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  6. [Case Study] Particle-PLUS: RF Magnetron for Dielectric Targets

[Case Study] Particle-PLUS: RF Magnetron for Dielectric Targets

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Particle-PLUS

last updated:Jan 20, 2022

ウェーブフロント 本社
ウェーブフロント 本社
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Particle-PLUS Analysis Case Introduction: "RF Magnetron Sputtering Analysis of Dielectric Targets" Simulation Case

This is an analysis case of RF magnetron sputtering, which is one of the film deposition methods using process plasma. Particle-PLUS specializes in plasma analysis within vacuum chambers and can perform simulations of deposition rates and more at high speed. ◇ Features of 'Particle-PLUS' - Excels in low-pressure plasma analysis. - By combining axisymmetric models with mirror-symmetric boundary conditions, results can be obtained quickly without the need for full device simulations. - Specializes in plasma simulations in low-pressure gases, where calculations with fluid models are challenging. - Supports 2D (two-dimensional) and 3D (three-dimensional) analyses, allowing for efficient analysis of complex models. - As a strength of our in-house developed software, customization to fit the customer's equipment is also possible. ◆ Various calculation results can be output ◆ - Potential distribution - Density distribution/temperature distribution/generation distribution of electrons and ions - Particle flux and energy flux to the walls - Energy spectrum of electrons and ions at the walls - Density distribution/temperature distribution/velocity distribution of neutral gas and more. *Please feel free to contact us for more details.

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スライド1.JPG

[Case Study] Particle-PLUS: RF Magnetron for Dielectric Targets

スライド1.JPG
スライド1.JPG
  • Related Link - http://www.wavefront.co.jp/CAE/particle-plus/

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basic information

**Features** - The time scheme uses an implicit method, allowing for stable time evolution to be calculated over a large time step Δt compared to conventional methods. - The collision reaction model between neutral gas and electrons and ions employs the Monte Carlo Scattering method, enabling accurate and rapid calculations of complex reaction processes. - The neutral gas module determines the initial neutral gas distribution used in the above plasma module, allowing for quick evaluation of gas flow using the DSMC method. - The sputtered particle module calculates the behavior of atoms sputtered from the target in devices such as magnetron sputtering systems, enabling rapid evaluation of flux distribution on opposing substrates. *For other functions and details, please feel free to contact us.*

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P4

Applications/Examples of results

【Dual Frequency Capacitive Coupled Plasma】 - Optimization of voltage and other parameters to achieve high-density plasma - Damage to the chamber walls - Optimization of power using an external circuit model - It is possible to apply voltages to the electrode plates that align with real devices - The waveform of the applied voltage can be simulated smoothly and with relatively realistic voltages - Calculations are relatively stable to avoid applying unreasonable voltages 【DC Magnetron Sputtering】 - Uniformity of erosion dependent on magnetic field distribution - Adsorption distribution of sputtered materials on the substrate 【Pulsed Voltage Magnetron Sputtering】 - Optimization of the application time of pulsed voltage to efficiently sputter materials 【Ion Implantation】 - The influence of the substrate on the erosion distribution 【Temporal Changes of Applied Voltage on Electrode Plates】 - It is possible to observe physical quantities that are difficult to measure experimentally, such as electron density and ion velocity distribution - By investigating electron density and ion velocity distribution, it is possible to examine the uniformity of the film and damage to the chamber walls - By changing calculation conditions, optimization of high-density plasma generation at low power is possible

Detailed information

  • スライド1.JPG

    Introduction to Particle-PLUS Analysis Examples RF Magnetron Sputtering of Dielectric Targets

  • スライド2.JPG

    ◇Model Overview Analysis case of RF magnetron sputtering of dielectric targets in an axisymmetric model.

  • スライド3.JPG

    Neutral gas pressure and static magnetic field - Ar pressure - Magnetic flux density

  • スライド4.JPG

    Electric potential and electron number density - Electric potential (periodic average) - Electron number density (periodic average)

  • スライド5.JPG

    Ion energy - Ar+ ion energy - Ar+ ion incident energy flux

  • スライド6.JPG

    Sputtering and film formation - Number density (color display) and flow rate (arrow display) - Deposition rate on the substrate surface - Erosion rate on the target surface

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Particle-based Plasma Analysis Software 'Particle-PLUS'

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3D rarefied fluid analysis software 'DSMC-Neutrals'

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