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  4. We will exhibit a corporate booth at the 39th Electronics Packaging Society Spring Conference. (Takushoku University Bunkyo Campus)
SEMINAR_EVENT
  • Dec 23, 2024
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Dec 23, 2024

We will exhibit a corporate booth at the 39th Electronics Packaging Society Spring Conference. (Takushoku University Bunkyo Campus)

タカヤ タカヤ
Takaya Corporation will exhibit a corporate booth at the 39th Electronics Packaging Society Spring Conference, which will be held from March 11 (Tuesday) to March 13 (Thursday), 2025, at the Bunkyo Campus of Takushoku University. This conference is held annually under the management of the Japan Electronics Packaging Society, providing a platform for the presentation and exchange of the latest research and development results in electronics packaging technology. Starting in 2023, a hybrid format of on-site participation and online attendance has been implemented, attracting around 700 participants, primarily from industry and academia involved in electronics packaging technology. When you visit, please be sure to stop by Takaya's booth. (Registration and payment of participation fees are required for attendance.)
Date and time Tuesday, Mar 11, 2025 ~ Thursday, Mar 13, 2025
Capital Shizuoka University Bunkyo Campus & Online Hybrid Event 〒112-8585 3-4-14 Kohinata, Bunkyo-ku, Tokyo
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Flying Probe Tester APT-2400F / 2600FD

[39th NePCON Japan Domestic Debut] Supports inspection of high-density printed circuit boards with industry-leading accuracy! New model of flying probe tester.

Takaya Corporation announces the new model of its flying probe tester, "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-fast inspection. Equipped with cutting-edge inspection technology that can check fine component placements and connections with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting product quality improvement. Additionally, thanks to our unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, the user-friendly interface allows anyone to operate it intuitively, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

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Flying Probe Tester APT-2400F

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!

The APT-2400F boasts industry-leading probing accuracy capable of inspecting high-density mounted circuit boards, and through its unique control mechanisms and sensing technology, it achieves highly reliable electrical testing in all environments. It is the next-generation flying probe tester. We accept evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch, where you can bring in your circuit boards. We can conduct a series of tests including the creation of inspection programs, testing with actual circuit boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Flying Probe Tester APT-2400F-SL

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototype to mass production!

The APT-2400F-SL is a large model that retains the basic performance of the APT-2400F while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate component heights of 60mm on the top and 120mm on the bottom, and can handle board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demo rooms in Okayama headquarters and Tokyo branch, where you can bring your boards for testing. A complete testing process is possible, including the creation of inspection programs, inspection using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improved production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototype to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Dual Side Flying Probe Tester APT-2600FD-SL

A new innovation in substrate manufacturing. Achieving improved production efficiency and inspection accuracy!

The APT-2600FD-SL is a large model that maintains the basic performance of the APT-2600FD while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of up to 60mm and board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring your boards for testing. A complete flow of testing is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

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Integration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with flying probe testers excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires dedicated fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures that connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors), by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

  • Measurement and Inspection

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Special Feature Article Published in the Electronics Packaging Technology Journal

We have received permission to publish the feature article that appeared in the only domestic magazine specializing in implementation technology, "Electronics Implementation Technology." You can view it here.

Featured Content ■ Latest Trends in BGA Implementation Board Inspection Hybrid Inspection of Flying Probe Testers and JTAG Testing Andor System Support Co., Ltd. / Masazumi Taniguchi Takaya Co., Ltd. / Kohei Yanagida Overview BGA (Ball Grid Array) components have become widely used in various electronic devices, ranging from consumer products to industrial equipment, and more recently, automotive devices. However, a reliable method for inspecting boards with BGA components (hereafter referred to as BGA implementation boards) has not been established. This is because every inspection method has its advantages and disadvantages, and it is impossible to conduct a complete test using only one inspection method. Therefore, inspecting BGA implementation boards has become a challenge for many companies. In this article, we will introduce the latest technological trends in hybrid inspection that combines flying probe testers and JTAG (Joint Test Action Group) boundary scan as one solution to this issue. 1. Introduction 2. Inspection and Challenges of BGA Implementation Boards 3. Possibilities of Electrical Testing 4. In-Circuit Testing 5. JTAG Boundary Scan Testing 6. Hybrid Testing 7. Conclusion

  • Measurement and Inspection

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Accelerating the inspection of flying probe testers using deep reinforcement learning.

We have presented a joint research report with Ehime University.

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on accelerating inspections of flying probe testers using deep reinforcement learning. At the Ehime University booth during the JPCA Show 2023 / 2023 Microelectronics Show held at Tokyo Big Sight from May 31 (Wednesday) to June 2 (Friday), the report on this research was displayed and introduced. You can download and view the report that was exhibited on that day from here. We encourage everyone to take a look.

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Related catalog(6)

[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

TECHNICAL
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Flying Probe Tester APT-2400F

Flying Probe Tester APT-2400F

PRODUCT
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Dual Side Flying Probe Tester APT-2600FD

Dual Side Flying Probe Tester APT-2600FD

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Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

TECHNICAL
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  • Catalog download

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Hybrid inspection system combining JTAG testing and flying probe testers.

Hybrid inspection system combining JTAG testing and flying probe testers.

