Probe Tester - List of Manufacturers, Suppliers, Companies and Products

[Case Study] The Importance of Electrical Testing in EMS Companies

Takahashi's flying probe tester solves the challenges faced by EMS companies.

【Implementation Results for EMS Companies】 - By conducting electrical inspections from the prototype stage of the circuit board, we achieve quality assurance before mass production. - Early optimization of circuit board design and component selection contributes to reducing defects in later processes. 【Challenges Faced by Our Customers】 Cost of Recreating Jigs: With jig-based testers, it is necessary to recreate dedicated jigs every time there is a prototype or design change. Each design change requires modifications to the jigs, significantly increasing costs and time. Insufficient Response Capability to Design Changes: Conventional inspection methods make it difficult to respond flexibly to design changes. There were instances where long lead times made rapid verification at the prototype stage challenging.

Company：タカヤ
Price：Other

Measurement and Inspection

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[Case Study] Inspection of Large PCBs for Medical Devices

Please utilize Takaya's flying probe tester for the inspection of large substrates for medical devices (in conjunction with boundary scan).

By combining visual inspection, non-contact scanning, and physical probing, we meet the stringent reliability standards in the medical device field, achieving both quality improvement and cost reduction. 【Implementation Achievements】 - Achieved 100% inspection in inline testing, ensuring product quality. - Enhanced defect detection capabilities for large substrates and complex design boards through collaboration with boundary scan technology. 【Challenges Faced by Customers】 Limitations of APT alone: Flying probe testers excel in electrical characteristic testing, but physical access for probing is difficult with components like BGAs and QFPs where pin connections are hidden. In high-density boards, there are areas that cannot be fully covered by probing alone. Constraints of AOI: Cannot detect defects (such as solder bridges or connection failures) located beneath BGAs or large components. Internal connections and micro-short circuits in multilayer boards cannot be detected. In large substrates, there are areas that exceed the field of view, making it difficult to efficiently inspect the entire area. Challenges with large substrates and complex designs: In large substrates, inspection time tends to increase for both AOI and APT, leading to decreased productivity. Efficient inspection systems combining physical probing and non-contact inspection are necessary for 100% inspection of high-density mounted boards.

Company：タカヤ
Price：Other

Measurement and Inspection

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[Case Study] Circuit Board Inspection for Lighting (LED Lighting)

Please utilize Takaya's flying probe tester for substrate inspection for lighting (LED lighting).

By utilizing color sensors for automated inspection, we overcome the limitations of visual inspection, achieving quality stabilization and increased efficiency. Automation reduces the burden on operators and establishes consistent inspection standards, balancing improved product reliability with cost reduction. 【Implementation Achievements】 - Transition from visual inspection to automated inspection. - Achieved quality stabilization through precise automated inspection using color sensors. 【Challenges Faced by Customers】 Operator Burden: Visual inspection relies on the skills and experience of operators, leading to issues such as fatigue and decreased concentration during long hours of work. As the burden on operators increases, the risk of reduced inspection accuracy rises. Variability in Judgment Criteria: Visual inspection involves subjective judgments from individuals, resulting in variability in quality standards. Inconsistent judgments can lead to the outflow of defective products and excessive inspections. Difficulty in Confirming LED Characteristics: Determining subtle characteristics such as the color and brightness of LEDs is challenging through visual inspection. Inspections based on accurate numerical standards are required.

Company：タカヤ
Price：Other

Measurement and Inspection

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Do you want to electrically detect IC lead lift and BGA ball lift?

TAKAYA's unique IC open test system

*You can view detailed features in the catalog.* TAKAYA's flying probe tester can be equipped with a system that uses a uniquely developed sensor probe to rapidly detect issues such as lifted IC leads for BGA, QFP, SOJ, and solder defects. It can electrically detect lifted lead defects of narrow-pitch ICs and ball lift defects of BGA without damaging the IC itself. We welcome inquiries for trials/tests. Please feel free to contact us if you have any concerns. *You can view detailed information in the catalog.*

Company：タカヤ
Price：Other

Measurement and Inspection

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We were featured in the European industry magazine PRODUCTRONIC!!

Introduced to numerous global EMS companies and manufacturers in over 46 countries!! This is Takaya's flying probe tester, which has received high praise worldwide.

In the February issue of the industry information magazine "PRODUCTRONIC 2021," published in Europe, we featured an article about the introduction of our testers at a major sensor manufacturer. This manufacturer handles approximately 10 million printed circuit boards and 800 million components annually and has been using Takaya's flying probe testers for about 20 years. This article includes comments from when they introduced the latest model, the APT-1600FD series. They conduct in-circuit testing directly after the PCB assembly process, allowing for very quick and reliable error detection. They also praised the ease of modifying inspections simply by adjusting the program, even if the assembly content changes during development. By eliminating the need for fixture creation, cost-effectiveness has improved, and they achieved inspection speeds approximately 2 to 2.5 times faster compared to using fixture-based testers. We encourage you to utilize Takaya's flying probe testers, which are recognized not only in Japan but also by companies and industries around the world. *For more detailed information, please refer to the related link page below.

