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  6. Flying Probe Tester: APT-1400F-SL * Testing in progress

Flying Probe Tester: APT-1400F-SL * Testing in progress

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last updated:Nov 18, 2024

タカヤ
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It is a board inspection device capable of ultra-fast in-circuit testing at a top-class level in the industry. (Supported board size for inspection: up to 985×610)

The APT-1340J maintains its basic performance while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 10kg, making it suitable for inspecting boards used in automotive, aerospace, and medical devices, as well as power supply boards and probe cards, which are larger and heavier. ★You can bring your boards to our demonstration room at our Okayama headquarters for evaluation testing★ We can conduct a series of tests, including creating inspection programs, inspecting actual boards, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below. *For product information, please download the PDF or feel free to contact us.*

    Measurement and Inspection
1400F-SL_右斜め前_01.png

Flying Probe Tester: APT-1400F-SL * Testing in progress

1400F-SL_右斜め前_01.png
1400F-SL_右斜め前_01.png
  • Related Link - https://www.takaya.co.jp/fa/products/apt-1400f-sl/

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basic information

To ensure that electronic devices function correctly, the electronic circuit board within the device must operate normally. The electronic circuit board becomes operational when electronic components are correctly mounted on the printed circuit board (substrate) and power is supplied. The process of contacting a specialized probe to the electronic circuit board, which has electronic components mounted on it, and applying minute electrical signals for inspection is called In-Circuit Testing (ICT), and the device used for this inspection is referred to as an In-Circuit Tester. This method allows for the inspection of "connection reliability between electronic components and the substrate," "the constants of individual mounted electronic components (such as resistors and capacitors)," and "diode polarity," without imposing unnecessary loads on the substrate itself. It is also known as MDA (Manufacturing Defect Analyzer). Main inspection items include: ● Solder shorts and opens ● Pattern disconnections ● Missing components ● Incorrect component values ● Reverse insertion of polarized components ● Lifted leads of ICs and connectors ● Operation verification of digital transistors, optocouplers, and Zener diodes ● Other simple function tests.

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Applications/Examples of results

【Industries for Recruitment】  EMS, EMDS Companies  Semiconductor Manufacturing Equipment  Communication Infrastructure and Servers  Automotive, Aircraft, and Marine  Medical Devices  Industrial Machinery and Robots  FA Machine Tools  Power Generation and Power Systems 【Use Cases】 ■ Inspection of Mass-Produced Products  Connected to loaders/unloaders for automated/unmanned inspection even in large lots. ■ Inspection of Low-Volume, High-Variety Boards  No need for dedicated fixture manufacturing costs; easy identification of defective areas. ■ Inspection of Prototype Boards  Function tests that respond immediately to design changes (applying voltage to the board to confirm circuit operation (ON/OFF) and measure direct current). ■ Implementation Confirmation Inspection During Model Switching  Verification of the mounting program for the first lot and checking for setup errors during model switching. ■ Defect Analysis Inspection  Inspection of boards that failed functional tests and defect analysis of boards that failed in the market. We have a proven track record of being utilized in various other applications as well. For more details, please contact your sales representative.

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Model number overview
APT-1400F-SL Large machine compatible board
APT-1400F-SL-A Large board compatible, inline machine (model with automatic transport conveyor)

catalog(17)

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Utilization of ODB++ format

Utilization of ODB++ format

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Collaboration between in-circuit testing and boundary scan testing

Collaboration between in-circuit testing and boundary scan testing

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Introduction to Flying Probe Testers

Introduction to Flying Probe Testers

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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Ehime University Collaborative Research Materials]

Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Ehime University Collaborative Research Materials]

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Productronic Paper Interview Article

Productronic Paper Interview Article

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European electronics industry magazine "EPP" Takaya Flying Probe Tester feature article

European electronics industry magazine "EPP" Takaya Flying Probe Tester feature article

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Flying Probe Tester TAKAYA APT-1400F Series

Flying Probe Tester TAKAYA APT-1400F Series

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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning (Joint Research Report with Ehime University)

Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning (Joint Research Report with Ehime University)

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Industrial Equipment Division Product Introduction

Industrial Equipment Division Product Introduction

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Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

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Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

Latest trends in hybrid inspection systems combining JTAG testing and flying probe testers.

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Announcement of the 20th "JPCA Award" Winner

Announcement of the 20th "JPCA Award" Winner

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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research Material with Ehime University]

Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research Material with Ehime University]

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Flying Probe Tester APT-1340J/APT-1400F-SL

Flying Probe Tester APT-1340J/APT-1400F-SL

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Feature Article: Latest Trends in BGA Implementation Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

Feature Article: Latest Trends in BGA Implementation Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

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Basic Knowledge of In-Circuit Testers

Basic Knowledge of In-Circuit Testers

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Hybrid inspection system combining JTAG testing and flying probe testers.

Hybrid inspection system combining JTAG testing and flying probe testers.

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News about this product(23)

The global site for the flying probe tester has been renewed.

  • Other・notification

Please see the TAKAYA Flying Probe Tester page from the related links below. TAKAYA Corporation has entered into a dealership agreement with Itochu Corporation for overseas sales, establishing sales/service bases for flying probe testers in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. We will continue to regularly provide information on agents in various countries and details about exhibitions abroad. You can also rely on us for the introduction and local setup of flying probe testers at overseas bases.

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I received the Excellent Award at the 38th Electronics Packaging Society Spring Conference.

  • Company news

At the "38th Spring Conference of the Electronics Packaging Society" held at Tokyo University of Science from March 13 (Wednesday) to March 15 (Friday), 2024, Takaya Corporation's presentation titled "Latest Trends in Hybrid Testing Systems Combining JTAG Inspection and Flying Probe Testers" received the Excellence Award at the conference. The award ceremony took place on September 12, 2024, at the MES2024 Symposium held at Daido University in Aichi Prefecture, where we were presented with a commemorative plaque.

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I was interviewed by "The Contact Point for Circuit Boards."

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From July 12 to 14, 2024, Takaya Corporation's Industrial Equipment Division exhibited at the "Electronic Equipment Total Solution Exhibition 2024 (JPCA Show 2024)" held at Tokyo Big Sight. During the event, we were interviewed by the circuit board information site "Kiban no Madoguchi," and the footage has been published on the Kiban no Madoguchi YouTube channel. Please take a look.

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MES2024 34th Microelectronics Symposium Invitation to Exhibit at Corporate Booths

  • Seminar・Event

Takaya Corporation will exhibit a corporate booth at the "MES024 34th Microelectronics Symposium," which will be held from September 11 (Wednesday) to 13 (Friday), 2024, at the Daido University Takiharu Campus in Minami Ward, Nagoya City. When you visit the symposium, please be sure to stop by Takaya's booth. Operating Secretariat (The Japan Society of Electronics Packaging) 167-0042 Tokyo, Suginami-ku, Nishiogikita 3-12-2 TEL: 03-5310-2010 For details and the latest information, please refer to the related materials flyer and the MES2024 website.

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Information and Communications

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Founded in 1894 as a textile company, Takaya Textile expanded and established its electronics division in 1966, starting the assembly of transistor radios. Today, in addition to contract manufacturing services (EMS) related to electronic devices, the company actively manufactures and sells various electronics, including in-circuit testers (printed circuit board inspection devices) and RFID (a technology that enables information exchange through short-range wireless communication from tags containing IC information), as well as IT consulting and system solutions, both domestically and internationally. We continue to evolve as a corporate group that contributes to societal development, with textiles and electronics as our dual pillars.

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