List of Other analytical equipment products
- classification:Other analytical equipment
2206~2250 item / All 2754 items
Support for high-purity gas purification technology and trace gas impurity measurement technology!
- others
- Other analytical equipment
Frame rod assemblies and more! A wide range of Honeywell frame sensors available.
- Other analytical equipment
Combination gas valves and more! A wide range of Honeywell valve actuators available.
- Other analytical equipment
- others
Achieving world-class 3D scanning speeds with the application of commercially available high-speed cameras!
- Analysis and prediction system
- Other analytical equipment
Adoption of the patented sampling moiré method. Analysis of displacement and strain distribution using pixel density and resolution.
- Analysis and prediction system
- Other analytical equipment
Thermography equipped with the necessary functions and performance for on-site maintenance.
- Other analytical equipment
- Measurement and Inspection
It is possible to overlay and simultaneously display/capture thermal images and visible images!
- Other analytical equipment
Thermography boasting excellent robustness capable of withstanding a drop from 2 meters.
- Other analytical equipment
- Measurement and Inspection
Suitable for low-temperature applications up to 100°C, such as building diagnostics and body surface temperature measurement!
- Other analytical equipment
- Measurement and Inspection
Card-type with built-in GPS! Supports customers' compliance with regulations by managing continuous driving, breaks, and waiting times.
- Other analytical equipment
- Other measuring instruments
- Vehicle Management System
Patent obtained! Unmanned inspection and diagnosis system for pressure-free waterway tunnels during water flow.
- Other analytical equipment
- Structural Survey
This is a camera head with a diameter of 20mm and a cable length of 15m for internal inspection. It is capable of recording still images and videos.
- Other analytical equipment
Capable of detecting time and sensitivity! A handheld fluorescent X-ray analyzer with excellent elemental count.
- Measurement and analysis equipment leasing and rental
- Other analytical equipment
This is a film thickness gauge that measures the thickness of coatings such as paint. It can measure coatings on both magnetic and non-magnetic metals with a single device.
- Other analytical equipment
- Other measuring instruments
This is a combustion exhaust gas analyzer developed to measure the components of combustion exhaust gases from boilers and industrial furnaces.
- Other analytical equipment
It can be easily installed in any location, detects the position of metal in three zones, and estimates where the metal is located.
- Other analytical equipment
Portable combustion gas analyzer for environmental measurement models conforming to JIS standards.
- Measurement and analysis equipment leasing and rental
- Other analytical equipment
Measuring instruments for measuring the components of combustion exhaust gases from boilers and industrial furnaces. They measure oxygen, carbon monoxide, nitrogen monoxide, and other components in th...
- Other analytical equipment
A campaign is currently underway to give away starter packs worth 100,000 yen until the end of December 2019!
- Other measuring instruments
- Other analytical equipment
Exploration possible alone! An underground exploration device that can perform immediate diagnostics anywhere!
- Analysis and prediction system
- Other analytical equipment
Non-contact and non-destructive exploration! A rebar detection device capable of investigating buildings and similar structures from the external surface.
- Other analytical equipment
- Structural Survey
- Non-destructive testing
Low cost, maintenance-free, customizable options.
- Other analytical equipment
Melfeeder achieves space-saving and cost reduction.
- Other analytical equipment
Measurable in various areas and situations, such as the neck and shoulders, as well as the waist and thighs when sitting on a seat.
- others
- Other analytical equipment
- Other measuring instruments
Using high-precision measuring instruments, we measure the dimensions of products and parts. We accommodate various types, shapes, and materials such as resin molded products, die-cast items, and elas...
- Other measuring instruments
- Other analytical equipment
Coordinating mold design and manufacturing! The accumulation of accurate measurement data has gained trust.
- Other measuring instruments
- Other analytical equipment
Introducing optical 3D scanners and three-dimensional measuring instruments capable of measuring shape deviations.
- Other measuring instruments
- Other analytical equipment
TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.
- Other analytical equipment
- Analysis and prediction system

Chemical Analysis Trusted Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analytical instrument is capable of measuring different targets, it is necessary to choose the method that fits the purpose based on the information available.
We will report rapid analysis results using various sampling techniques regarding foreign substances that have a significant impact on the yield of electronics products.
- Other analytical equipment

