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  4. IOL testing of discrete semiconductors
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  • Jul 31, 2024
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Jul 31, 2024

IOL testing of discrete semiconductors

アイテス アイテス
We conduct "IOL testing of discrete semiconductors" at our company. Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to the heat generated by the device itself during power ON. During power OFF (cooling), forced cooling is also performed using a fan. Additionally, before conducting the tests, we use representative samples to make adjustments to reach the test temperature conditions. It is possible to adjust the current/time during heating, as well as the fan capacity/timing during cooling.
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IOL testing of discrete semiconductors

Supports IOL tests and power cycle tests for small discrete semiconductors!

We would like to introduce our "IOL testing of discrete semiconductors." Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to temperature changes caused by the device's own heat generation during operation. During the power OFF period (cooling), forced cooling is also performed using a fan. 【Adjustment Conditions】 ■ Temperature Rise: 125℃ ■ Heating Time: 5 minutes ■ Cooling Time: 5 minutes ■ Fan Operating Time: 2 minutes *For more details, please download the PDF or feel free to contact us.

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Total Support Service for Reliability

We conduct environmental testing, as well as non-destructive observation and electrical characteristic measurements.

At AITES, we use environmental testing equipment that complies with standard specifications such as JIS, JEDEC, and MIL to conduct reliability evaluation testing for various electronics products, components, and materials. We offer a range of tests including electrical testing, non-destructive observation, and power cycle testing. 【Environmental Testing】 ■ Highly Accelerated Life Testing ■ Constant Temperature and Humidity Testing ■ Thermal Shock Testing ■ Liquid Bath Thermal Shock Testing ■ Temperature and Humidity Cycle Testing ■ In-Situ Continuous Measurement Reliability Evaluation Testing Service *For more details, please refer to the PDF document or feel free to contact us.

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Power semiconductor analysis service

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

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Power cycle testing and characteristic evaluation

Contracted power cycle testing using a power cycle testing device! We will cooperate in quality improvement along with failure analysis and assessment.

At Aites Co., Ltd., we offer contract power cycle testing using Siemens (Mentor) power cycle testing equipment. We can also handle the creation of various jigs necessary for testing. Additionally, we accommodate various observations and measurements of power devices. We can capture changes before and after tests such as power cycle testing. 【Features】 ■ We can handle the creation of various jigs necessary for testing. ■ We accommodate various observations and measurements of power devices. ■ We can capture changes before and after tests such as power cycle testing. *For more details, please refer to the PDF document or feel free to contact us.

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In-Situ Continuous Measurement Reliability Evaluation Testing Service

In-Situ Continuous Measurement Reliability Evaluation Testing Service

In-situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a readout method where samples are taken out from a stress environment at fixed times, failure can only be understood at the timing of the readout, making it impossible to know the exact time of failure occurrence. In-situ measurement allows for accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, these recoverable failures cannot be detected using the readout method, but in-situ measurement allows for the detection of recoverable failures, enabling accurate judgment and assessment. ● Monitoring of stress application conditions on samples is possible The stress application conditions and measurement data can be confirmed in real-time.

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Total solutions for the reliability of semiconductor products.

Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.

【Testing, Evaluation, Analysis】  ●Reliability Testing   ■Temperature Cycle Testing   ■Thermal Shock Testing   ■High-Temperature Storage Testing   ■Highly Accelerated Life Testing   ■Preconditioning   ■Hot Oil Testing   ■In-situ Continuous Measurement   ■Ion Migration Testing   ■Electromigration Testing   ■Test Consulting  ●Evaluation Testing   ■Bond Strength Testing: Pull/Shear Testing   ■Mechanical Strength Testing: Vibration/Shock/Fall Testing/Compression Strength/Shear Strength   ■ESD/Latch Up/CDM Testing   ■Electrical Characteristic Measurement   ■Salt Spray Testing  ●Analysis   ■X-ray Transmission Observation   ■Ultrasonic Microscope Observation   ■Luminescence Analysis (EMS/IR-OBIRCH)   ■Scanning Electron Microscope (SEM)   ■Transmission Electron Microscope (TEM)   ■Surface Contamination Analysis (TOF-SIMS)   ■Foreign Material Analysis (FT-IR)

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Total solution service for power devices

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

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Related catalog(7)

IOL testing of discrete semiconductors

IOL testing of discrete semiconductors

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Total solution service for power devices.