Company：タカヤ
Price：Other

Measurement and Inspection

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The reason why Takaya's flying probe tester is recognized worldwide.

Implemented in over 46 countries worldwide by numerous global EMS companies and manufacturers!! Let me explain the reasons for this.

Know-how In 1987, Takaya Corporation announced the world's first flying probe test system. This innovative system fundamentally changed the methods of electrical testing (in-circuit testing) across almost all fields of the electronics industry. It has established a mechanism for conducting inspections of various circuit boards with high precision and low cost, from small-scale prototypes to mass production. Innovation Takaya has consistently developed inspection systems with a focus on high quality, technological innovation, and flexibility. Even now, we are energetically working on the development of new systems aimed at further expanding inspection areas and reducing inspection speed. Reliability All of Takaya's testers are manufactured in Japan under high-quality management standards. The long-term maintenance of accuracy and stability of the equipment is highly valued by customers in all sectors of the electronics industry. Comprehensive Support Skilled service personnel provide support for installation, operator training, regular maintenance, calibration, and inspection program creation. We aspire to be a partner for customers in the electronics industry as specialists in circuit board inspection.

Company：タカヤ
Price：Other

Measurement and Inspection

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Fastest in-circuit testing! The impact of introducing flying probe testers.

The Takaya APT series is a board inspection device capable of industry-leading ultra-high-speed in-circuit testing. Here, we introduce its implementation benefits.

■ Quality Improvement By detecting defects that are difficult to identify through visual inspections or functional tests, we can enhance the overall quality of the implementation process based on test results and aggregated data. It is also capable of pin contact for microchip components and fine-pitch ICs/connectors, significantly improving detection rates in high-density board inspections compared to fixture inspections. ■ Inspection Cost Reduction There is no need for expensive dedicated inspection fixtures, which greatly reduces inspection costs for prototype boards and small to medium production boards. In the event of design changes, there are no costs for modifying fixtures. ■ Reduction in Defect Analysis Time Since defective areas can be identified (defective areas are displayed on the board image), defect analysis and component replacement tasks become easier, significantly shortening repair times. ■ Traceability Management Measurement values and inspection dates for components are saved for each board inspection, allowing for easy searching and editing as quality control documentation. ■ Reduction in Line Downtime Waiting times before mass production are significantly reduced, improving the operational efficiency of the implementation process. It alleviates the burden on operators from LCR meter measurements and visual inspections, eliminating human error. For more detailed information, please contact your sales representative.

Company：タカヤ
Price：Other

Measurement and Inspection

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Safe updates/upgrades from the old model! Automatic conversion of inspection programs.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.

Customers using older models of Takaya Flying Probe Testers, such as the APT-7400CJ, are encouraged to consider upgrading or expanding to the latest APT-1340J. The inspection programs used on the old models can be directly converted to the latest model, eliminating the need for reprogramming or readjustment. Additionally, the latest model features a completely revamped drive motor and control system, with probe movement speed increased to 1.5 times that of the old model, significantly reducing inspection time. In fact, a program that took 33 seconds to inspect a single board on the APT-7400CJ was reduced to 19 seconds per board after conversion to the APT-1340J, achieving approximately a 40% reduction. With no extra effort required, an increase in inspection capacity and efficiency improvement can be expected, so customers considering an upgrade or expansion are encouraged to contact their sales representative.

Company：タカヤ
Price：Other

Measurement and Inspection

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Automatically collect/analyze inspection results!! Standard statistical functions included.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.

The Takaya Flying Probe Tester "APT Series" comes standard with a 'statistical function' that automatically collects and analyzes inspection results. 【Main Features】〇 Inspection Types Counts the number of steps and displays the percentage in a graph for each inspection type. 〇 Defect Analysis Aggregates defect details and defect counts for each inspection step. 〇 Inspection Analysis Visually displays analysis results in graphs such as histograms. 〇 Inspection Aggregation Cumulatively displays total counts, good product counts, defect counts, and defect rates by date. 〇 Inspection Report Automatically compiles analysis results and outputs them in Excel format. It is effective for reviewing and streamlining inspection programs, providing feedback to the implementation process, and improving efficiency. For more details, please contact your sales representative.

Company：タカヤ
Price：Other

Measurement and Inspection

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[Case Study] Initial Confirmation, Inspection Check during Line Switch

You can automate the attachment of double-sided tape on test boards and the initial inspection of assembled boards immediately after the start of assembly.

