Power device failure location / Slice & View three-dimensional reconstruction

We will thoroughly evaluate and verify power devices from all angles.

■Problem-Solving Ability Consulting that leads to solutions with knowledge and technology Supporting customer schedules with quick responses ■Investigative Ability Skills to pinpoint and visualize malfunctioning areas Deep insight and advanced, delicate sample processing techniques ■Specialized Equipment Liquid tank thermal shock testing at up to 180°C Power cycle testing essential for power semiconductors

• Analysis and prediction system
• Other analytical equipment

We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for Analysis - Backside Polishing - Supports various sample forms. Si chip size: 200um to 15mm square ■ Defective Area Identification - Backside IR-OBIRCH Analysis / Backside Emission Analysis - IR-OBIRCH Analysis: Supports up to 100mA/10V and 100uA/25V Emission Analysis: Supports up to 2kV * Covers a wide range of defect characteristics such as low-resistance shorts, micro-leaks, and high-voltage breakdown failures. ■ Pinpoint Cross-Section Observation of Leak Areas - SEM/TEM - Select SEM or TEM observation based on the predicted defects, allowing for pinpoint physical observation and elemental analysis of leak defect areas.

• Other analytical equipment

It is possible to observe cross-sections while observing FIB processing in real time.

A new method for structural analysis of electronics products manufactured with nanoscale precision, such as semiconductor devices, MEMS, and TFTs: We propose cross-beam FIB for cross-sectional observation.

• Analysis and prediction system
• Other analytical equipment

Shorter delivery time than his method! Both shape observation and diffusion layer observation can be performed using FIB-SEM!

Our company conducts "Observation of diffusion layers in semiconductors using FIB-SEM." By creating cross-sections using the FIB method and observing them with SEM, we visualized the diffusion layers of semiconductors and evaluated their shapes. In a case where the differences in built-in potential were visualized using the Inlens detector of the SEM, a difference in the energy of secondary electrons generated in N-type and P-type regions occurred due to the built-in potential. This difference in trajectories is detected by the SEM detector. 【Features】 ■ Both shape observation and diffusion layer observation can be performed using FIB-SEM. ■ Shorter delivery times compared to other methods. ■ Concentrations can be detected up to 10E16. ■ While the PN interface can be visualized, the concentration differences of N+/N- and P+/P- cannot be detected. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis for the faulty area!

At Aites Co., Ltd., we offer analysis services for power semiconductors. Since our separation and independence from the Quality Assurance Department of IBM Japan's Yasu Office in 1993, we have cultivated our own unique analysis and analytical techniques. We can handle not only Si semiconductors but also the trending wide bandgap semiconductors. 【Features】 - OBIRCH analysis supports not only Si but also SiC and GaN devices. - FIB processing is possible from either side. - Visualization of the depletion layer formed at the PN junction. - Elemental analysis such as EDS and EELS is also supported. *For more details, please refer to the PDF document or feel free to contact us.

• Other analytical equipment

Cross-section production of soft materials has also been realized! 3D reconstruction is possible with Auto Slice & View!

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November! We will provide shorter delivery times and reliable feedback than ever before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements, to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, we can produce high-quality samples with minimal damage layers. 【Main Features of Helios 5 UC】 ■ High-speed, large-area FIB processing ■ Damage layer reduction through low acceleration finishing ■ Cryo-FIB processing ■ 3D imaging ■ Fully automated TEM sample preparation *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments

"Civil Engineering Watching - Infrastructure Encyclopedia: Collection of Civil Engineering Structures" is a portal site for images and information about civil engineering structures that form social infrastructure facilities. We have recently published photos and articles about the "Saale Valley Bridge." The "Saale Valley Bridge" was constructed at the border between Saxony-Anhalt and Thuringia, in Bad Kösen, Naumburg. Boasting an impressive height of up to 60 meters, this structure spans a total length of 1.2 kilometers and a width of 12.5 meters, harmoniously blending with the surrounding landscape designated as a nature reserve. In addition to the "Saale Valley Bridge," various civil engineering projects, photos, and articles related to civil engineering are also featured, so we hope you will take a look. Please check from the "Related Links" (Civil Engineering Watching - Infrastructure Encyclopedia: Collection of Civil Engineering Structures). Perry Japan Co., Ltd.

At a company in Kanagawa Prefecture, we have introduced "Majesta Fragrance" in the entrance area, creating a fragrant atmosphere. We are adding a pleasant scent to the sophisticated entrance space. The fragrance that spreads the moment you step inside enhances the company's brand image, making it more refined. As this space welcomes important visitors such as customers and business partners, more companies are becoming particular about not only the visual aspects but also the "scent." Would you like to design a first impression with fragrance and enhance your company's appeal? Majesta Fragrance is currently accepting requests for free trial installations. If you are interested in creating a fragrant atmosphere, please feel free to contact us.

SBS Marketing Co., Ltd., which provides consulting services related to marketing, sales promotion, and customer attraction primarily in the BtoB (business-to-business) sector, based on practical experience in support companies and business companies, has published the "Notice of Content Gift List Page Update 24" on August 27, 2026 (Thursday). We are pleased to introduce the updated "Useful for Business! Downloadable Content" page with 6 new contents added! (Page Overview: Excerpts) ■ Added 3 contents to the core of marketing: 'Strategy and Tactics'! ■ Added 3 contents to the important aspect of marketing organizations: 'Performance Evaluation and Management'! ▼ For more details, please visit this page. https://sbsmarketing.co.jp/blog/notice-of-content-gift-list-page-update24-2026-08/

Published in the Nikkan Kogyo Shimbun on June 24.

Many customers wish to obtain technical standards conformity certification (Giteki) and construction design certification to use imported Wi-Fi products domestically. However, since radio laws differ from country to country, it is important to note that adjustments to transmission power may be necessary to comply with Japan's radio law. Among these, we will introduce products that require special attention, specifically those compatible with IEEE802.11ax (Wi-Fi 6).