You can observe the internal structures and defects of semiconductors, electronic components, and organic composite materials by magnifying them.
‘You can see it without breaking it!’ is a contract analysis service that reveals hidden abnormalities. Non-destructive observation methods include magnetic field microscopy that visualizes current paths, ultrasonic microscopy that detects delamination with high sensitivity, and X-ray microscopy (X-ray CT) that allows for three-dimensional observation of internal structures. By combining these methods, it is possible to capture various phenomena. Additionally, high-brightness X-rays enable real-time observation of the water absorption and disintegration initiation of tablets, and video provision is also possible. Please feel free to contact us. 【Features】 ■ Visible delamination and cracks ■ Visible three-dimensional structures ■ Visible magnetic fields and currents ■ Visible numerical values of interest (particle size, volume, orientation, voids, density) ■ Real-time observation of shape changes *For more details, please download the PDF or feel free to contact us.
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【Service Flow】 1. Inquiry 2. Quotation 3. Order 4. Analysis 5. Reporting of Analysis Results 6. Payment *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and analytical techniques along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, LCDs, metals, and new materials. Please feel free to contact us if you have any requests.