Chemical Analysis Trusted Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analytical instrument is capable of measuring different targets, it is necessary to choose the method that fits the purpose based on the information available.
We provide testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.
- Other analytical equipment
- Analysis and prediction system
We provide testing services to evaluate the resistance to ESD (electrostatic discharge), which is important for the reliability of semiconductor products and electronic components that contain them.
- Other analytical equipment
We conduct reliability evaluation tests for various electronics products, components, and materials in accordance with standard specifications such as JIS, JEDEC, and MIL.
- Other analytical equipment

In-chamber imaging during constant temperature and humidity testing.
Our company conducts environmental testing using a constant temperature and humidity chamber with a front glass window and a camera, capturing and monitoring the operational status such as screen displays. During environmental testing using equipment like constant temperature and humidity chambers, monitoring the condition of the test subjects using loggers for parameters like voltage, current, resistance, and temperature is widely practiced. However, monitoring the operational status of equipment during testing can be difficult unless the test equipment is equipped with dedicated external outputs. For samples where monitoring with loggers is challenging, we combine a constant temperature and humidity chamber equipped with a front glass window option, a camera, and monitoring software to conduct environmental testing while capturing and monitoring the condition of the test equipment.
It is possible to observe cross-sections while observing FIB processing in real time.
- Other analytical equipment
- Analysis and prediction system

Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are acquired, and the obtained images are corrected for positional misalignment between SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
By applying chemical etching, ion milling, and FIB processing to mechanical polishing methods, we will analyze various metal joints, starting with lead-free solder.
- Other analytical equipment

Example of analysis of compounds at the interface between SAC solder and Ni pads.
We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface between the NiP pad and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX reveals the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is an analytical technique based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, it may be feasible to analyze using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes.
TEM (Transmission Electron Microscope) meets a wide range of requirements for observing failure sites of electronic components, length measurements, elemental analysis, crystal structure analysis, and...
- Other analytical equipment

Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has been improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which integrates multiple frames while correcting for drift.
We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.
- Other analytical equipment

Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has been improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which integrates multiple frames while correcting for drift.
ESD/Latch-up Test Contract Service
- Electrical Equipment Testing
- Other analytical equipment
In-Situ Continuous Measurement Reliability Evaluation Testing Service
- Other analytical equipment
- Analysis and prediction system

In-chamber imaging during constant temperature and humidity testing.
Our company conducts environmental testing using a constant temperature and humidity chamber with a front glass window and a camera, capturing and monitoring the operational status such as screen displays. During environmental testing using equipment like constant temperature and humidity chambers, monitoring the condition of the test subjects using loggers for parameters like voltage, current, resistance, and temperature is widely practiced. However, monitoring the operational status of equipment during testing can be difficult unless the test equipment is equipped with dedicated external outputs. For samples where monitoring with loggers is challenging, we combine a constant temperature and humidity chamber equipped with a front glass window option, a camera, and monitoring software to conduct environmental testing while capturing and monitoring the condition of the test equipment.
Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.
- Other analytical equipment

IOL testing of discrete semiconductors
We conduct "IOL testing of discrete semiconductors" at our company. Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to the heat generated by the device itself during power ON. During power OFF (cooling), forced cooling is also performed using a fan. Additionally, before conducting the tests, we use representative samples to make adjustments to reach the test temperature conditions. It is possible to adjust the current/time during heating, as well as the fan capacity/timing during cooling.
Please feel free to consult us about other industrial equipment! We can address issues such as faulty electrolytic capacitors!
- Other analytical equipment
We conduct surface analysis, foreign substance analysis, and organic composition analysis.
- Other analytical equipment

Analysis of organic-inorganic composite materials using FT-IR and EDX.
Here is an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of the surface of a PET bottle label, revealing that the IR spectra differed between the glossy and non-glossy areas. The non-glossy area is thought to primarily consist of acrylic resin, as its spectrum is similar to that of acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and the EDX spectrum and backscattered electron images showed that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
We create new value in semiconductor wafer services such as film formation processing and regeneration processing!
- Other analytical equipment
We will thoroughly evaluate and verify power devices from all angles.
- Analysis and prediction system
- Other analytical equipment

Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has been improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which integrates multiple frames while correcting for drift.
Introducing a new device! We present an analytical method aimed at qualitative and quantitative analysis of components contained in samples.
- Analysis and prediction system
- Other analytical equipment

Chemical Analysis Trusted Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analytical instrument is capable of measuring different targets, it is necessary to choose the method that fits the purpose based on the information available.
It is possible to significantly reduce the conventional UT inspection time! Ultra-fast ultrasonic flaw detection system.
- Other measuring instruments
- Other analytical equipment