A simple explanation using a MOSFET as an example! Introducing power cycle testing to evaluate durability.
★★Shirutoku Report: Useful Information You Should Know★★ Suddenly, do you all know about "reliability testing"? In brief, it is a collective term for various tests that evaluate the reliability (performance, durability, safety, failure rate, etc.) of a product. The main objectives are to confirm whether the performance meets the design specifications and to assess whether it meets market quality requirements. In this report, we will introduce one of the durability tests for power devices, known as the "power cycle test." For more details, please take a moment to read on. 【Contents】 ■ Short Power Cycle Test (Reference: JEITA-ED-4701/601 602) ■ Long Power Cycle Test (Reference: JEITA-ED-4701/603) *For more information, please refer to the PDF document or feel free to contact us.
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As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.

