Clearly observe tiny surface structures that cannot be seen with an optical microscope. Elemental analysis and elemental mapping measurements of the observation area are also possible!
SEM-EDX is a device that irradiates the surface of a sample with an electron beam and captures the reflected (generated) electrons with a detector to observe images. It allows for clear observation of minute surface structures that cannot be seen with an optical microscope. With the included X-ray detector for elemental analysis, it is also possible to perform elemental analysis and elemental mapping measurements of the observation area.
Inquire About This Product
basic information
For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
■Surface observation ■Elemental analysis of microscopic foreign substances ■Elemental mapping measurement of painted steel plate cross-sections, etc. *For more details, please download the PDF or feel free to contact us.*
catalog（1）
Download All Catalogs
Company information
Nippon Steel Environment Corporation aims to be the best partner for customers in the environmental business sector centered around water, based on the technology cultivated over many years through a comprehensive water treatment system – ECOM – which includes testing and analysis. We provide environmental solutions with the comprehensive capabilities of the ECOM cycle, so please feel free to contact us if you have any requests.
