[Data] Shirutoku Report No. 53 #Avalanche Test (2)

This report is a continuation of the avalanche tolerance testing of MOSFETs discussed in Shirutoku Report No. 52.
It explains the relationship between the transient thermal resistance of the device and the losses and time during avalanche operation using diagrams and graphs.
When selecting a device, comparing devices measured under different conditions is not very meaningful. It is recommended to measure in an environment as close to actual operation as possible, rather than relying solely on data sheet values.
For more details, please refer to the related products and catalogs below.

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