Composition analysis of raw materials for all-solid-state batteries.

This presentation introduces the composition analysis of cathode active materials using ICP emission analysis. The cathode material of lithium-ion batteries (LIB) is one of the important components that influence the battery's voltage and energy density, and the composition of the cathode material significantly affects the battery's performance. ICP emission analysis allows for qualitative and quantitative analysis of approximately 70 elements, primarily metal elements. It can be applied not only to the composition analysis of LIB cathode materials but also to the qualitative and quantitative analysis of additives and impurities contained in samples, as well as the quantitative analysis of substances regulated by the RoHS directive, among various other analyses.

We would like to introduce a case of particle size measurement of cathode active materials using laser diffraction conducted by our company. In air or in a liquid, laser light is irradiated onto the particles, and the angular dependence of the intensity of the light scattered by the particles is measured. By measuring the angular dependence of the scattered light intensity, the particle size distribution (particle size distribution) is calculated from the data. Using commercially available reagents as samples, measurements were conducted in a dry state without dispersing in a solvent. The results of the particle size measurement of NMC oxide showed that the particles were in a monodisperse state with sizes below several tens of micrometers, and the median diameter was calculated to be 12 micrometers.

We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analytical instrument is capable of measuring different targets, it is necessary to choose the method that fits the purpose based on the information available.

"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material.