Analysis of low-resistance short defects, which was difficult with previous non-destructive testing, is now possible!
The magnetic field microscope is a non-destructive analysis technique that measures the magnetic field distribution generated by electric currents from outside the measurement target and estimates the current paths flowing within the measurement target. By observing abnormal areas such as shorts identified by the magnetic field microscope with a 3D X-ray microscope (X-ray CT), detailed cause analysis can be performed non-destructively. Please feel free to contact us when you need our services. 【Analysis Flow】 1. Abnormal detection using the magnetic field microscope 2. Observation using the 3D X-ray microscope *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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【Example】 ■Observation of shorted areas in Ball Grid Array (BGA) *For more details, please refer to the PDF document or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and analytical techniques along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, LCDs, metals, and new materials. Please feel free to contact us if you have any requests.