiconductors have different physical properties, new methods are required for failure analysis!

Our company conducts OBIRCH analysis of SiC devices using short-wavelength lasers. SiC is a power device with lower energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In the backside OBIRCH analysis of SiC-SBD using short-wavelength lasers, localized melting damage was induced in the SiC Schottky barrier diode, resulting in the generation of a pseudo-leak. Locations of pseudo-leaks that could not be confirmed in the IR-OBIRCH analysis were clearly observed in the GL-OBIRCH analysis. *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

Pre-processing of SiC devices → Identification of leakage points → Physical analysis/component analysis handled seamlessly!

Our company conducts "Backside Emission Analysis of SiC Devices." SiC is a power device that has less energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In a case study of backside emission analysis of SiC MOSFETs, an overseas SiC MOSFET was subjected to ESD, creating a G-(D,S) leakage, and numerous emissions indicating the leakage points were detected through emission analysis. When the emission points were observed using TEM, damage to the SiO2 film and the SiC crystal was noted. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, we can produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Damage layer reduction through low acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Fully automated TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

We have introduced Majesta Fragrance to a nightclub in Yokosuka City, Kanagawa Prefecture, creating a fragrant atmosphere throughout the floor. The model we have introduced is the "MF-02S," which costs 8,800 yen per month (tax included). The scent you have chosen this time is "Sabon," a high-quality soap fragrance reminiscent of luxury hotel amenities. Its clean and transparent refreshing scent spreads throughout the entire floor, warmly welcoming customers who visit. By introducing scent design to the nightclub, we can enhance the extraordinary experience and create a memorable space that lingers not only visually but also through "scent." Majesta Fragrance offers a rental service for commercial aroma diffusers, and we also provide a free trial installation. If you are interested in scent design, please feel free to contact us.

In the July 8, 2026 issue of Air Conditioning Times, we featured "Flex Chamber" and "SS Premier" in a duct special.

SS Premier has won an award at the 24th Environmental and Equipment Design Awards. This award is organized by the General Incorporated Association of Architectural Equipment Comprehensive Association and recognizes outstanding efforts in environmental and equipment design. We will continue to strive for further improvements in quality and technology.

An interview article with Yoshinori Takada, President and CEO of bSearch Co., Ltd., has been published in the media "Vision Encyclopedia," which conveys the thoughts and backgrounds of business leaders. The article delves deeply into the background of transitioning from an ordinary student life to founding a company, as well as his unique winning pattern of "not pretending to be capable." It is filled with hints for achieving results in job hunting and work, so be sure to check it out! Vision Encyclopedia / bSearch Representative Interview - The Reason Why "Not Pretending to Be Capable" Leads to Trust This representative interview introduces a career story that will be useful for a wide range of people, from job seekers who want to know the tips for achieving results at work and those who truly want to meet companies that suit them, to companies and HR personnel looking to hire talented individuals and build strong organizations. You can find detailed insights on the perspective towards work in the interview article on "Vision Encyclopedia." ✨ ■ Check out the bSearch representative interview on "Vision Encyclopedia" here: https://vision-zukan.com/posts/bsearch/

On July 1, 2026 (Wednesday), talent Risa Yoshiki has been appointed as the official ambassador of b-search Co., Ltd. We are pleased to announce the appointment of Risa Yoshiki, who is active in various fields such as television and magazines, as our official ambassador (effective July 1, 2026). With this ambassador appointment, we at b-search Co., Ltd. aim to deliver the best recruitment solutions to many companies struggling with hiring activities, while also strongly promoting the joy of taking on challenges in work and the appeal of new ways of working to job seekers considering career changes or employment. ■ Background of the official ambassador appointment In today's world, where the declining labor force due to low birth rates and an aging population is advancing, "acquiring and retaining talent" has become an extremely important management issue that affects corporate growth. What is required in future recruitment activities is not the traditional method of "simply posting job advertisements and waiting for applications." What is urgently needed now is "proactive recruitment," which involves partnering with companies as their "best No. 2" to consistently promote everything from the planning of recruitment strategies to the establishment of systems that yield results.