Analytical Equipment Product List and Ranking from 67 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. インボディ・ジャパン 東京本社 Tokyo//Medical and Welfare
  2. 東洋メディック 環境事業部 Tokyo//Medical and Welfare
  3. 相互理化学硝子製作所（TOP） Kyoto//Trading company/Wholesale
  4. 4 ビーエルテック Tokyo//others
  5. 5 ブルカージャパン オプティクス事業部 Kanagawa//others
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. InBody Comprehensive Catalog インボディ・ジャパン 東京本社
  2. All That Gas Analysis Equipment JIS K-0301 Standard 相互理化学硝子製作所（TOP）
  3. Body composition analysis device InBody270 インボディ・ジャパン 東京本社
  4. 4 Body Composition Analyzer "ACCUNIQ BC380" 東洋メディック 環境事業部
  5. 4 Silica analysis device "SLIA-5000" 堀場アドバンスドテクノ 京都本社

Analytical Equipment Product List

136～150 item / All 210 items

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Outgassing analysis using headspace GC-MS analysis method.

Outgassing analysis using headspace GC-MS analysis method.

Publication of headspace GC-MS analysis method and case study of outgassing component analysis of liquid crystal panel polarizers!

If solvents, low molecular organic substances, or unreacted materials remain in the constituent materials, packaging materials, or cushioning materials of a product, they may outgas, diffuse, or permeate into the constituent materials, potentially affecting the product's lifespan, characteristics, and the environment or human health. The headspace method of GCMS is effective for qualitative and quantitative analysis of trace residual substances. This document presents a case study of the qualitative analysis of outgassing components from polarizers used in liquid crystal panels. We invite you to read it. [Contents] - Headspace GC-MS analysis method - Analysis of outgassing components from polarizers in liquid crystal panels *For more details, please refer to the PDF document or feel free to contact us.

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Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Appropriate acceleration conditions for accurate analysis results! The detection depth in EDX changes with different acceleration voltages!

This introduces the detection sensitivity related to differences in acceleration voltage during SEM-EDX analysis. When analyzing the gold-plated surface of a typical printed circuit board (PCB), there are cases where the underlying nickel is detected even though it is not exposed. This is related to the scattering depth of the electron beam, and it is necessary to set appropriate acceleration conditions to obtain accurate analysis results. In this study, we conducted a verification of the EDX detection depth based on differences in acceleration voltage using Monte Carlo simulations. This is just one example, but it is important to set the acceleration voltage while imagining how electrons are scattered in order to obtain accurate analysis results. [Test Board Overview] - The sample used was a gold-plated pad from a typical printed circuit board (PCB). - The layer structure consists of nickel plating and gold plating on copper wiring. - The thickness of the gold plating, as observed in cross-section, is 212 nm. *For more details, please refer to the PDF document or feel free to contact us.*

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Analysis of Polymer Structural Changes

Analysis of Polymer Structural Changes

Evaluate higher-order structures using analytical methods! Raman analysis is also effective for analyzing polymer structures.

I would like to introduce the topic of "Analysis of Polymer Structural Changes." This document includes "Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy" and "Structural Changes of Polymer Chains." The molecular structure of polymers influences their properties, affecting the physical characteristics of polymer products. We have evaluated the higher-order structures formed by the aggregation of polymer chains using analytical methods. Please take a moment to read it. [Contents] ■ Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy ■ Structural Changes of Polymer Chains *For more details, please refer to the PDF document or feel free to contact us.

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[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

We detect and analyze the atomic emission that occurs when an atom returns from an excited state to its ground state!

In ICP emission spectroscopic analysis, multiple metal elements contained in a sample can be detected simultaneously. This document introduces examples of the analysis of trace metal elements contained in liquid crystals. It includes the principles and overview of ICP-AES analysis as well as measurement examples. Please feel free to contact us regarding the sample state or the elements to be analyzed. [Contents] ■ Principles and overview of ICP-AES analysis ■ Measurement example: Qualitative analysis of metal elements in liquid crystal panels using ICP-AES *For more details, please refer to the PDF document or feel free to contact us.

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of problems are possible! We will introduce case studies verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis using surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results via XPS (ESCA) ■ Bonding State Analysis Results via XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results via XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

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[Example of TOF-SIMS] Analysis of Li

[Example of TOF-SIMS] Analysis of Li

It is possible to detect with high sensitivity! We present a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, detecting Li with general EDX, excluding windowless EDX, is difficult. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF materials or feel free to contact us.

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[Data] Analysis of Additive Defects in Polymers by Thermal Desorption GC-MS

[Data] Analysis of Additive Defects in Polymers by Thermal Desorption GC-MS

It is possible to analyze with high sensitivity using thermal desorption GC-MS analysis! We propose methods tailored to the symptoms of malfunctions and your objectives.

Various additives are used in polymers to improve stability and processability; however, due to environmental impact and long-term storage, additive components may precipitate on the polymer surface, or the additives themselves may undergo chemical changes, leading to discoloration and degradation. This document presents examples of analyses conducted using thermal desorption GC-MS to examine the bleed-out of additives and the chemical changes of additive components due to UV irradiation. Although additive components are present in small quantities compared to the main polymer components, they can be analyzed sensitively using thermal desorption GC-MS. We propose methods tailored to specific issues or objectives, such as predicting product degradation in combination with reliability testing, thermal analysis, and main component analysis, so please feel free to contact us. [Contents] ■ Analysis of additive components that bled out from nitrile rubber ■ Analysis of additive components in nylon 66 subjected to UV irradiation *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Example by EDS] Bonding Interface of Cu Pads

[Analysis Example by EDS] Bonding Interface of Cu Pads

It is possible to view the distribution of each element in two dimensions! This can also be effective when analyzing multilayer samples.

