Examples of semiconductor observation using mechanical polishing.

Cross-section preparation for structural observation and defect analysis of semiconductors! Cross-section preparation comparable to FIB and CP is possible.

We would like to introduce an example of "observation of semiconductors by mechanical polishing" conducted by our company. While there are advantages and disadvantages, it is possible to create cross-sections with mechanical polishing that are comparable to those made by FIB or CP. Based on years of accumulated know-how, our company will propose the most appropriate processing methods according to the observation purpose, sample composition, and structure. If you have any concerns, please feel free to contact us at the information below. 【Observation Examples】 ■ Semiconductor_Si ■ Compound Semiconductor_GaN ■ Compound Semiconductor_GaP ■ Compound Semiconductor_GaAs *For more details, please refer to the PDF document or feel free to contact us.

• others

Introducing the "Observation Mode" of a chip capacitor (MLCC) under a microscope!

We would like to introduce an example of cross-sectional observation of mounted components conducted by our company. Using commercially available computer circuit boards, we observed the solder joints of mounted components and the internal structures of the components with a metal microscope. The observation modes of the metal microscope include bright field observation, dark field observation, and polarized light observation, among others. Additionally, there are observations using transmitted light, and the observation mode is selected according to the sample. By conducting cross-sectional observations before and after reliability testing, we can evaluate the reliability of the product. When observing, it is important to select an appropriate "observation mode" to clearly capture the condition of the solder joint interface and defects such as cracks. [Case Overview] ■ Using commercially available computer circuit boards ■ Observing the solder joints of mounted components and the internal structures of the components with a metal microscope ・Observation modes: bright field observation, dark field observation, polarized light observation, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Parts and Materials

Observations before and after reliability testing, as well as cross-sectional observations! Here are examples of observations of various implemented components.

We would like to introduce our service for "Cross-sectional Observation of Various Mounted Components on Circuit Boards." Inside various electronic devices around us, there are circuit boards equipped with electronic components. When observing a mounted circuit board, it becomes clear that numerous components are densely soldered together, and it is necessary to confirm that the components are properly joined, as improper connections can lead to malfunction. Please contact us if you are considering observations or cross-sectional examinations before and after reliability testing. 【Examples of Observations (Partial)】 ■ Ceramic Capacitors ■ Transistors ■ Chip Resistors ■ QFP ■ Connector Pins *For more details, please refer to the PDF materials or feel free to contact us.

• Analysis and prediction system

Comprehensive analysis of the structure of MEMS components using a combination of non-destructive and destructive methods!

This document introduces the structural analysis of MEMS components. It includes "non-destructive observation of accelerometers" using X-ray tomography to observe the internal structure of the package, as well as "optical microscope and SEM observation after mechanical polishing of accelerometers" and "cross-sectional observation of microphones (CROSS BEAM FIB/SEM)." Please feel free to download and take a look. [Contents] ■ Non-destructive observation of accelerometers ■ Optical microscope and SEM observation after mechanical polishing of accelerometers ■ Cross-sectional observation of microphones (CROSS BEAM FIB/SEM) *For more details, please refer to the PDF document or feel free to contact us.

• Analysis and prediction system

We undertake contract processing and manufacturing of cross-sections of various parts and materials.

At Aites, we undertake the processing of cross-sections of various components and materials, including electronic components, mounted circuit boards, semiconductors, compound semiconductors, power devices, films, resin molded products, solar panels, and LCD glass. We also conduct observations and analyses of the produced cross-sections, providing services for defect analysis and quality evaluation. 【List of Services】 ■Mechanical polishing ■CP processing ■Microtome ■FIB processing ■Analysis of semiconductor diffusion layers, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We provide information on the main cross-section manufacturing methods, processing conditions, advantages & disadvantages, etc.!

This document introduces methods for preparing cross-sections. When conducting observations, analyses, or evaluations, there may be a need to prepare cross-sections. By selecting or combining methods that are appropriate for the purpose, material, and structure, it is possible to obtain highly reliable results. In mechanical processing, methods such as "mechanical polishing" and "microtome" are included. In ion beam processing, main cross-section preparation methods such as "FIB" and "ion polisher (CP)" are also listed. We encourage you to read it. [Contents] ■ Main cross-section preparation methods ■ Processing conditions ■ Advantages & disadvantages *For more details, please refer to the PDF document or feel free to contact us.

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We will thoroughly evaluate and verify the LED from all angles.

■Comprehensive Capability Consistent evaluation resistance from reliability testing to electrical property measurement, optical property measurement, and further analysis. ■Rich Analytical Methods - Forward bias analysis / Reverse bias analysis - Detection from visible to infrared - Emission analysis / OBIRCH analysis ■Special Techniques By filtering the visible light range, weak emissions from abnormal areas are detected without missing them.

• Garden lighting/lights (LED/solar)

Applying advanced sample preparation techniques and failure analysis equipment for semiconductors! Investigating the causes of non-lighting and brightness degradation.

In our "LED Failure Analysis," we conduct failure analysis of LEDs using advanced sample preparation techniques and semiconductor failure analysis equipment to investigate the causes of non-lighting and brightness degradation. In the "LED Defect Mode Isolation," we performed lighting tests after lens polishing and observed the resin of the LED, polishing it to stages a, b, and c, conducting lighting observations for (a) and (b), and optical observations of the chip through the resin for (c). Additionally, we also have categories such as "electrically normal," "open, high resistance," etc. 【Initial Diagnosis Items for LED Packages】 ■ Electrical characteristic measurement ■ Appearance observation ■ Lens polishing/package internal optical observation ■ Lighting test (brightness distribution observation) *For more details, please refer to the PDF materials or feel free to contact us.

