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last updated:Jun 05, 2026

アイテス
アイテス
  • Official site

We conduct environmental testing, as well as non-destructive observation and electrical characteristic measurements.

At AITES, we use environmental testing equipment that complies with standard specifications such as JIS, JEDEC, and MIL to conduct reliability evaluation testing for various electronics products, components, and materials. We offer a range of tests including electrical testing, non-destructive observation, and power cycle testing. 【Environmental Testing】 ■ Highly Accelerated Life Testing ■ Constant Temperature and Humidity Testing ■ Thermal Shock Testing ■ Liquid Bath Thermal Shock Testing ■ Temperature and Humidity Cycle Testing ■ In-Situ Continuous Measurement Reliability Evaluation Testing Service *For more details, please refer to the PDF document or feel free to contact us.

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  • Related Link - https://www.ites.co.jp

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catalog(34)

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Total Support Service for Reliability

Total Support Service for Reliability

OTHER
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HAST test of power devices

HAST test of power devices

PRODUCT
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[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

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Total coordination from reliability testing to observation.

Total coordination from reliability testing to observation.

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Lamp heating test (infrared irradiation test)

Lamp heating test (infrared irradiation test)

OTHER
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Reliability testing of materials and chemical analysis evaluation after testing.

Reliability testing of materials and chemical analysis evaluation after testing.

TECHNICAL
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[Information] Transmittance measurement service using a self-recording spectrophotometer

[Information] Transmittance measurement service using a self-recording spectrophotometer

OTHER
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[Data] Set menu service for reliability testing, haze measurement, and IR analysis.

[Data] Set menu service for reliability testing, haze measurement, and IR analysis.

OTHER
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[Data] Colorimetric evaluation of resin color systems and transmittance using a color difference meter.

[Data] Colorimetric evaluation of resin color systems and transmittance using a color difference meter.

OTHER
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Melt Flow Rate (MFR) Measurement Evaluation Service

Melt Flow Rate (MFR) Measurement Evaluation Service

TECHNICAL
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We provide support from reliability testing of materials to chemical analysis.

We provide support from reliability testing of materials to chemical analysis.

TECHNICAL
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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

OTHER
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Authenticity investigation (comparative observation)

Authenticity investigation (comparative observation)

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LCD Panel Analysis Data Collection

LCD Panel Analysis Data Collection

OTHER
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Observation of Pb-free solder cross-section after reliability testing.

Observation of Pb-free solder cross-section after reliability testing.

OTHER
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Liquid tank thermal shock test LED power supply

Liquid tank thermal shock test LED power supply

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ESD (CDM) Testing Contract Services

ESD (CDM) Testing Contract Services

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ESD (HBM・MM) Test Contract Service

ESD (HBM・MM) Test Contract Service

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CDM Test for Low Humidity Environment Compatibility

CDM Test for Low Humidity Environment Compatibility

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Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

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Thermal shock test

Thermal shock test

TECHNICAL
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Liquid tank thermal shock test

Liquid tank thermal shock test

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Solder Heat Resistance Test (SMD)

Solder Heat Resistance Test (SMD)

TECHNICAL
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Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

PRODUCT
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Condensation cycle test

Condensation cycle test

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Continuous current test of multilayer ceramic capacitors

Continuous current test of multilayer ceramic capacitors

OTHER
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Strain measurement in thermal shock testing

Strain measurement in thermal shock testing

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IOL testing of discrete semiconductors

IOL testing of discrete semiconductors

OTHER
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In-chamber photography during constant temperature and humidity testing.

In-chamber photography during constant temperature and humidity testing.

TECHNICAL
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Evaluation of various implementation substrates

Evaluation of various implementation substrates

PRODUCT
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Appearance observation and measurement services

Appearance observation and measurement services

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Ultrasonic microscope observation of printed circuit boards.

Ultrasonic microscope observation of printed circuit boards.

TECHNICAL
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Pressure Repeated Test

Pressure Repeated Test

TECHNICAL
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Repeated decompression test

Repeated decompression test

TECHNICAL
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News about this product(4)

In-chamber imaging during constant temperature and humidity testing.

  • Other・notification

Our company conducts environmental testing using a constant temperature and humidity chamber with a front glass window and a camera, capturing and monitoring the operational status such as screen displays. During environmental testing using equipment like constant temperature and humidity chambers, monitoring the condition of the test subjects using loggers for parameters like voltage, current, resistance, and temperature is widely practiced. However, monitoring the operational status of equipment during testing can be difficult unless the test equipment is equipped with dedicated external outputs. For samples where monitoring with loggers is challenging, we combine a constant temperature and humidity chamber equipped with a front glass window option, a camera, and monitoring software to conduct environmental testing while capturing and monitoring the condition of the test equipment.

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IOL testing of discrete semiconductors

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We conduct "IOL testing of discrete semiconductors" at our company. Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to the heat generated by the device itself during power ON. During power OFF (cooling), forced cooling is also performed using a fan. Additionally, before conducting the tests, we use representative samples to make adjustments to reach the test temperature conditions. It is possible to adjust the current/time during heating, as well as the fan capacity/timing during cooling.

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Strain measurement in thermal shock testing.

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We would like to introduce the "strain measurement of thermal shock testing" conducted by our company. A sample with a strain gauge attached was set up in the thermal shock testing device, and the wiring of the strain gauge was connected to an external data logger to record strain data in real-time during the test. For two types of copper-clad laminates, the strain behavior during thermal shock testing was observed, and it was noted that significant strain occurred with changes in temperature. It was found that FR-1 exhibited greater strain compared to FR-4.

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Solder Heat Resistance Test (SMD)

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Our company conducts solder heat resistance tests to evaluate the heat resistance of surface mount devices (SMD) during the solder mounting process. We replicate moisture absorption prior to mounting through humidification treatment and assess the presence of delamination or cracks through heating treatment that corresponds to the thermal stress during solder mounting. Additionally, as part of the post-test inspection, we perform inspections similar to the initial measurements, and if necessary, we also conduct analyses such as cross-sectional observation of defective parts. For more detailed information, please refer to the related products and catalogs.

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アイテス

アイテス

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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