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[Free Materials Available] Introducing Useful Information on Vehicle Detection Sensors!

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  • CATALOG

To customers considering the introduction of vehicle detection sensors for parking lot construction, design, or management: Are you facing any challenges with current issues or selecting the right sensors for parking management? Hotron offers free materials that explain how to utilize vehicle detection sensors and the benefits of their introduction! ▽ Here is the lineup of materials ◉ Vehicle Detection Sensor Basic Guide This guide focuses on the challenges and solutions in parking lot operations, introducing the overview of vehicle detection sensors. ◉ Key Points for Introducing Vehicle Detection Sensors This material discusses the benefits of introduction based on installation locations and specific challenges. ◉ Case Studies of Vehicle Detection Sensor Implementation This document presents the challenges before implementation and the results after introduction. For more details, please download from our website and check it out. https://www.hotron.co.jp/download/

Nov 14, 2025

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採用イベント「Kort Valuta Night」11/26開催!

“Kort Valuta Night” Recruitment Event in November — A Chance to Hear Real Voices from Our Team Casually get to know Kort Valuta — several participants have already joined the company after attending!

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Kort Valuta Inc. (Head Office: Shibuya, Tokyo; CEO: Hideki Shibata) is pleased to announce that we will hold our next recruitment event, “Kort Valuta Night,” on November 26, 2025. This recurring event offers an opportunity for potential candidates to casually learn about our company culture and team atmosphere before applying. By lowering the barrier to entry and providing authentic insights from current employees, the event helps participants gain a more concrete sense of what it’s like to work at Kort Valuta. Since the event’s launch, approximately ten attendees have gone on to join the company in a range of roles — including marketing, customer support, and backend engineering.

Nov 13, 2025

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I have received the "Climate Change Action Minister's Award."

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Our company has been awarded the "Minister of the Environment Award for Climate Change Action for Fiscal Year 2025." This award is presented annually by the Ministry of the Environment to honor individuals and organizations that have made significant contributions to the mitigation and adaptation of climate change. Our efforts to balance energy conservation and comfort through "Akarina," as well as the initiatives we have undertaken together with the companies that have adopted it, have been recognized. We sincerely thank everyone who has supported and adopted Akarina for their invaluable assistance.

Nov 13, 2025

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Start of offering the vehicle passage time prediction system "MS-VPP" using microwave sensors.

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We are pleased to announce the development of the vehicle passage time prediction system "MS-VPP," which measures the speed of vehicles approaching construction sites using microwave sensors and informs the predicted passage time through signage and tablets. This system will be available to construction contractors starting in November 2025. ■Product Overview - "MS-VPP" detects vehicles approaching construction sites and measures their speed using microwave sensors, displaying the vehicle speed and the predicted passage time at specified locations on signage and tablets. It can also measure and display data for vehicles passing continuously. - The data control panel connected to the microwave sensor transmits the vehicle speed data and calculated passage prediction time via LTE. By utilizing microwave sensors, it enables accurate detection and speed measurement of vehicles even at night or in bad weather, and since data processing occurs on the receiving side without going through the cloud, information can be displayed without any time lag. - As a result, drivers of construction vehicles exiting from construction entrances and workers directing traffic can understand "how many seconds until a vehicle passes near the site entrance," thereby implementing safety measures in areas with poor visibility.

Nov 13, 2025

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Exhibition at "Construction Technology Expo 2025 Kanto C-Xross"

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We will be exhibiting at the "Construction Technology Exhibition 2025 Kanto" held at Sunshine City (Higashi-Ikebukuro, Toshima-ku, Tokyo) for two days starting from November 19. This exhibition is organized by the Nikkan Kensetsu Kogyo Shimbun and aims to promote the development and introduction of construction technology. On the day of the event, we will showcase our "High Water Content Soil Improvement Agent MT Series" and introduce the product through demonstrations using actual soil, so we invite those nearby to stop by. Venue: Sunshine City Exhibition Hall C+D (3-1-4 Higashi-Ikebukuro, Toshima-ku, Tokyo) Date and Time: November 19 (Wednesday) 10:00 AM - 5:00 PM November 20 (Thursday) 10:00 AM - 4:00 PM Our booth location: D-38 We sincerely look forward to your visit. Construction Xross Construction Technology Exhibition 2025 Kanto HP https://www.decn.co.jp/kengi2025/outline.html

Nov 13, 2025

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