Meech Corporation non-contact cleaning device

Measures to prevent foreign matter contamination on the manufacturing line! It reliably removes foreign substances from the surface of the base material!

Introducing the Meech non-contact web cleaning device for foreign matter contamination measures on the manufacturing line! 'CyClean' simultaneous non-contact cleaning on both sides 'CyClean-R' non-contact cleaning on one side The substrate is neutralized of static electricity by an ionizing bar at the entrance and exit of the cleaning head. Inside the cleaning head, it is exposed to turbulent airflow created by blowing (positive pressure) and suction (negative pressure), generating high-frequency micro-movements on the substrate surface, which effectively removes foreign matter within the boundary layer. 【Features】 ■ Thorough removal of foreign matter within the boundary layer ■ Minimum dust removal size is 1.0μm ■ The included air handling unit completely controls the air balance of positive and negative pressure, drastically reducing the frequency of adjustments by operators and automatically maintaining optimal cleaning performance. *For more details, please refer to the PDF document or feel free to contact us.*

Batteries and CapacitorsMeasurement and Inspection