IOL testing of discrete semiconductors

Supports IOL tests and power cycle tests for small discrete semiconductors!

We would like to introduce our "IOL testing of discrete semiconductors." Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to temperature changes caused by the device's own heat generation during operation. During the power OFF period (cooling), forced cooling is also performed using a fan. 【Adjustment Conditions】 ■ Temperature Rise: 125℃ ■ Heating Time: 5 minutes ■ Cooling Time: 5 minutes ■ Fan Operating Time: 2 minutes *For more details, please download the PDF or feel free to contact us.

• Other services and technologies

We conduct environmental testing, as well as non-destructive observation and electrical characteristic measurements.

At AITES, we use environmental testing equipment that complies with standard specifications such as JIS, JEDEC, and MIL to conduct reliability evaluation testing for various electronics products, components, and materials. We offer a range of tests including electrical testing, non-destructive observation, and power cycle testing. 【Environmental Testing】 ■ Highly Accelerated Life Testing ■ Constant Temperature and Humidity Testing ■ Thermal Shock Testing ■ Liquid Bath Thermal Shock Testing ■ Temperature and Humidity Cycle Testing ■ In-Situ Continuous Measurement Reliability Evaluation Testing Service *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Contracted power cycle testing using a power cycle testing device! We will cooperate in quality improvement along with failure analysis and assessment.

At Aites Co., Ltd., we offer contract power cycle testing using Siemens (Mentor) power cycle testing equipment. We can also handle the creation of various jigs necessary for testing. Additionally, we accommodate various observations and measurements of power devices. We can capture changes before and after tests such as power cycle testing. 【Features】 ■ We can handle the creation of various jigs necessary for testing. ■ We accommodate various observations and measurements of power devices. ■ We can capture changes before and after tests such as power cycle testing. *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments
• Other analytical equipment
• others

In-Situ Continuous Measurement Reliability Evaluation Testing Service

In-situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a readout method where samples are taken out from a stress environment at fixed times, failure can only be understood at the timing of the readout, making it impossible to know the exact time of failure occurrence. In-situ measurement allows for accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, these recoverable failures cannot be detected using the readout method, but in-situ measurement allows for the detection of recoverable failures, enabling accurate judgment and assessment. ● Monitoring of stress application conditions on samples is possible The stress application conditions and measurement data can be confirmed in real-time.

• Analysis and prediction system
• Other analytical equipment

Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.

【Testing, Evaluation, Analysis】 　●Reliability Testing 　　■Temperature Cycle Testing 　　■Thermal Shock Testing 　　■High-Temperature Storage Testing 　　■Highly Accelerated Life Testing 　　■Preconditioning 　　■Hot Oil Testing 　　■In-situ Continuous Measurement 　　■Ion Migration Testing 　　■Electromigration Testing 　　■Test Consulting 　●Evaluation Testing 　　■Bond Strength Testing: Pull/Shear Testing 　　■Mechanical Strength Testing: Vibration/Shock/Fall Testing/Compression Strength/Shear Strength 　　■ESD/Latch Up/CDM Testing 　　■Electrical Characteristic Measurement 　　■Salt Spray Testing 　●Analysis 　　■X-ray Transmission Observation 　　■Ultrasonic Microscope Observation 　　■Luminescence Analysis (EMS/IR-OBIRCH) 　　■Scanning Electron Microscope (SEM) 　　■Transmission Electron Microscope (TEM) 　　■Surface Contamination Analysis (TOF-SIMS) 　　■Foreign Material Analysis (FT-IR)

• Other analytical equipment

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Analysis and prediction system
• Other analytical equipment

Are you making progress on measures for the "2024 Problem"? The management of drivers' working hours is becoming stricter, and in the logistics field, reducing "waiting time for loading" has become an urgent issue. To address this challenge, our company, Hotron, proposes the "Vehicle Detection Ultrasonic Sensor 'HM-UX2'," which instantly grasps the availability of loading bays. The 'HM-UX2' contributes to the resolution of waiting times by accurately understanding the availability status, reducing unnecessary waiting and queuing, and shortening waiting times, thereby alleviating the burden on drivers! By replacing the "eyes" of your loading bay management with this high-precision sensor, why not start taking measures against the "2024 Problem"? Take a look at the product features: "Can it accurately detect availability?" "Can we really use it in our company?" "I just want to know the cost, even if it's an estimate." If you have any questions or requests, please feel free to consult us first.

We sincerely apologize for the inconvenience, but we will be closed for summer vacation during the following period. Closure period: August 9 (Saturday) to August 17 (Sunday), 2025 Inquiries received during this period will be addressed sequentially starting from August 18 (Monday). We appreciate your understanding and cooperation.

Thank you very much for visiting our booth at the "High-Performance Materials Week [Osaka] 13th High-Performance Plastics Exhibition." Thanks to you, we had many visitors and were able to conclude the event successfully. In addition to the "PPLB-445" displayed on the day, we have a variety of products available. For those who were unable to measure samples at the venue, we offer a trial measurement service. Furthermore, for those who would like to know more about our products and services, we also accept online meetings. We welcome inquiries from those who attended as well as those who could not make it this time due to scheduling conflicts. Please feel free to contact us.

Aioi System is pleased to announce the release of the low-power wireless display "NW2991-JP," which achieves long battery life. This product supports 920MHz band wireless communication and can be operated in conjunction with wired displays. It can be easily integrated into existing systems by simply adding a master unit. With a high-speed response time of under one second and a variety of display functions for text and barcodes, it supports a wide range of applications. ▼ For more details, please see the press release linked below ▼ ■ Main Features - Maintenance-free design with a battery life of one year (low power consumption) - Compatible with mixed operation with wired displays - High-speed response (under one second) and diverse display formats - Stable communication in the 920MHz band ■ You can see the actual product at the exhibition This product will be displayed at the TOPPAN booth during the International Logistics Comprehensive Exhibition 2025, 4th INNOVATION EXPO. We invite you to visit the venue, see the actual product, and experience its performance. Dates: September 10 (Wed) - 12 (Fri), 2025 Venue: Tokyo Big Sight (Halls 4-8) Booth No: 5-907 (TOPPAN booth) Exhibition official website ▶ linked below We sincerely look forward to your visit.

Thank you very much for visiting our booth at the "Monozukuri World (Measurement, Inspection, and Sensor Exhibition) 2025." Thanks to you, we had many visitors, and the event concluded successfully. In addition to the "PPLB-445" showcased on the day, we have a variety of products available. For those who were unable to conduct sample measurements at the venue, we offer a trial measurement service. Furthermore, for those who would like to learn more about our products and services, we also accept online meetings. We welcome inquiries from those who attended, as well as those who were unable to come this time due to scheduling conflicts. Please feel free to reach out to us.