Announcement of the introduction of Talos F200E

Improved resolution of TEM and STEM! Performance has been significantly enhanced, allowing EDS analysis with four detectors.

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, including the capability for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which allows for the integration of multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration Voltage: 200kV, 80kV ■ TEM Information Limit: ≦0.11nm ■ STEM Resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・Integrates multiple frames while correcting for drift *For more details, please download the PDF or feel free to contact us.

• Other analytical equipment

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Analysis and prediction system
• Other analytical equipment

We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for Analysis - Backside Polishing - Supports various sample forms. Si chip size: 200um to 15mm square ■ Defective Area Identification - Backside IR-OBIRCH Analysis / Backside Emission Analysis - IR-OBIRCH Analysis: Supports up to 100mA/10V and 100uA/25V Emission Analysis: Supports up to 2kV * Covers a wide range of defect characteristics such as low-resistance shorts, micro-leaks, and high-voltage breakdown failures. ■ Pinpoint Cross-Section Observation of Leak Areas - SEM/TEM - Select SEM or TEM observation based on the predicted defects, allowing for pinpoint physical observation and elemental analysis of leak defect areas.

• Other analytical equipment

TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and material evaluation.

TEM can perform not only high-magnification observation but also elemental analysis using EDS and EELS, as well as analysis of crystal structure, surface orientation, lattice constants, and more through electron diffraction.

• Other analytical equipment

Since semiconductors have different physical properties, new methods are required for failure analysis!

Our company conducts OBIRCH analysis of SiC devices using short-wavelength lasers. SiC is a power device with lower energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In the backside OBIRCH analysis of SiC-SBD using short-wavelength lasers, localized melting damage was induced in the SiC Schottky barrier diode, resulting in the generation of a pseudo-leak. Locations of pseudo-leaks that could not be confirmed in the IR-OBIRCH analysis were clearly observed in the GL-OBIRCH analysis. *For more details, please refer to the PDF materials or feel free to contact us.

• Other analytical equipment

Pre-processing of SiC devices → Identification of leakage points → Physical analysis/component analysis handled seamlessly!

Our company conducts "Backside Emission Analysis of SiC Devices." SiC is a power device that has less energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In a case study of backside emission analysis of SiC MOSFETs, an overseas SiC MOSFET was subjected to ESD, creating a G-(D,S) leakage, and numerous emissions indicating the leakage points were detected through emission analysis. When the emission points were observed using TEM, damage to the SiO2 film and the SiC crystal was noted. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, we can produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Damage layer reduction through low acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Fully automated TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

To customers considering the introduction of vehicle detection sensors for parking lot construction, design, or management: Are you facing any challenges with current issues or selecting the right sensors for parking management? Hotron offers free materials that explain how to utilize vehicle detection sensors and the benefits of their introduction! ▽ Here is the lineup of materials ◉ Vehicle Detection Sensor Basic Guide This guide focuses on the challenges and solutions in parking lot operations, introducing the overview of vehicle detection sensors. ◉ Key Points for Introducing Vehicle Detection Sensors This material discusses the benefits of introduction based on installation locations and specific challenges. ◉ Case Studies of Vehicle Detection Sensor Implementation This document presents the challenges before implementation and the results after introduction. For more details, please download from our website and check it out. https://www.hotron.co.jp/download/

The "HM-S6" is an embedded park sensor that detects vehicles through changes in magnetic flux and responds to various situations from passing to stationary vehicles. It can be used for the opening and closing of input doors at waste treatment plants, as well as for gates that vehicles pass through and outdoor parking applications. It can also be installed on rebar and steel plates. 【Features】 ■ Resistant to the effects of natural environments such as rain, snow, temperature changes, and geomagnetism ■ Protection rating IP68 reduces the risk of water ingress ■ Ten times the load capacity compared to conventional embedded park sensors (based on our comparison) ■ Can distinguish between vehicles even when they pass continuously ■ Can be installed on rebar and steel plates *For more details, please refer to the PDF document or feel free to contact us.

At a cabaret club located in Tokyo, we have introduced our diffusers to create a fragrant atmosphere within the floor. Because it is a special space that colors the nightlife, we pay attention not only to the interior design and lighting but also to the "scent of the space." The Majesta Fragrance diffuser rental service spreads high-quality scents throughout the store, enhancing the first impression of customers who visit. We create an exquisite space that makes them want to come back again. Many people might think, "Diffusers seem expensive," but with Majesta Fragrance, it is possible to introduce them at a reasonable price starting from 4,400 yen per month. Our service has received great acclaim for store branding and as a solution for odors from tobacco and alcohol. For those who want to "try it out to see if it matches the store's atmosphere," Majesta Fragrance offers a free trial installation. You can experience it in your store before considering a purchase. If you are interested in scenting your store or office and space branding, please feel free to contact us.

If you are considering "scent marketing (aroma branding)" for your store or office in Tochigi Prefecture, please leave it to Majesta Fragrance! Our company helps enhance the value of spaces through our rental service for commercial aroma diffusers. A one-week free trial installation is also available. If you are interested in scent marketing, please feel free to contact us!

We will be exhibiting at the "22nd Japan Fiber Material Research Seminar" to be held on May 22, 2026 (Friday). We plan to showcase dust protection clothing and other items. We look forward to your visit! ● Date: May 22, 2026 (Friday) 11:00 AM - 4:00 PM ● Venue: BDK Conference Room, 7th Floor, Buddhist Propagation Center Building, (Public Interest Incorporated Foundation) (Tokyo) 'Mi no Ma' For more details, please feel free to contact us through the related link below: [Protective Clothing Wisdom.com]. [Protective Clothing Wisdom.com] is a comprehensive information site for safe working environments, providing information on protective clothing and equipment by work environment, methods for putting on and taking off, and customer usage records.