Clearly observe tiny surface structures that cannot be seen with an optical microscope. Elemental analysis and elemental mapping measurements of the observation area are also possible!
SEM-EDX is a device that irradiates the surface of a sample with an electron beam and captures the reflected (generated) electrons with a detector to observe images. It allows for clear observation of minute surface structures that cannot be seen with an optical microscope. With the included X-ray detector for elemental analysis, it is also possible to perform elemental analysis and elemental mapping measurements of the observation area.
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■Surface observation ■Elemental analysis of microscopic foreign substances ■Elemental mapping measurement of painted steel plate cross-sections, etc. *For more details, please download the PDF or feel free to contact us.*
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Nippon Steel Environment Corporation aims to be the best partner for customers in the environmental business sector centered around water, based on the technology cultivated over many years through a comprehensive water treatment system – ECOM – which includes testing and analysis. We provide environmental solutions with the comprehensive capabilities of the ECOM cycle, so please feel free to contact us if you have any requests.