Event Detector System (Linked with Environmental Test Chamber)
- It is a system that can monitor the momentary disconnection of the conductive part with a resolution of 1μsec, in conjunction with the temperature cycle chamber. - It is utilized in connection reliability tests of semiconductor packages, among other applications.
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basic information
- Up to 160 channels of momentary interruption events can be monitored simultaneously. - Two applications are available for collection and viewing. - It is possible to handle up to 15 different types of files simultaneously, regardless of whether they are new or existing. - A system with either 12 channels per block or 20 channels per block can be provided.
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Applications/Examples of results
- Implementation reliability tests for major semiconductor manufacturers - Implementation reliability tests for embedded devices are being used.
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Company information
As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.