Announcement of the introduction of Talos F200E

Improved resolution of TEM and STEM! Performance has been significantly enhanced, allowing EDS analysis with four detectors.

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, including the capability for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which allows for the integration of multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration Voltage: 200kV, 80kV ■ TEM Information Limit: ≦0.11nm ■ STEM Resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・Integrates multiple frames while correcting for drift *For more details, please download the PDF or feel free to contact us.

• Other analytical equipment

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Analysis and prediction system
• Other analytical equipment

We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for Analysis - Backside Polishing - Supports various sample forms. Si chip size: 200um to 15mm square ■ Defective Area Identification - Backside IR-OBIRCH Analysis / Backside Emission Analysis - IR-OBIRCH Analysis: Supports up to 100mA/10V and 100uA/25V Emission Analysis: Supports up to 2kV * Covers a wide range of defect characteristics such as low-resistance shorts, micro-leaks, and high-voltage breakdown failures. ■ Pinpoint Cross-Section Observation of Leak Areas - SEM/TEM - Select SEM or TEM observation based on the predicted defects, allowing for pinpoint physical observation and elemental analysis of leak defect areas.

• Other analytical equipment

TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and material evaluation.

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

• Other analytical equipment

Since semiconductors have different physical properties, new methods are required for failure analysis!

Our company conducts OBIRCH analysis of SiC devices using short-wavelength lasers. SiC is a power device with lower energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In the backside OBIRCH analysis of SiC-SBD using short-wavelength lasers, localized melting damage was induced in the SiC Schottky barrier diode, resulting in the generation of a pseudo-leak. Locations of pseudo-leaks that could not be confirmed in the IR-OBIRCH analysis were clearly observed in the GL-OBIRCH analysis. *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

Pre-processing of SiC devices → Identification of leakage points → Physical analysis/component analysis handled seamlessly!

Our company conducts "Backside Emission Analysis of SiC Devices." SiC is a power device that has less energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In a case study of backside emission analysis of SiC MOSFETs, an overseas SiC MOSFET was subjected to ESD, creating a G-(D,S) leakage, and numerous emissions indicating the leakage points were detected through emission analysis. When the emission points were observed using TEM, damage to the SiO2 film and the SiC crystal was noted. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, we can produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Damage layer reduction through low acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Fully automated TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

[To the owners of parking lots and parking lot construction companies] "I am worried about the possibility of colliding with pedestrians when exiting the parking lot..." Among vehicle entrances to parking lots, stores, residences, and factories, those particularly facing sidewalks or roadways are expected to pose risks of dangerous incidents such as pedestrian collisions and vehicle-to-vehicle accidents. To alleviate such concerns, Hotron proposes a [Vehicle Exit Warning Sensor] that detects vehicle departures at various sites and alerts the surrounding area with LED lights and buzzers. The system consists of a simple configuration of "Sensor" + "Controller" + "Switching Power Supply (24V)" + "LED Rotating Light." *When using the exit warning system, we kindly ask that you arrange for the switching power supply (24V), LED rotating light, control panel, circuit breaker, etc. Since it can be retrofitted, it can also be used for existing parking lot entrances. [Contents Included] ○ Exit Warning System Configuration ○ Comparison Table of Exit Warning Sensors ○ Four Modes ○ Wide Range of Applications ○ Customer Feedback ○ Appearance Diagram / Specifications ◎ For more details, please contact us or download the catalog.

In recent times, there has been a growing interest in infection control measures and facility hygiene management. Our company offers non-contact sensor products that are recommended for commercial facilities, food factories, and nursing and caregiving facilities. 【Sensors for Automatic Doors】 ● Light Touch Sensor HA-T401 … When you wave your hand in front of the automatic door, the sensor detects the movement and opens or closes the door. This is recommended for making doors with touch switches non-contact. ● Hand Wave Sensor PF-R5, PF-U2, DHS-1 … Opens and closes the automatic door by waving your hand in front of the sensor. ● Foot Switch PF-01S/01D/03S/05 … Opens and closes the automatic door by placing your foot in the opening. 【Access Control System】 ● Face Recognition + Unmanned Temperature Measurement DS Series … Allows for face recognition along with mask detection and body temperature measurement simultaneously. ● Automatic Disinfectant Spray Dispenser PHW-03B … Automatically sprays disinfectant when you wave your hand in front of the sensor. 【Nursing and Care Sensors】 ● Infrared Bed Exit Sensor "Just Place It Pole-kun" … This bed exit sensor is installed next to the bed and notifies via nurse call when the subject enters the detection range. ◎ For more details, please download the catalog or contact us.

As the new year begins, I would like to extend my heartfelt congratulations on your continued prosperity. I sincerely appreciate your exceptional support throughout the year. This is the STJ Group (Santec Telecom Japan, STJ Rentec). Now, I am pleased to announce that we will be opening our "Transceiver & Smartphone Rental Shop" simultaneously at three locations nationwide on January 26 (Monday)! ■ List of Services to be Offered - Same-day pickup/return of rental equipment - Usage explanations and demonstrations of rental equipment - Wireless solution consultation desk - Mobile BPO service counter As a special promotion to celebrate the opening of the rental shop, we are currently running a special price campaign for rental equipment pickup at the shop! For more details, please contact us!

This is the Agricultural Division of Sumitomo Forestry Greenery Co., Ltd. In our division, we manufacture and sell potting soil for agricultural, horticultural, and greening purposes. In the future, we would like to regularly introduce our products through the Nōsan Girl Letter.

We would like to inform you about our participation in the IT Trend EXPO 2026 Spring. 《Exhibition Information》 With the concept of "New encounters will change the way we work tomorrow," one of the largest online exhibitions in the industry will be held. NTT TechnoCross will be exhibiting in the Human Resources Comprehensive category. We have prepared numerous discussions and sessions featuring special guests who are active on television, allowing even those who are usually busy to efficiently gather information on products and services related to IT and DX. Additionally, the first 10,000 participants will receive a 500 yen Amazon gift card. Please be sure to register early. 《Exhibition Overview》 March 3 (Tuesday) to March 7 (Saturday), 2026, online (free: pre-registration required) 《Participation Registration》 https://it.expo.it-trend.jp/key/opl7kgdj *Please register (free) by clicking "Receive Ticket / Proceed to Participation Registration" at the above URL.