Event Detector System (Linked with Shock Testing Machine)
- In tests such as drop impact tests, where mechanical stress is applied at regular intervals, resistance value data is collected for 10 msec for each stress cycle (10,000 points at 1 μsec intervals). - In the standard configuration, it is possible to simultaneously collect, judge, and save data from up to 16 channels. - Instantaneous interruption detection and waveform information acquisition are executed simultaneously. - Collected list data and waveform data can also be analyzed using the included Viewer software. - Stress simulation services can also be proposed.
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basic information
A system that can monitor the moment when electrical resistance increases or becomes OPEN in conductive paths such as printed circuit boards due to mechanical stress occurring at regular intervals, such as in drop impact tests. It can be used in combination with drop impact testing machines and the like.
Price information
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Applications/Examples of results
- Utilization as an event detector - Evaluation combined with drop impact testing machines, etc. - Evaluation of connection reliability for electronic devices - Proven implementation at major semiconductor manufacturers
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Company information
As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.