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  6. Integration with boundary scan testing using a flying probe tester.

Integration with boundary scan testing using a flying probe tester.

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last updated:Nov 19, 2024

タカヤ
タカヤ
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We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with flying probe testers excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires dedicated fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures that connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors), by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

    Measurement and Inspection
スクリーンショット

Integration with boundary scan testing using a flying probe tester.

スクリーンショット 2023-02-24 112144.jpg
スクリーンショット 2023-02-24 112144.jpg
  • Related Link - https://www.takaya.co.jp/fa/

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Benefits arising from mutual complementation - Significant improvement in test coverage - Improved test throughput - Possible reduction in implementation area of digital circuit regions in board design (TP reduction) - More accurate fault diagnosis possible - Onboard programming or FPGA writing possible

catalog(11)

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Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

TECHNICAL
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Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

TECHNICAL
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Announcement of the 20th "JPCA Award" Winner

Announcement of the 20th "JPCA Award" Winner

OTHER
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Feature Article: Latest Trends in BGA Implementation Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

Feature Article: Latest Trends in BGA Implementation Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

TECHNICAL
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Collaboration between in-circuit testing and boundary scan testing

Collaboration between in-circuit testing and boundary scan testing

TECHNICAL
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Basic Knowledge of In-Circuit Testers

Basic Knowledge of In-Circuit Testers

TECHNICAL
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Dual-Side Flying Probe Tester APT-1600FD

Dual-Side Flying Probe Tester APT-1600FD

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Flying Probe Tester APT-1340J/APT-1400F-SL

Flying Probe Tester APT-1340J/APT-1400F-SL

PRODUCT
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Hybrid inspection system combining JTAG testing and flying probe testers.

Hybrid inspection system combining JTAG testing and flying probe testers.

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Flying Probe Tester APT-2400F

Flying Probe Tester APT-2400F

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Dual Side Flying Probe Tester APT-2600FD

Dual Side Flying Probe Tester APT-2600FD

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News about this product(15)

We will exhibit a corporate booth at the 39th Electronics Packaging Society Spring Conference. (Takushoku University Bunkyo Campus)

  • Seminar・Event

Takaya Corporation will exhibit a corporate booth at the 39th Electronics Packaging Society Spring Conference, which will be held from March 11 (Tuesday) to March 13 (Thursday), 2025, at the Bunkyo Campus of Takushoku University. This conference is held annually under the management of the Japan Electronics Packaging Society, providing a platform for the presentation and exchange of the latest research and development results in electronics packaging technology. Starting in 2023, a hybrid format of on-site participation and online attendance has been implemented, attracting around 700 participants, primarily from industry and academia involved in electronics packaging technology. When you visit, please be sure to stop by Takaya's booth. (Registration and payment of participation fees are required for attendance.)

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We participated in the 29th Okayama Research Park Research and Exhibition Presentation and conducted a panel exhibition.

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On December 17th (Tuesday), we participated in the research and exhibition presentation held at Okayama Research Park and conducted a panel display. We had the opportunity to interact with representatives from companies, universities, and technical colleges in the prefecture. The presentation panels from each organization can be viewed on the Okayama Research Park Research and Exhibition Presentation website.

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We will be exhibiting a poster at the 29th Okayama Research Park Research and Exhibition Presentation.

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The "29th Okayama Research Park Research and Exhibition Presentation" will be held with the aim of presenting and disseminating research results related to the "Okayama Research Park." A poster exhibition titled "Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers" will be featured. Companies, universities, and institutions interested in industry-academia-government collaboration are warmly invited to participate. Poster exhibitions related to research seeds (Industry-Academia Collaboration Model Booth + 8 fields) 《Fields》 ○ Precision Processing and Machinery ○ Materials Technology ○ Semiconductors ○ AI, IoT, and Robotics ○ Medical, Bio, and Food ○ Environment, Chemistry, and Energy ○ Measurement and Inspection ○ Others ■ Organizer Okayama Prefecture, Okayama Prefectural Industrial Promotion Foundation ■ Support Okayama University, Okayama Prefectural University, Okayama University of Science, Kibi International University, Kawasaki Medical University, Kawasaki University of Medical Welfare, Shujitsu University and Shujitsu Junior College, Notre Dame Seishin University, Tsuyama National College of Technology, China Vocational Ability Development University, IPU International Pacific University, Okayama Research Park Incubation Center (ORIC)

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I received the Excellent Award at the 38th Electronics Packaging Society Spring Conference.

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At the "38th Spring Conference of the Electronics Packaging Society" held at Tokyo University of Science from March 13 (Wednesday) to March 15 (Friday), 2024, Takaya Corporation's presentation titled "Latest Trends in Hybrid Testing Systems Combining JTAG Inspection and Flying Probe Testers" received the Excellence Award at the conference. The award ceremony took place on September 12, 2024, at the MES2024 Symposium held at Daido University in Aichi Prefecture, where we were presented with a commemorative plaque.

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タカヤ

タカヤ

Information and Communications

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Founded in 1894 as a textile company, Takaya Textile expanded and established its electronics division in 1966, starting the assembly of transistor radios. Today, in addition to contract manufacturing services (EMS) related to electronic devices, the company actively manufactures and sells various electronics, including in-circuit testers (printed circuit board inspection devices) and RFID (a technology that enables information exchange through short-range wireless communication from tags containing IC information), as well as IT consulting and system solutions, both domestically and internationally. We continue to evolve as a corporate group that contributes to societal development, with textiles and electronics as our dual pillars.

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