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Company Profile Takaya Corporation

Company Profile Takaya Corporation

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New plan "Mojitori Plus" has arrived! From paper to data! The first step in internal DX with Mojitori - Announcement of archive distribution.

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We are pleased to announce the archive distribution of our seminar titled "New Plan 'Mojitori Plus' Debuts! From Paper to Data! The First Step Towards In-House DX with Mojitori." 'Mojitori' allows you to convert text from photos, images, PDF files, and more into data, automatically inputting it into various fields in kintone. In this seminar, we will clearly explain the basic functions and usage of Mojitori. Additionally, we will provide detailed explanations about the Plus plan and the document-focused Mojitori, which were added in the major update in November. 【Recommended for】 - Those who are struggling with frequent transcription errors due to manual data entry. - Those who wish to digitize items currently stored on paper. 【Timetable】 - Overview of Mojitori's functions - Overview of Mojitori Plus's functions - Details and pricing of each plan - Q&A session We look forward to your registration.

Dec 24, 2025

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Free Online Seminar: A New Performance Information Management System to Improve Management in Small and Medium-sized Manufacturing Enterprises

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  • SEMINAR_EVENT

Is the performance report you are currently creating, which takes a tremendous amount of time and effort, appreciated by the management? Are you facing complaints from management such as: - The reports are coming out late (results from the previous month are reported around the 20th of the current month) - The reports are difficult to understand and hard to read - There is missing necessary information In this seminar, we will introduce a new system for managing performance information that addresses these issues, along with specific methods. The cost is free. We encourage you to participate. □ Seminar Content 1. What is performance improvement? 2. What information is useful for performance improvement? 3. How to view performance information 4. A system for automatically generating performance information and accessing necessary information when needed (Using our company's developed performance information management tool as a model)

Dec 24, 2025

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Directly Linked to Results! AI Agents × Organizational Transformation" Management Strategy to Make Generative AI "Truly Usable

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  • SEMINAR_EVENT

Holding a management strategy seminar to "embed" generative AI and connect it to organizational outcomes! Are you facing challenges such as "not knowing how to use it," "lack of progress in utilization," or "not being embedded due to organizational rules and management" while advancing AI implementation? In this seminar, we will thoroughly explain the secrets to realizing an organization where AI operates autonomously, drawing from the generative AI training of Panhouse Co., Ltd. and the management methods of Shikigaku Co., Ltd. In particular, we will share specific case studies of the "Agent Model AI," which is gaining attention as a next-generation AI application, along with organizational design know-how for integrating generative AI into business, management pitfalls that hinder embedding, and their solutions, all accompanied by concrete examples. What you can learn in this seminar: - Experiences and case studies of Agent Model AI (exabase generative AI demo) - Initial preparations and design know-how to accelerate AI utilization - Key management points to break down organizational barriers that hinder AI embedding If you are in management or responsible for ensuring that generative AI becomes a "truly usable" system rather than just "trying it out," we encourage you to participate in this opportunity.

Dec 23, 2025

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[Online Conference Presentation] January 16 (Friday) 13:50-14:30 | Utilizing AI to Strengthen Marketing Organizations. Techniques to Achieve Maximum Effect with Minimal Effort - "Data Driven Marketing 2026"

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  • SEMINAR_EVENT

We are pleased to announce that Pan House Co., Ltd. will be participating in the online marketing conference "Data Driven Marketing 2026," which will be held from January 14 (Wednesday) to 16 (Friday), 2026. At this event, where professionals achieving results at the forefront will gather, our Chief Integration Officer, Tsubasa Kimura, will explain the new organizational approaches utilizing AI. Organizational Theory for "Maximum Effect with Minimal Effort" in the AI Era As AI technology rapidly evolves and the marketing environment changes significantly due to cookie regulations, relying on "past success experiences" and "intuition and experience" is reaching its limits. In this session, we will focus on how to utilize AI not just as a tool, but as a strategic infrastructure to build competitive advantages for organizations. We will discuss specific examples and methods on how to maximize the efficiency of marketing operations and establish an organizational structure that leads to results with minimal effort.

Dec 23, 2025

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December 24 (Wednesday) 13:00-14:00 | From AI introduction to company-wide deployment: Revealing the "model for implementation projects" that allows you to act without hesitation!

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"Where should we start with AI implementation, and how can we expand it company-wide?" The reason for the slow progress in AI implementation is not the tools themselves. The key lies in project design that encompasses everything from creating guidelines to establishing a promotion system and turning success stories into models. In this webinar, we will systematically explain the types of AI implementation projects that successful companies practice to overcome the "zero-to-one barrier" and the "utilization promotion barrier." Both companies that have not yet implemented AI and those that are stagnating in their utilization will gain clarity on their respective starting points and take home actionable "answers at the action level" that can be executed starting tomorrow in just 60 minutes. Recommended for those facing the following challenges: This webinar is ideal for individuals in departments at the level of section chief or higher who want to promote AI implementation as a project. Companies that do not know how to "start" AI implementation (zero-to-one stage) Companies that have implemented generative AI but are experiencing stagnation in its utilization Companies lacking a driving force or where the initiative is not moving forward, struggling with individualization and the lack of established training Companies that are looking to expand company-wide but are unclear on how to horizontally deploy Companies considering the introduction of AI training (especially in the pre-approval stage)

Dec 23, 2025

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