• others

You can closely observe the soldering condition of electronic components on the implementation board and the internal structure of the components!

We conduct "cross-sectional observation of surface-mounted electronic components." Through cross-sectional observation after mechanical polishing, it is possible to closely examine the solder joint condition (presence of cracks or voids) of electronic components on the mounted substrate, as well as the internal structure of the components. For "SOP components," detailed observation can be made from the overall cross-section to the solder connection, and for "aluminum electrolytic capacitors," it is possible to observe the internal structure of the electrolytic capacitor components and their connection to the substrate. 【Features】 ■ SOP (Small Outline Package) components - Detailed observation can be made from the overall cross-section of SOP components to the solder connection. ■ Chip ceramic capacitors - Detailed observation can be made from cracks in the component material to cracks in the solder area. ■ Aluminum electrolytic capacitors - Observation can be made from the internal structure of the electrolytic capacitor components to their connection to the substrate. *For more details, please refer to the PDF document or feel free to contact us.

• others

Each part is carefully polished by hand, using an efficient process without waste!

Our company specializes in "cross-section polishing of implementation parts and electronic components." To quickly provide cross-section samples suitable for observing various parts, we carefully polish each component by hand, using an efficient process without waste. Please feel free to contact us for more information. 【Features】 ■ Quickly provide cross-section samples suitable for observing various parts ■ Carefully polish each component by hand, using an efficient process without waste *For more details, please refer to the PDF materials or feel free to contact us.

• others

By applying chemical etching, ion milling, and FIB processing to mechanical polishing methods, we will analyze various metal joints, starting with lead-free solder.

The joints of electronic components have a significant impact on the overall reliability of the circuit board. Particularly at solder joints, not only the shape but also the observation of the metal structure becomes important.

• Other analytical equipment

#Intersolar South America - We invite you to attend the most influential solar energy event in Latin America. You will be able to see innovative solar mounting solutions designed for the Latin American market. At booth R2.82, Grace Solar will showcase how it is evolving regional solar projects: - Ground-mounted solar mounting systems suitable for Brazil's tropical storms and humid environments - Flexible roof installation systems that can accommodate diverse architectural needs Let's build the future of solar power together! Venue: Expo Center Norte, São Paulo, Brazil, Booth R2.82 Date: August 26-28, 2025

We have introduced the commercial aroma diffuser "Majesta Fragrance" to a cabaret club in Tokyo. The selected scent is "Royale," which offers a sense of calm and elegance. It spreads naturally throughout the floor, creating a high-quality space that satisfies the five senses. Majesta Fragrance is available for a free trial installation exclusively in the Kanto area. If you are interested in enhancing your store's scent experience, please feel free to contact us.

We have released a catalog for a trial version of a conceptual skills course designed to efficiently develop logical thinking and problem-solving skills in a short period. The course is structured in three levels, from basic to practical and applied, supporting skill enhancement directly related to work through video viewing, exercises, and detailed feedback. There is also a free trial version available, lasting about 10 to 20 minutes, allowing you to easily check the course content and approach. It is ideal for promotion and advancement exam preparation, as well as for developing the next generation of leaders, with a proven track record in many companies. For detailed materials or to apply for the trial version, please use the link below. Feel free to take advantage of it!

The RTC series rugged tablets are designed to withstand harsh industrial environments, enhancing productivity, improving safety, and reducing operational costs. The RTC-I116-JP is equipped with a 12th generation Intel Core i7/i5 processor and Windows 10/11, and its 11.6-inch touchscreen allows for precise operation even in rainy conditions or while wearing gloves. Additionally, the display with a brightness of 1,000 nits ensures clear visibility even under direct sunlight, and with IP66 compliance, a 1.2m drop resistance, and hot-swappable capabilities, it strongly supports continuous operation in the field. Factory options: ★ 2D barcode scanner RTC-2D-Z ★ NFC module RTC-NFC116 A wide range of selectable options: ■ Vehicle RAM bracket RTC-RAM ■ Vehicle charger (for vehicle batteries) RTC-VC-19D ■ Vehicle charger (for cigarette sockets) RTC-VC-100W ■ Shoulder strap RTC-SS ■ Stylus pen RTC-SP ■ Lithium-ion battery (3800mAh) RTC-LB-3800

Based on practical experience in support companies and business companies, SBS Marketing Co., Ltd. provides consulting services related to marketing, sales promotion, and customer acquisition mainly in the BtoB (business-to-business) sector. On August 12, 2025 (Tuesday), they published the page "Read in One Go During Obon! Top 10 Accesses from April to June." This page introduces the top 10 blog articles by access count from April to June 2025 that you want to read in one go during Obon. (Page Overview: Excerpts) ■10th: "Filter Bubble" ■09th: Should 'Phone Numbers' Be Public on Websites!? ■08th: "In-group Bias" ■07th: "Peter Pan Syndrome" ■06th: "Butterfly Effect" ■05th: Useful for Business! Downloadable Content ■04th: "Reaction Formation" ■03rd: Is "Quality Over Quantity" Important? Or is "Quantity Over Quality" Important? ■02nd: "The Emperor's New Clothes" Phenomenon ■01st: "Janet's Law" ▼ For more details, please visit this page. https://sbsmarketing.co.jp/blog/top-10-accesses-in-2025-2q-2025-08/