Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.
By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, detecting minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, allowing for discrimination based on defect types such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds for 12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality available
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basic information
【Detection】 Method: Laser scattering method and specular reflection method Detection size: Defects equivalent to PSL 50nm 【Review Function】 Microscope: Laser microscope (laser confocal, white light interference) or differential interference microscope 【Target Substrate】 Type: Various substrates including transparent materials Size: 2 to 12 inches, shape and other details can be discussed separately 【Equipment Size】 External dimensions: W1,800 x D2,100 x H1,985 (mm) Weight: Approximately 1200kg
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Kubota has supported a rich society and the circulation of nature by solving issues related to food, water, and the environment, which are essential for human survival. The Kubota Precision Equipment Business Unit and Kubota Instrumentation provide solutions based on "measurement and metrology technology" that meet the demands of various industries, including automation, labor-saving, high-precision measurement and control, and data processing, contributing to the development of society.
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