Provides high-reliability reflectance measurement for a wide range of applications! Guarantees stable measurement results.
The "OOC-SM-2000" is a mirror-type reflectance measurement system that supports spectral reflectance (45°/45°) measurements. It provides highly reliable reflectance measurements for a wide range of applications from research and development to quality control, covering a broad wavelength range of 420 to 850 nm. Additionally, with a spectral resolution of 0.5 nm and a wavelength repeatability accuracy of 1 nm, it accurately captures fine spectral information. 【Features】 ■ Supports spectral reflectance (45°/45°) measurements ■ Provides highly reliable reflectance measurements for a wide range of applications ■ Covers a broad wavelength range of 420 to 850 nm ■ Accurately captures fine spectral information *For more details, please download the PDF or feel free to contact us.
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【Specifications (Partial)】 ■Function: Reflectance measurement ■Detector: Sony CCD array ■Wavelength range: 420–850 nm ■Photometric accuracy: ± 0.5% @ 555 nm ■Photometric reproducibility: ± 1% (400–800 nm), other wavelengths ± 2% *For more details, please download the PDF or feel free to contact us.
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Asahi Kogyo Trading Co., Ltd. handles the sales and services of industry-standard optical measurement instruments, scientific instruments, and communication equipment. We are also capable of supporting a wide range of applications, including the construction of custom systems. As an ISO 17025 accredited testing and calibration organization, we respond to all requests related to optical measurement, including accredited testing, calibration, and contracted measurements.