Here, we present an example of EDS analysis at the Cu pad interface. In the qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Analysis and evaluation of organic materials and polymer materials.

[Data] Analysis and evaluation of organic materials and polymer materials.

Essential materials alongside metals and inorganic materials! Introducing examples of analysis and evaluation services for organic materials.

Organic materials such as solvents, additives, pharmaceuticals, and plastics are essential materials alongside metals and inorganic materials. They have a wide variety of types due to the combination of light elements, and their specificity is manifested through structure, intermolecular forces, and electron behavior. However, it seems that chemical instrumentation analysis and evaluation are necessary for a fundamental understanding of their properties. This document presents case studies of analysis and evaluation services for organic materials. [Contents] ■ FT-IR Analysis ■ GC-MS Analysis ■ Molecular Weight Distribution Evaluation by GPC (SEC) *For more details, please refer to the PDF document or feel free to contact us.

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Dynamic SIMS

Dynamic SIMS

Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. [Features] ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Best detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.

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Effective for exhaust gas measurement! High-performance gas analyzer FT-IR "MATRIX-MG"

Effective for exhaust gas measurement! High-performance gas analyzer FT-IR "MATRIX-MG"

Verified through the "EURO6" measurement test for phased automobile emissions regulations in the EU.

Are you familiar with the phased automotive exhaust gas regulation "EURO6" implemented by the EU (European Union)? Bruker's high-performance FT-IR gas analysis device "MATRIX-MG" has been validated in actual measurement tests for EURO6. We introduce the pinnacle of FT-IR gas analysis equipment, featuring a compact design that can be loaded onto a vehicle's cargo area and unparalleled high resolution. ■ Features of MATRIX-MG - Achieves rapid, continuous, and automatic qualitative and quantitative gas analysis - Exceptional sensitivity, capable of detecting from a few ppb to 100% - Wide detectable range - No calibration required for target gases - Easy operation and maintenance - Automatic correction for the influence of gases and interfering components in the atmosphere - Gas cell with temperature control function capable of heating up to 191°C - Continuous monitoring of temperature and pressure within the gas cell, providing feedback for quantitative analysis - Measurement results can be output to industrial communication interfaces

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Gas Analysis Device MATRIX-MG/OMEGA5

Gas Analysis Device MATRIX-MG/OMEGA5

■Ammonia Measurement■ Capable of measuring a full range from low concentration to high concentration!

It has been said that there have been very few analytical devices capable of measuring ammonia across a full range from low to high concentrations. Bruker's device supports full-range measurement. 【OMEGA5】 This is a gas analysis FT-IR system equipped with a multi-reflection gas cell with an optical path length of 5 meters, suitable for measuring industrial gases, all housed in a compact body compatible with 19-inch racks. It is designed to automatically monitor gas concentrations with high precision and in real-time, making it applicable in various fields. The OMEGA5 achieves a reduction in overall costs, including operation and maintenance. 【MATRIX-MG】 Achieving qualitative and quantitative gas analysis quickly, continuously, and automatically! Measurement results can be output to industrial communication interfaces. The 'MATRIX-MG series' is a high-performance FT-IR gas analyzer characterized by its robustness and compact design. It is designed to automatically analyze each component and concentration of target gases with high precision and in real-time for gas analysis in various fields. It can identify and quantify over 300 types of compounds without calibration measurements.

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Compact FT-IR Spectroscopic Analyzer 'ALPHA II'

Compact FT-IR Spectroscopic Analyzer 'ALPHA II'

Stable results and high reliability! The compact design, equivalent to one A4 sheet of paper, allows for effective use of lab space.

"ALPHA II" is a chemical analysis device that rapidly performs qualitative and quantitative analysis of various samples. With a robust and sophisticated design, it features touch-operated software. New users can be trained in just a few minutes, and centralized data management is also possible. Additionally, it maximizes analytical work efficiency with simple operability without wasting valuable space in the laboratory. 【Features】 ■ Sampling modules that accommodate various applications ■ Long-lasting components (up to 10 years warranty) ■ Pre-set analytical workflows ■ All-in-one panel PC option ■ High humidity environment compatibility option ■ Effective use of lab space *For more details, please refer to the PDF materials or feel free to contact us.

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Technical Documentation: System Validation BRAVO

Technical Documentation: System Validation BRAVO

Minimize compliance costs! We provide comprehensive system suitability assessments.

This document introduces the system validation of "BRAVO." It includes information on "performance qualification," "data integrity," and "ready-to-use system qualification." The optical system of BRAVO is designed to achieve the highest level of precision and can meet the stringent performance evaluation criteria set for bench-top devices (Ph.Eur.) and quantitative analysis (USP). [Contents] ■ Concept ■ Validated Solutions ■ 21 CFR Part 11 and beyond ■ Performance Qualification – USP <858> & <1858>, Ph.Eur. 2.2.48, JP 2.26 ■ Data Integrity ■ Ready-to-use System Qualification *For more details, please refer to the PDF document or feel free to contact us.

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