In the component mounting process of printed circuit boards, mistakes due to incorrect component sets or implementation program errors in the mounter during model changes can lead to defects on a lot basis (lot out) if discovered late, resulting in significant losses. To prevent such mistakes, there are cases where components are temporarily mounted on a bare board with double-sided tape, and each one is measured and visually inspected with an LCR meter. This inspection is referred to as "first machine check," "setup change check," or "trial run inspection," but it requires the line to be stopped until the inspection is completed, which takes time and can reduce line operating rates. Additionally, when manually checking all small components on a densely mounted board, it is difficult to completely eliminate human error. Our company recommends automatic inspection using a flying probe tester as a way to make this task easier and more efficient. It allows for accurate and quick confirmation work after line changes. Customers considering improvements in operating rates through reduced switching times of mounting machines, reduced labor costs, and decreased risks of defective products are encouraged to consider implementation.

Company：タカヤ
Price：Other

Measurement and Inspection

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[Exhibition] Introduction of Exhibited Products at the 37th Nepcon Japan

[Exhibition Panel Release] Flying Probe Tester (PCB Inspection Equipment) that detects defects in implemented circuit boards with ultra-fast inspection; RFID products that contribute to business reform.

Thank you to everyone who visited our booth at the "37th Internepcon Japan," held at Tokyo Big Sight from January 25 (Wednesday) to 27 (Friday), 2023. We have made the materials and display panels of our exhibited products available. Even those who could not attend the venue during the event can register on this page to view the materials, so please take advantage of this opportunity. This time, our Industrial Equipment Division, in collaboration with Andor System Support Co., Ltd., conducted a demonstration of boundary scan testing using a flying probe tester, and we are pleased that many customers showed interest in this. Additionally, this was the first collaborative exhibition between our Industrial Equipment Division and RF Division, and we believe many people were able to learn about our products. Moving forward, Takaya Corporation will continue to strive to meet our customers' expectations. We sincerely appreciate your continued support.

Company：タカヤ
Price：Other

Measurement and Inspection

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We also accept special custom requests for flying probe testers.

We manufacture original units capable of automatically transporting large heavy substrates weighing up to 30 kg. Please feel free to entrust us with custom specifications as well.

At Takaya, we also accept special custom requests for flying probe testers to meet our customers' diverse needs. For example, in response to a request to "automatically transport large and heavy PCBs weighing up to 30kg," we created a dedicated automatic transport unit. This allows for the safe and accurate handling of very heavy PCBs that are difficult to carry manually. Additionally, to conduct special inspections alongside in-circuit testing, we have made space within the tester body to accommodate special inspection equipment, enabling flexible customization. Even for inspections of special products that do not conform to standard specifications, we can provide solutions through custom support. Please consult with our sales representative for more information.

Company：タカヤ
Price：Other

Measurement and Inspection

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Leakage current measurement function

This is an introduction to the Takaya Flying Probe Tester option. It also supports leakage current measurement.

This is an optional feature for measuring the following using a flying probe tester with a maximum DC constant voltage of ±110V applied: - Leakage current between arbitrarily specified nets - Leakage current (leakage current) of semiconductor devices such as MOS-FETs and photo MOS relays - Reverse current of diodes By contacting other probes to the same net as the measurement probe and measuring the resistance value, a check function is provided to prevent misjudgment. Trial/testing consultations are also welcome. If you have any concerns, please feel free to contact us.

Company：タカヤ
Price：Other

Measurement and Inspection

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Integration function with MES systems compatible with the international standard OPC UA.

Exhibiting at Nepcon 2024 from January 24! Achieving interoperability between industrial equipment and MES systems!

OPC UA (OPC Unified Architecture) is an open international standard developed for safe and reliable data exchange in industries such as industrial automation. It was announced by the OPC Foundation in 2008 and later standardized as IEC62541. It enables secure and highly reliable data exchange across various types of devices, operating systems, and manufacturers, making it recommended as the standard communication for Industrie 4.0 and increasingly adopted worldwide. Additionally, it is aligned with the international standard for PLCs, IEC61131-3, providing the advantage of high reliability in exchanging information from the manufacturing site with higher-level monitoring control systems and Manufacturing Execution Systems (MES). In response to this trend, Takaya has prepared an option to equip the APT series of flying probe testers with an OPC UA server. We are working to promote the adoption of industrial IoT standards that bridge FA equipment and IT.

Company：タカヤ
Price：Other

Measurement and Inspection

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[Video] Introduction to HF/UHF Band Detacollect Terminals

Utilization of Manufacturing DX Management System/Scheduler / Reliable collection of progress and performance data / Support for data collection with RFID + edge devices

【Features】 - Reliable data collection (easy operation and confirmation of system-side reception) - No interruption of manufacturing operations (retransmission function) - Flexible response to layout changes and equipment replacement - Simultaneous use of multiple units - Time synchronization (when using WiFi)

Company：タカヤ
Price：Other

RFID/IC tags

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Probe Tester - List of Manufacturers, Suppliers, Companies and Products

Probe Tester Product List